SINGLE EVENT UPSET FPGA Search Results

voting elements

Abstract: 40MX 42MX 54SX AC134 voting
Contextual Info: Application Note AC134 Minimizing Single Event Upset Effects Using Synopsys This application note gives an overview of some single event upset SEU resistant design techniques and describes how to implement these techniques using Synopsys. Familiarity with the Synopsys FPGA Compiler tool and “dc_shell” script

BR2477a

Abstract: BR1220 FIPS-197 implement 16-bit CRC in transmitter and receiver
Contextual Info: Section IV. Design Security and Single Event Upset SEU Mitigation This section provides information on Design Security and Single Event Upset (SEU) Mitigation in Stratix III devices. Revision History Altera Corporation • Chapter 14, Design Security in Stratix III Devices

Contextual Info: Appl i cat i o n N ot e Minimizing Single Event Upset Effects Using Synopsys This application note gives an overview of some single event upset SEU resistant design techniques and describes how to implement these techniques using Synopsys. Familiarity with the Synopsys FPGA Compiler tool and “dc_shell” script

BR1220

Abstract: BR2477A FIPS-197
Contextual Info: Section IV. Design Security and Single Event Upset SEU Mitigation This section provides information on Design Security and Single Event Upset (SEU) Mitigation in Stratix III devices. • Chapter 14, Design Security in Stratix III Devices ■ Chapter 15, SEU Mitigation in Stratix III Devices

Synplify tmr

Abstract: aadl sequential logic
Contextual Info: v3.0 9-2-98 Appl i cat i o n N ot e Minimizing Single Event Upset Effects Using Synplicity This application note gives an overview of some single event upset SEU resistant design techniques and describes how to implement these techniques using Synplicity Synplify 3.0C

XAPP987

Abstract: voter XAPP988 XAPP216 RAM SEU fpga radiation CREME96 Upsets XAPP779 XQR2V6000
Contextual Info: Application Note: FPGAs Single-Event Upset Mitigation Selection Guide R Author: Brendan Bridgford, Carl Carmichael, and Chen Wei Tseng XAPP987 v1.0 March 18, 2008 Summary This application note discusses different aspects of single-event upsets and recommends

UG156

Abstract: single port ram testbench vhdl SRL16 XAPP962 XAPP987 Virtex-4 radiation XAPP1004 XAPP216 XC2VP40 XC4VLX200
Contextual Info: Application Note: Virtex-II, and Virtex-4 FPGAs R XAPP962 v1.1 March 14, 2008 Summary Single-Event Upset Mitigation for Xilinx FPGA Block Memories Authors: Greg Miller, Carl Carmichael, and Gary Swift Orbital, space-based, and extra-terrestrial applications are susceptible to the effects of highenergy charged particles. If of sufficient energy, these particles can cause single-event upsets

RAM EDAC SEU

Abstract: SRAM edac AC304 sram 2114 edac 2114 SRAM RAM SEU RAM64k36 7 bit hamming code hamming code
Contextual Info: Application Note AC304 Simulating SEU Events in EDAC RAM Introduction The Actel RTAX-S Field Programmable Gate Array FPGA provides embedded user static RAM in addition to single-event-upset (SEU)-enhanced logic, including embedded triple-module redundancy (TMR)

Actel a1280

Abstract: A1280 ACTEL burn-in VKS FPGA CQFP 106 A1020 RH1020 RH1280 RT1020 lockheed-martin CQFP 172 PIN
Contextual Info: v3.1 Radiation-Hardened FPGAs Features • • • • • • • • Guaranteed Total Dose Radiation Capability Low Single Event Upset Susceptibility High Dose Rate Survivability Latch-Up Immunity Guaranteed QML Qualified Devices Commercial Devices Available for Prototyping and

actel die run marking

Contextual Info: v3.1 Radiation-Hardened FPGAs Features • • • • • • • • Guaranteed Total Dose Radiation Capability Low Single Event Upset Susceptibility High Dose Rate Survivability Latch-Up Immunity Guaranteed QML Qualified Devices Commercial Devices Available for Prototyping and

CQFP 172 PIN

Abstract: A1280 Actel a1280 RH1280 RH1020 VKS FPGA CQFP 172 transistor a1020 VKS FPGA CQFP 106 A1020 RT1020
Contextual Info: v3.1 Radiation-Hardened FPGAs Features • • • • • • • • Guaranteed Total Dose Radiation Capability Low Single Event Upset Susceptibility High Dose Rate Survivability Latch-Up Immunity Guaranteed QML Qualified Devices Commercial Devices Available for Prototyping and

actel cqfp 84

Contextual Info: v3.1 Radiation-Hardened FPGAs Features • • • • • • • • Guaranteed Total Dose Radiation Capability Low Single Event Upset Susceptibility High Dose Rate Survivability Latch-Up Immunity Guaranteed QML Qualified Devices Commercial Devices Available for Prototyping and

Actel a1280

Abstract: RH1020 RH1020 datasheet RH1280 transistor a1020 VKS FPGA CQFP 106 A1020 A1280 marking 8AG lockheed-martin
Contextual Info: v3.0 Radiation-Hardened FPGAs Fe a t ur es • Non-Volatile, User Programmable Devices • Guaranteed Total Dose Radiation Capability • Fabricated in 0.8µ Epitaxial Bulk CMOS Process • Low Single Event Upset Susceptibility • High Dose Rate Survivability

