TM2015
Abstract: TM-2003 2a09 TM2016 TM 2016 CARSEM G600 MIC2177YWM MIC5219YMM MIL-STD-883 PRESSURE
Contextual Info: RELIABILITY REPORT DATE: 09/17/03 QUALITY ENG : PURPOSE: Dinh Pham LEAD FREE PKG QUAL 408 474-3621 QUAL VEHICLES : PACKAGE TYPE : ASSEMBLY LOC M/C LOT # FAB D/C # PROCESS MIC2177YWM 20L WSOIC CARSEM 6600 3A02058MEA SJ 0313 BCC MIC5219YMM 8L MSOP UNISEM G600
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mic2177ywm3a02058meamic5219ymm145779mea+140237gmic5248bm5ot-236710s2a09099mea1000hrtm2015tm-20032a09tm2016tm 2016carsemg600mil-std-883 pressure
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B1340
Abstract: sy10s897 TSMC 0.18 um CMOS 2A243 bcd3 cmos tsmc 0.18 TSMC 0.25Um MIC29203BU Unisem B816E
Contextual Info: Q1-2004-MICREL- PKG STORAGE LIFE TEST BAKE TA = + 150C Package Family PKG Type Lds Device WM W-SOIC W-SOIC W-SOIC WSOIC WSOIC WSOIC WSOIC WSOIC WSOIC WSOIC WSOIC 16 16 16 20 28 28 28 28 28 28 28 MIC2027 MIC2527 MIC2527 MIC2177 MIC1700B SY69952ZC SY69952ZC
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q1-2004-micrel-mic2027mic2527mic2177+13mic1700bsy69952zcsy87701vb1340sy10s897tsmc 0.18 um cmos2a243bcd3cmos tsmc 0.18tsmc 0.25ummic29203buunisemb816e
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MIC29151WU
Abstract: MIC2171WU MIC29151BU MIC2177YWM 20L SOT-23 UNISEM Preconditioning 3a204
Contextual Info: RELIABILITY REPORT DATE: 4/28/2004 QUALITY ENG : Herb Grimm PURPOSE: Matte Tin Reliability Test Summary. HTOL - High Temperature Operating Life Test TA= + 125°C PACKAGE TYPE : PART NO. LOT ID. 168 HR 500 HR 1000HR SSOP 28L MIC2563AYSM 2A28088M01 0/116 0/116
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1000hrmic2563aysm2a28088m01mic2177ywm+123a02058meaot-23mic5248ym2a09099meao-263mic29151wumic2171wumic29151bu20l sot-23unisempreconditioning3a204
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