A1993 Search Results

74ABTH18646A

Contextual Info: SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS166D - AUGUST 1993 - REVISED JULY 1996 Members of the Texas Instruments SCOPE Family of Testability Products One Boundary-Scan Cell Per I/O

SN54ABT18502

Abstract: H TR 1A60 texas instruments 486 TR 1A60
Contextual Info: SN54ABT18502 SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER SCBS109C - AU G U S T 1992 - RE V IS E D AU G U S T 1994 SCOPE Instruction Set - IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ - Parallel-Signature Analysis at Inputs With

KVT 20 Temperature

Abstract: SN54ABTH182504A SN54ABTH18504A SN74ABTH182504A SN74ABTH18504A
Contextual Info: SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS - S C B S 1 6 5 A - AU G U S T 1993 - REVISED AU G U S T 1994 ' Members of the Texas Instruments

SN54BCT8244A

Abstract: SN74BCT8244A
Contextual Info: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042D - FEBRUARY 1990 - REVISED APRIL 1994 Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to SN54/74F244 and SN54/74BCT244 in the Normal­

SN54LVT18502

Contextual Info: SN54LVT18502 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS669-JULY 1996 M e m b e r of the Te x a s I n s t r u m e n t s S C O P E F a mi l y o f Testabil ity P r o du c t s C o m p a t i b l e With the I EEE S t a n d a r d 11 4 9 . 1 - 19 9 0 J T A G Test A c c e s s P o r t and

lcd connector 14 pin IDC

Abstract: isd 2560 code example assembly 763050
Contextual Info: Introduction Signal Descriptions Cold Fi re Core Instruction Cache SRAM Bus Operation System Integration Module SIM Chip-Select Module Parallel Port Module DRAM Controller UART Module M-Bus Module Timer Module Debug Support IEEE 1149.1 Test Access Port (JTAG)

QS3J309Q

Contextual Info: QS3J309 Q QuickScan 9-Bit Universal JTAG Access Port with Output Enable QS3J309 FEATURES/BENEFITS DESCRIPTION • IEEE 1149.1a-1993 JTAG compliant • JTAG access to data, control and address lines • Capture and observe the embedded node • QuickSwitch fast switch technology

Contextual Info: User Manual September 1998 group Lucent Technologies Bell Labs Innovations 497AE and 1215E Boundary-Scan Master 2 Advanced Operational Mode F e a tu re s • The BSM2 is available in 2 versions: — The 497AE is available in a 28-pin SOJ pack­ age. — The 1215E device is available in a 48-pin TQFP

fll57

Contextual Info: Data Sheet October 1997 microelectronics group Lucent Technologies Bell Labs Innovations T7901 ISA Single Wide Area Connection ISA-SWAC Device Features • One wide area connection port that can be config­ ured as a basic rate ISDN TE or NT or as a syn­

TP31C

Abstract: r02f Boss NS-2 PAB1 td33 LDO DS3131 DS3134 LA10 LA12 TD39
Contextual Info: DALLAS SEM ICONDUCTOR DS3131 Preliminary Data Sheet V2 January 26, 1999 DALLAS SEMICONDUCTOR DS3131 BoSS Bit Synchronous HDLC CONTROLLER 40 Port / 40 Channel HDLC Controller with Option for Local Bus Access Preliminary Data Sheet Version 2 January 26, 1999

ITE 8512

Abstract: jrm A45 RD2 earth leakage relay TN2E-5V T7903FC 2768B tm4101 Aromat tn2e STT 3 SIEMENS T7903
Contextual Info: Preliminary Data Sheet April 1997 m icroelectronics group Lucent Technologies Bell Labs Innovations T7903 ISA Multiport Wide Area Connection ISA-MWAC Device F eatu res • Three wide area connection ports. Each port can be configured as a basic rate ISDN TE or NT or as

schematic diagram atx Power supply 500w

Abstract: pioneer PAL 012A 1000w inverter PURE SINE WAVE schematic diagram 600va numeric ups circuit diagrams winbond bios 25064 TLE 9180 infineon smsc MEC 1300 nu TBE schematic diagram inverter 2000w DK55 circuit diagram of luminous 600va UPS
Contextual Info: QUICK INDEX NEW IN THIS ISSUE! Detailed Index - See Pages 3-24 Digital Signal Processors, iCoupler , iMEMS® and iSensor . . . . . 805, 2707, 2768-2769 Connectors, Cable Assemblies, IC Sockets . . . . . . . . . . . 28-568 RF Connectors . . . . . . . . . . . . . . . . . . . . . . Pages 454-455

