VG 10 SAMSUNG Search Results
VG 10 SAMSUNG Datasheets Context Search
Catalog Datasheet | Type | Document Tags | |
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2N6155
Abstract: BUZ24 4900 SIEMENS BUZ10 buz90 buzh bup 314 BUZ11 F133 251C
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OCR Scan |
BSI07A O-226kk BS170 O-226AA BSS123 O-236AA O-220AB BUZ171 O-220ftB irf120 2N6155 BUZ24 4900 SIEMENS BUZ10 buz90 buzh bup 314 BUZ11 F133 251C | |
1RF530
Abstract: 1RF540 1rf630 RF543 BS107PT BS250F SD210 SD211 SD212 TD-12
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OCR Scan |
Ta-2510) SD210 TD-12 SD211 SD212 S0213 O-220AB IRF630 IRF631 1RF530 1RF540 1rf630 RF543 BS107PT BS250F TD-12 | |
IRF224
Abstract: IRF154 N IRF034 IRF035 IRF123 IBF220
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OCR Scan |
1RF9Z32 O-220AB 1RF48 IRF034 O-204AE IRF250 IRF252 IRF224 IRF154 N IRF035 IRF123 IBF220 | |
irf113
Abstract: IRF224 buz90 buzh F133 IRF035 IRF034 IRF123
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OCR Scan |
1RF9Z32 O-220AB 1RF48 IRF034 O-204AE IRF250 IRF252 irf113 IRF224 buz90 buzh F133 IRF035 IRF123 | |
1RF9620
Abstract: 1RF9540 1RF9622 IRF9532 IRF9522 IRF9523 IRF9611 IRF9630 samsung IRF9613 IRF9240
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OCR Scan |
-25cC) IRF9240 IRFS241 25F9542 O-220 IRF9543 IRF961G IRF9612 1RF9620 1RF9540 1RF9622 IRF9532 IRF9522 IRF9523 IRF9611 IRF9630 samsung IRF9613 | |
KMM5324100VContextual Info: KMM53241OOV/VG/VP DRAM MODULES 4M X 32 DRAM SIMM Memory Module FEATURES GENERAL DESCRIPTION • Performance range: The Samsung KMM5324100V is a 4M bit x 32 Dynamic RAM high density memory module. The Samsung KMM5324100V consist of eight C M O S 4M x 4 bit |
OCR Scan |
KMM53241OOV/VG/VP 110ns 130ns 150ns KMM5324100V 24-pin 72-pin 22/iF | |
Contextual Info: SAMSUNG ELECTRONICS INC b7E ]> QD1SSSQ ^35 I SMGK • KM M5324000V/VG/VP DRAM MODULES 4M x32 DRAM SIMM Memory Module FEATURES GENERAL DESCRIPTION • Performance range: The Samsung KMM5324000V is a 4M bitsx32 Dynamic RAM high density memory module. The Samsung |
OCR Scan |
M5324000V/VG/VP KMM5324000V bitsx32 24-pin 72-pin 110ns KMM5324000V-7 130ns KMM5324000V-8 | |
Contextual Info: SA MS UN G E L E C T R O N I C S b7E D INC T T b M l H S D D 1 5 2 4 4 b31 • SMÛK ■ KM M53241OOV/VG/VP DRAM MODULES 4 M x 3 2 DRAM SIMM Memory Module FEATURES GENERAL DESCRIPTION • Performance range: The Samsung KMM5324100V is a 4M bit x 32 Dynamic |
OCR Scan |
M53241OOV/VG/VP KMM5324100V 24-pin 72-pin 22/jF 110ns KMM5324100V-7 130ns KMM5324100V-8 | |
Contextual Info: SAMSUNG ELECTRONICS INC b?E D • 7 ^ 4 1 4 5 QQ152fit. 0^0 I SMGK KM M53281OOV/VG/VP DRAM MODULES 8 M x 3 2 DRAM SIMM Memory Module FEATURES GENERAL DESCRIPTION • Performance range: The Samsung KMM5328100V is a 8M bit x 32 Dynamic RAM high density memory module. The Samsung |
OCR Scan |
QQ152fit. M53281OOV/VG/VP KMM5328100V 24-pin 72-pin 22/xF KMM5328100V-6 110ns KMM532810QV-7 | |
dxo 1100
Abstract: Y312
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OCR Scan |
KS0642 300/312CH 64G/S 300/312CH. LDI-97-P004-R0 KS0642 Page14> dxo 1100 Y312 | |
Contextual Info: SAMSUNG ELECTRONICS INC b4E D • 7Tbm42 GD12174 71b «SflG K N-CHANNEL POWER MOSFETS IRF620/621/622/623 FEATURES • • • • • • • Lower R d s ON Improved Inductive ruggedness Fast switching times R ugged polysilicon gate cell structure Lower input capacitance |
OCR Scan |
7Tbm42 GD12174 IRF620/621/622/623 IRF620 IRF621 IRF622 IRF623 | |
