40F-701-1-15
Abstract: nikon STEPPER 71007 MIL-STD-883 method 5003 INCOMING MATERIAL INSPECTION procedure harris top marking product change notification
Contextual Info: Status of Document is:RELEASED Effective from: 19-SEP-1997 14:23:42 to Date Printed: 09/24/97 7:46 AM SECTION 2.0 Controlled Document QML GENERAL NON-TECHNOLOGY SPECIFIC GENERAL Section 2.0 of this manual is written to describe the general (non-technology specific)
|
Original
|
19-sep-1997210xxx710-010-xx40f-400-0-0+640f-701-1-15nikon stepper71007mil-std-883 method 5003incoming material inspection procedureharris top marking product change notification
|
PDF
|
intersil DATE CODE MARKING
Abstract: pin diagram details of CD4015 y2010 R4573 B TA3842 wafer fab control plan TA388* transistor ESD test plan ta5142 R4573
Contextual Info: Status of Document is: RELEASED Effective from: 07-AUG-2000 09:48:23 to Date Printed: 07-Aug-2000 10:33:38 Controlled Document QML QUALITY MANAGEMENT PLAN Title: QML QUALITY MANAGEMENT PLAN Specification Type: DOCS Specification Number :999015 Issue :24 Page :1 of 100
|
Original
|
07-aug-200028-sep-199503-nov-199521-sep-1995+10intersil date code markingpin diagram details of cd4015y2010r4573 bta3842wafer fab control planta388* transistoresd test planta5142r4573
|
PDF
|
TM2004
Abstract: MIL-STD-883 method 5003 TM1011 ACT-R01 54XXXX 40F-701-1-15 marking 25b harris top marking product change notification Harris top marking
Contextual Info: Status of Document is:RELEASED Effective from: 02-JUN-1997 08:18:36 to Date Printed: 06/09/97 6:39 AM SECTION 2.0 Controlled Document QML GENERAL NON-TECHNOLOGY SPECIFIC GENERAL Section 2.0 of this manual is written to describe the general (non-technology specific)
|
Original
|
02-jun-1997210xxx710-010-xx40f-400-0-0+9tm2004mil-std-883 method 5003tm1011act-r0154xxxx40f-701-1-15marking 25bharris top marking product change notificationharris top marking
|
PDF
|