HXNV0100 Search Results
HXNV0100 Datasheets Context Search
| Catalog Datasheet | Type | Document Tags | |
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HXNV0100Contextual Info: HXNV0100 HXNV0100 1Megabit 64K x 16 Non-Volatile Magneto-Resistive RAM Features • Fabricated on S150 Silicon On Insulator SOI CMOS Underlayer Technology ■ 150 nm Process (Leff = 130 nm) ■ Total Dose Hardness ≥ 1x106 rad (Si) ■ ■ ■ Dose Rate Upset Hardness ≥ 1x109 |
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hxnv01001x1061x1091x1012+4 | |
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Contextual Info: HXNV0100 HXNV0100 1Megabit 64K x 16 Non-Volatile Magneto-Resistive RAM Features n Fabricated on S150 Silicon On Insulator SOI CMOS Underlayer Technology n 150 nm Process n Total Dose Hardness 1x106 rad (Si) n Dose Rate Upset Hardness 1x109 rad(Si)/s |
Original |
hxnv01001x1061x1091x1012+4 | |
honeywell mram
Abstract: silicon on insulator
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Original |
hmxnv0100hxnv010016-bithoneywell mram+1 | |
HXNV0100
Abstract: Tunneling Magnetoresistance mram HXVN0100 MIL-PRF38535 S150 Department of Defense honeywell mram
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Original |
hxvn0100hxnv01001x1061x109+11 |