Contextual Info: Æ ic te - m ! v 2 .0 Radiation-Hardened Field Programmable Gate Arrays Features Guaranteed Total Dose Radiation Capability Low Single Event Upset Susceptibility High Dose Rate Survivability Latch-Up Im m unity Guaranteed QML Qualified Devices

RTSX32SU CQ84 PROTO

Abstract: CQ84 SOC 8A fuse smd RTSX32SU CQ84 rtsx72su RTSX32SU CG624 thermal expansion
Contextual Info: Revision 8 RTSX-SU Radiation-Tolerant FPGAs UMC Designed for Space • SEU-Hardened Registers Eliminate the Need to Implement Triple-Module Redundancy (TMR) – Immune to Single Event Upsets (SEU) to LETth > 40 MeVcm2/mg, – SEU Rate < 10–10 Upset/Bit-Day in Worst-Case

h128 transistor

Abstract: transistors H128 NH FUSE LINDER BSC 25-05 quivalent book
Contextual Info: RadHard Field Programmable Gate Arrays F e a ftw s re s Guaranteed Total Dose Radiation Capability Low Single Event Upset Susceptibility High D oseR ateS urvivability Latch-Up Im m unity Guaranteed QML Qualified Devices Commercial Devices A vailablefor Prototyping and

RTSX32SU CQ84 PROTO

Abstract: RTSX32SU CQ84 RTSX72SU1 SOC 8A fuse smd RTSX32su CG624 thermal expansion
Contextual Info: Revision 9 RTSX-SU Radiation-Tolerant FPGAs UMC Designed for Space • SEU-Hardened Registers Eliminate the Need to Implement Triple-Module Redundancy (TMR) – Immune to Single Event Upsets (SEU) to LETth > 40 MeVcm2/mg, – SEU Rate < 10–10 Upset/Bit-Day in Worst-Case

0116 solar 4 pins

Abstract: 8ag marking equivalent transistor A1020 y 7 b RH1280
Contextual Info: v 2. 0 Radiation-Hardened Field Programmable Gate Arrays Features • Guaranteed Total Dose Radiation Capability • Low Single Event Upset Susceptibility • High Dose Rate Survivability • Latch-Up Immunity Guaranteed • QML Qualified Devices • Commercial Devices Available for Prototyping and

32 BIT ALU design with vhdl Xilinx ISE 8.2i

Abstract: xc4fx20-10ff672 ML405 ucf file 83-ISP UG156 32 BIT ALU design with vhdl RAMB16 XAPP1004 XC4VFX20 ML405
Contextual Info: Application Note: Virtex-4 FX FPGAs Single-Event Upset Mitigation Design Flow for Xilinx FPGA PowerPC Systems R XAPP1004 v1.0 March 14, 2008 Summary Authors: Greg Miller, Carl Carmichael, and Gary Swift Orbital, space-based, and extra-terrestrial applications are susceptible to the effects of high

Synplify tmr

Abstract: voter vhdl code for a grey-code counter CC16CE MUXCY CC16SE SRL16 XAPP197 XAPP216 vhdl coding for hamming code
Contextual Info: Application Note: Virtex Series R XAPP197 v1.0.1 July 6, 2006 Triple Module Redundancy Design Techniques for Virtex FPGAs Author: Carl Carmichael Summary Triple Module Redundancy (TMR) combined with Single Event Upset (SEU) correction through partial reconfiguration is a powerful and effective SEU mitigation strategy. This method is only

Contextual Info: 9 SEU Mitigation for Stratix V Devices 2013.05.06 SV51011 Subscribe Feedback This chapter describes the error detection features in Stratix V devices. You can use these features to mitigate single event upset SEU or soft errors. Related Information Stratix V Device Handbook: Known Issues

Synplify tmr

Abstract: CC16CE vhdl code hamming edac memory vhdl code for a grey-code counter XAPP216 voter CC16RE vhdl coding for error correction and detection algorithms vhdl code hamming RAM EDAC SEU
Contextual Info: Application Note: Virtex Series R XAPP197 v1.0 November 1, 2001 Triple Module Redundancy Design Techniques for Virtex FPGAs Author: Carl Carmichael Summary Triple Module Redundancy (TMR) combined with Single Event Upset (SEU) correction through partial reconfiguration is a powerful and effective SEU mitigation strategy. This method is only

ACTEL CCGA 624 mechanical

Abstract: 208-Pin CQFP Actel a54sx72a tid CCGA -CG 472
Contextual Info: v2 . 2 RTSX-S RadTolerant FPGAs Designed for Space • • • • • SEU-Hardened Registers Eliminate the Need to Implement Triple-Module Redundancy TMR – Immune to Single-Event Upsets (SEU) to LETth > 40 MeV-cm2/mg, – SEU Rate < 10–10 Upset/Bit-Day in Worst-Case

2001TL

Abstract: actel die run marking
Contextual Info: Æ lctel Radiation-Hardened Field Programmable Gate Arrays F e a tu re s • Guaranteed Total Dose Radiation Capability • Low Single Event Upset Susceptibility • High Dose Rate Survivability • Latch-Up Immunity Guaranteed • QML Qualified Devices • Commercial Devices Available for Prototyping and