32N50BU1 Search Results
32N50BU1 Datasheets Context Search
Catalog Datasheet | Type | Document Tags | |
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32N50Contextual Info: HiPerFAST IGBT with Diode IXGH 32N50BU1 IXGH 32N50BU1S v CES ^C25 v CE sat «1, Symbol Test Conditions Maximum Ratings V ces Tj = 25CC to 150CC 500 v CGR T j = 25°C to 150“ C; RGE = 1 M£2 500 V v GES Continuous ±20 V v¥gem Transient ±30 V ^C25 T0 = 25°C |
OCR Scan |
32N50BU1 32N50BU1S O-247 32N50BU1S) 32N90BU1 32NS0BU1S B2-22 32N50 | |
Contextual Info: Preliminary Data Sheet 32N50BU1 32N50BU1S Hi Per FAST IGBT with Diode Combi Pack V CES ^C25 v CE sat K 500 V 60 A 2.0 V 80 ns TO-247 SMD (32N50BU1S) Symbol Test Conditions v CES Td = 25°C to 150°C V C3R T.J = 25°C to 150°C; RrF bb V eES V GEM |
OCR Scan |
IXGH32N50BU1 IXGH32N50BU1S O-247 32N50BU1S) | |
Contextual Info: nixYS HiPerFAST IGBT with Diode IXGH 32N50BU1 V CES ^C25 V CE sat t rfi Symbol Test Conditions VCES VCGR T, =25°Cto150°C 500 V Tj = 25eC to 150° C; RGE= 1 MQ 500 V VGES VGEM Continuous 120 V Transient ¿30 V ^C25 Tc = 25° C ^C90 Tc =90° C ^CM Tc = 25° C, 1 ms |
OCR Scan |
32N50BU1 Cto150 O-247 32NS0BU1 B2-47 | |
MJI-25Contextual Info: □ IXYS P re lim in a ry D a ta S h e e t 32N50BU1 32N50BU1S HiPerFAST IGBT with Diode Combi Pack V CES ^C25 V CE sat *fi TO-247 SMD (32N50BU1S) Symbol Test Conditions V CES T j = 25°C to 150°C 500 V v CGR T j = 25 °C to 150°C; RQE = 1 Mi2 |
OCR Scan |
IXGH32N50BU1 IXGH32N50BU1S O-247 32N50BU1S) MJI-25 | |
IXGH32N50BU1
Abstract: IXGH32N50BU1S
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Original |
IXGH32N50BU1 IXGH32N50BU1S O-247 32N50BU1S) IXGH32N50BU1 IXGH32N50BU1S | |
2QN60
Abstract: ixgh 1500
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OCR Scan |
T0-220AB^ 12N100U1 17N100U1 40N30BD1 22N50BU1 24N50BU1 32N50BU1 2QN60BU1 2QN60 ixgh 1500 | |
Contextual Info: n ixY S HiPerFAST IGBT IXGH 32N50B CES lC25 v CE sat % fi Symbol Maximum Ratings Test Conditions T a = 2 5 °C to 1 5 0 °C 500 V T j = 25° C to 150° C; R, . = 1 MU 500 V ’ GES Continuous +20 V V Transient +30 V GEM_ _ ^C2S T c = 2 5 °C 60 A ^C90 |
OCR Scan |
32N50B O-247 t-150 32N50B 32N50BU1 | |
32N50Contextual Info: n ix Y S IXGH 32N50B IXGH 32N50BS HiPerFAST IGBT v CES ^C25 ^ C E sa t tfi = = = = 500 V 60 A 2.0 V 80 ns 4C ¿) Ae Maximum Ratings Sym bol Test Conditions V CES Tj = 25°C to 150°C 500 V v CGR Tj = 25°C to 150°C; R OE = 1 M Q 500 V v GES v GEM Continuous |
OCR Scan |
32N50B 32N50BS O-247 32N50BS) B2-17 32N50 | |
SMD diode b24
Abstract: diode b26 smd DIODE B28 20N60BU1 smd diode b23 60n60 igbt smd B292 12n60c SMD diode B2 b26 diode
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OCR Scan |
12N100 O-220 O-263 O-247 O-247 T0-204 30N30/. 40N30/. 31N60 SMD diode b24 diode b26 smd DIODE B28 20N60BU1 smd diode b23 60n60 igbt smd B292 12n60c SMD diode B2 b26 diode | |
120n60b
Abstract: 40N30BD1 32N50 7n60c 20N60BU1 40N60A B-2160 200n60 12n60c IXGH24N50B
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OCR Scan |
O-220 O-263 O-247 28N30 30N30 40N30 2N100 8N100 6N100 12N10Q 120n60b 40N30BD1 32N50 7n60c 20N60BU1 40N60A B-2160 200n60 12n60c IXGH24N50B | |
200n60
Abstract: 20N30 n60c 50N60 7N60B IC IGBT 25N120 IC600 80n60 60n60 igbt 25N120
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Original |
PLUS247 20N30 28N30 30N30 40N30 31N60 38N60 41N60 60N60 O-264 200n60 20N30 n60c 50N60 7N60B IC IGBT 25N120 IC600 80n60 60n60 igbt 25N120 | |
7n60b
Abstract: 35N120u1 ixys dsei 45-12a DSDI 35-12A 20N80 80n06 80n60 VVY 40-16IO1 IXYS CS 2-12 IXFX 44N80
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Original |
AXC-051 AXC-053 AXC-101 AXC-102 AXL-001 AXL-051 AXV-102 142-12io8 142-16io8 19-08ho1 7n60b 35N120u1 ixys dsei 45-12a DSDI 35-12A 20N80 80n06 80n60 VVY 40-16IO1 IXYS CS 2-12 IXFX 44N80 | |
8n80
Abstract: DS117-12A 36-18N 16go 20N60A 2QN60 62-16N07 DSA117-12 10N60A MCC95-12io1B
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OCR Scan |
CS1011 -18io1 CS1011-22io1 CS1011-25io1 CS1250-12io1 CS1250-14io1 CS1250-16io1 CS20-12 CS20-14 CS20-16 8n80 DS117-12A 36-18N 16go 20N60A 2QN60 62-16N07 DSA117-12 10N60A MCC95-12io1B | |
12n60u
Abstract: sta 750 tic 263a
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OCR Scan |
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