HXNV0100 Search Results
HXNV0100 Datasheets Context Search
Catalog Datasheet | Type | Document Tags | |
---|---|---|---|
HXNV0100Contextual Info: HXNV0100 HXNV0100 1Megabit 64K x 16 Non-Volatile Magneto-Resistive RAM Features • Fabricated on S150 Silicon On Insulator SOI CMOS Underlayer Technology ■ 150 nm Process (Leff = 130 nm) ■ Total Dose Hardness ≥ 1x106 rad (Si) ■ ■ ■ Dose Rate Upset Hardness ≥ 1x109 |
Original |
HXNV0100 1x106 1x109 1x1012 1x10-10 1x1014 1x1015 N61-0995-000-000 | |
Contextual Info: HXNV0100 HXNV0100 1Megabit 64K x 16 Non-Volatile Magneto-Resistive RAM Features n Fabricated on S150 Silicon On Insulator SOI CMOS Underlayer Technology n 150 nm Process n Total Dose Hardness 1x106 rad (Si) n Dose Rate Upset Hardness 1x109 rad(Si)/s |
Original |
HXNV0100 HXNV0100 1x106 1x109 1x1012 1x10-10 1x1014 1x1015 ADS-14191 | |
honeywell mram
Abstract: silicon on insulator
|
Original |
HMXNV0100 HXNV0100 16-bit honeywell mram silicon on insulator | |
HXNV0100
Abstract: Tunneling Magnetoresistance mram HXVN0100 MIL-PRF38535 S150 Department of Defense honeywell mram
|
Original |
HXVN0100 HXNV0100 1x106 1x109 1x1012 1x10-10 1x1014 1x1015 N61-0995-000-000 Tunneling Magnetoresistance mram HXVN0100 MIL-PRF38535 S150 Department of Defense honeywell mram |