32N50B Search Results
32N50B Datasheets Context Search
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Contextual Info: n ixY S HiPerFAST IGBT IXGH 32N50B CES lC25 v CE sat % fi Symbol Maximum Ratings Test Conditions T a = 2 5 °C to 1 5 0 °C 500 V T j = 25° C to 150° C; R, . = 1 MU 500 V ’ GES Continuous +20 V V Transient +30 V GEM_ _ ^C2S T c = 2 5 °C 60 A ^C90 |
OCR Scan |
32n50bo-247t-15032n50bu1 | |
32N50Contextual Info: HiPerFAST IGBT with Diode IXGH 32N50BU1 IXGH 32N50BU1S v CES ^C25 v CE sat «1, Symbol Test Conditions Maximum Ratings V ces Tj = 25CC to 150CC 500 v CGR T j = 25°C to 150“ C; RGE = 1 M£2 500 V v GES Continuous ±20 V v¥gem Transient ±30 V ^C25 T0 = 25°C |
OCR Scan |
32n50bu132n50bu1so-24732n90bu1+3 | |
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Contextual Info: □ IXYS P re lim in a ry D ata S heet 32N50B 32N50BS HiPerFAST IGBT V CES ^C25 V CE sat t 'fi 500 V 60 A 2.0 V 80 ns TO-247 SMD (32N50BS) m Symbol Test Conditions V CES Ta = 2 5 C to 150 C 500 V V ¥cgr T j = 2 5 C to 150 C; RGE= 1 M 500 V V v GES |
OCR Scan |
ixgh32n50bixgh32n50bso-24732n50bs | |
32N50Contextual Info: n ix Y S IXGH 32N50B IXGH 32N50BS HiPerFAST IGBT v CES ^C25 ^ C E sa t tfi = = = = 500 V 60 A 2.0 V 80 ns 4C ¿) Ae Maximum Ratings Sym bol Test Conditions V CES Tj = 25°C to 150°C 500 V v CGR Tj = 25°C to 150°C; R OE = 1 M Q 500 V v GES v GEM Continuous |
OCR Scan |
32n50b32n50bso-247b2-17+1 | |
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Contextual Info: Preliminary Data Sheet 32N50BU1 32N50BU1S Hi Per FAST IGBT with Diode Combi Pack V CES ^C25 v CE sat K 500 V 60 A 2.0 V 80 ns TO-247 SMD (32N50BU1S) Symbol Test Conditions v CES Td = 25°C to 150°C V C3R T.J = 25°C to 150°C; RrF bb V eES V GEM |
OCR Scan |
ixgh32n50bu1ixgh32n50bu1so-24732n50bu1s | |
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Contextual Info: nixYS HiPerFAST IGBT with Diode IXGH 32N50BU1 V CES ^C25 V CE sat t rfi Symbol Test Conditions VCES VCGR T, =25°Cto150°C 500 V Tj = 25eC to 150° C; RGE= 1 MQ 500 V VGES VGEM Continuous 120 V Transient ¿30 V ^C25 Tc = 25° C ^C90 Tc =90° C ^CM Tc = 25° C, 1 ms |
OCR Scan |
32n50bu1cto150o-24732ns0bu1+1 | |
MJI-25Contextual Info: □ IXYS P re lim in a ry D a ta S h e e t 32N50BU1 32N50BU1S HiPerFAST IGBT with Diode Combi Pack V CES ^C25 V CE sat *fi TO-247 SMD (32N50BU1S) Symbol Test Conditions V CES T j = 25°C to 150°C 500 V v CGR T j = 25 °C to 150°C; RQE = 1 Mi2 |
OCR Scan |
ixgh32n50bu1ixgh32n50bu1so-24732n50bu1s+1 | |
IXGH32N50BU1
Abstract: IXGH32N50BU1S
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Original |
ixgh32n50bu1ixgh32n50bu1so-24732n50bu1s | |
IXGH32N50B
Abstract: IXGH32N50BS
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Original |
ixgh32n50bixgh32n50bso-24732n50bs | |
2QN60
Abstract: ixgh 1500
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OCR Scan |
t0-220ab12n100u117n100u140n30bd1+6 | |
7N60B
Abstract: 65A3 40N60A 60N60 IXGA 12N60C 200n60 ixgh 1500 30N30 IXG IGBT ixgh
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OCR Scan |
30n3028n304qn3031n60+12 | |
SMD diode b24
Abstract: diode b26 smd DIODE B28 20N60BU1 smd diode b23 60n60 igbt smd B292 12n60c SMD diode B2 b26 diode
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OCR Scan |
12n100o-220o-263o-247+14 | |
120n60b
Abstract: 40N30BD1 32N50 7n60c 20N60BU1 40N60A B-2160 200n60 12n60c IXGH24N50B
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OCR Scan |
o-220o-263o-24728n30+16 | |
200n60
Abstract: 20N30 n60c 50N60 7N60B IC IGBT 25N120 IC600 80n60 60n60 igbt 25N120
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Original |
plus24720n3028n3030n30+15 | |
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8n80
Abstract: DS117-12A 36-18N 16go 20N60A 2QN60 62-16N07 DSA117-12 10N60A MCC95-12io1B
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OCR Scan |
cs1011-18io1cs1011-22io1cs1011-25io1+16 | |
12n60u
Abstract: sta 750 tic 263a
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OCR Scan |
12n60usta 750tic 263a | |
DSE 130 -06A
Abstract: vub 70-12 IXGH 30n120 vub 70-16 30N60B 80N10 12N60CD DSEI 30-16 AS DSEP 15-06A 13N50
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OCR Scan |
axc-051axc-051-raxc-102axv-002+16 | |