Contextual Info: SAMSUNG ELECTRONICS INC b4E D • 7 S b 4 1 4 B DQlSlMt. ÒSI ■ SM6K N-CHANNEL IRF510/511 /512/513 POWER MOSFETS FEATURES • Lower R d s <on > • • • • • • Improved inductive ruggedness Fast switching times Rugged polysilicon gate cell structure |
OCR Scan |
IRF510/511 IRF510 IRF51 IRF513 IRF511 IRF512 G012150 | |
IRF*125
Abstract: s4c diode IRFR IRFR020 0MFL IRFU025
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OCR Scan |
IRFR020/22/24/25 IRFU020/22/24/25 ib4142 IRFR020/U020 IRFR022/U022 IRFR024/U024 IRFR025/U025 IRFR020/012 IRFR024/025 IRFU020/012 IRF*125 s4c diode IRFR IRFR020 0MFL IRFU025 | |
HMR-11000
Abstract: HMR11000
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OCR Scan |
HMR-11000 DC-18 HMR11000 | |
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ssh20n50
Abstract: ssm20n45 20N45 2on50 20n50
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OCR Scan |
SSM20N45/20N50 SSH20N45/20N50 000S3 SSM20N45 SSM20N50 SSM20N50 00GS435 ssh20n50 20N45 2on50 20n50 | |
IRF530
Abstract: IRF5303 IR IRF532 IRF530 mosfet IRFP130 OF IRF530 irf532 IRF531 reliability irf530 IRFP131
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OCR Scan |
00121S7 IRF530/531/532/533 IRFP130/131 IRF530/IRFP130 IRF531 IRF532/IRFP1 IRF533/IRFP133 O-220 IRFP130/131/132/133 IRF530 IRF5303 IR IRF532 IRF530 mosfet IRFP130 OF IRF530 irf532 reliability irf530 IRFP131 | |
IRF440
Abstract: DDD511B DDD5141 IRF44 IRF441 IRF442 IRF443 mosfet 441 7964 mosfet
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OCR Scan |
S13ci IRF440/441/442/443 IRF440 IRF441 IRF442 IRF443 DDD511B DDD5141 IRF44 mosfet 441 7964 mosfet | |
Contextual Info: SAMSUNG ELECTRONICS INC b4E D • 7^4142 IRFZ44/45 IRFZ40/42 QD124SD TES ■ SIIGK N-CHANNEL POWER MOSFETS FEATURES • • • • • • • Lower R d s o n Improved inductive ru gge d n e ss Fast sw itching tim es R u g g e d polysilicon gate cell structure |
OCR Scan |
IRFZ44/45 IRFZ40/42 QD124SD IRFZ44 IRFZ40 IRFZ45 GQ12454 | |
Contextual Info: SAMSUNG ELECTRONICS INC b4E ]> • 7^4142 FEATURES • • • • • • • QGISSÔR 02Ô « S U G K P-CHANNEL POWER MOSFETS IRF9Z14/Z15 IRF9Z10/Z12 TO-220 Lower R d s o n Improved inductive ruggedness Fast switching times Rugged polysilicon gate cell structure |
OCR Scan |
IRF9Z14/Z15 IRF9Z10/Z12 O-220 IRF9Z10 7Tb4142 00122C | |
IRF413
Abstract: 1RF530 IRF449 IRF460 RF543 samsung irf540 1RF540 1RF620 irf362 IRF448
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OCR Scan |
Ta-2510) SD210 TD-12 SD211 SD212 S0213 O-220AB IRF630 IRF631 IRF413 1RF530 IRF449 IRF460 RF543 samsung irf540 1RF540 1RF620 irf362 IRF448 | |
1rf520
Abstract: 1RF540 1RF620 1RF640 IRF510 RF523 IRF530 IRF532 IRF533 IRF541
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OCR Scan |
1RF522 O-220AB RF523 IRF530 O-220 1RF620 1rf520 1RF540 1RF640 IRF510 IRF532 IRF533 IRF541 | |
IRF9521
Abstract: f9520 IRF9520 Samsung
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OCR Scan |
DP12S4Ã IRF9520/9521/9522/9523 F9520 F9512 F9523 IRF9520 IRF9521 IRF9522 IRF9523 IRF9521 f9520 IRF9520 Samsung | |
IRF411
Abstract: IRF449 1RF540 irf413 1RF620 1rf520 irf362 IRF352 IRF353 IRF421
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OCR Scan |
Ta-25 IRF352 IRF353 IRF360 O-204AE IRF362 TQ-204AE IRF421 O-3150 O-204AA IRF411 IRF449 1RF540 irf413 1RF620 1rf520 irf362 IRF352 IRF353 IRF421 | |
BCM 4335
Abstract: relay btk 1012 ADP 3208 bcm 3380 btk 1012 1664810000 97ATEX6007X DIN EN 60999-1 HD 11070 moduflex
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