Contextual Info: MCH6660 Ordering number : A1993A SANYO Semiconductors DATA SHEET N-Channel and P-Channel Silicon MOSFET MCH6660 General-Purpose Switching Device Applications Features • • • • ON-resistance Nch : RDS on 1=105mΩ(typ.) Pch : RDS(on)1=205mΩ(typ.) 1.8V drive

SN54ABTH182652A

Abstract: SN54ABTH18652A SN74ABTH182652A SN74ABTH18652A
Contextual Info: SN54ABTH18652A, SN54ABTH182652A, SN74ABTH18652A, SN74ABTH182652A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS _ SCBS167A-AUGUST 1 9 9 3 - REVISED AUGUST 1994 Members of the Texas Instruments SCOPE Family of Testability Products

Contextual Info: QuickSwitch Products QuickScan SemcIuctor. I nc . 8 ' B qs3J245 Universal JTAG Access Port With Output Enable i t FEATURES/BENEFITS DESCRIPTION • IEEE 1149.1 a-1993 JTAG compliant The QS3J245 JTAG QuickScan device is designed to provide JTAG access to data, address, and

Contextual Info: SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SC B S 164E -A U G U S T 1993-R E V IS E D DECEMBER 1996 Members of the Texas Instruments SCOPE Family of Testability Products One Boundary-Scan Cell Per I/O

BT182

Contextual Info: SN54ABT18245A, SN74ABT18245A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS SCBS110H - AUGUST 1992 - REVISED FEBRUARY 1999 Members of the Texas Instruments SCOPE Family of Testability Products SN54ABT18245A . . . W D PACKAGE S N74ABT18245A . . . DGG OR DL PACKAGE

Contextual Info: SN54LVT18646, SN54LVT182646, SN74LVT18646, SN74LVT182646 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS311A - MARCH 1994 - REVISED JULY 1994 Members of the Texas Instruments SCOPE Family of Testability Products Compatible With the IEEE Standard

SN54ABT18245A

Abstract: SN74ABT18245A
Contextual Info: SN54ABT18245A, SN74ABT18245A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS SCBS11OE - AUGUST 1992 - REVISED JANUARY 1995 Members of the Texas Instruments SCOPE Family of Testability Products Members of the Texas Instruments Widebus™ Family SN54ABT18245A . . . WD PACKAGE

D1071

Abstract: LVTH182646A LVTH18646A SN54LVTH182646A SN54LVTH18646A SN74LVTH182646A SN74LVTH18646A
Contextual Info: SN54LVTH18646A, SN54LVTH182646A, SN74LVTH18646A, SN74LVTH182646A 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS _ S C BS 311B-M AR C H 1994-R E V IS E D JULY 1996 •

LVTH182504A

Abstract: LVTH18504A SN54LVTH182504A SN54LVTH18504A SN74LVTH182504A SN74LVTH18504A scbs667a
Contextual Info: SN54LVTH18504A, SN54LVTH182504A, SN74LVTH18504A, SN74LVTH182504A 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS S C B S 667A - JU LY 1996 - REVISED D ECE M B ER 1996 • • • • • • • Members of the Texas Instruments SCOPE Family of Testability Products

SN54ABT18245A

Abstract: SN74ABT18245A
Contextual Info: SN54ABT18245A, SN74ABT18245A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS SCBS110D - AUGUST 1992 - REVISED AUGUST 1994 Members of the Texas Instruments SCOPE Family of Testability Products Members of the Texas Instruments Widebus™ Family Compatible With the IEEE Standard

Contextual Info: MICR ON S E M I C O N D U C T O R INC b3E D • b l l l S M T D D D V bb ? 51b ■ MRN MT4C4004J 1 MEG x 4 DRAM I^HCRON DRAM 1 MEG x 4 DRAM QUAD CAS PARITY, FAST-PAGE-MODE FEATURES _ PIN ASSIGNMENT Top View • Four independent CAS controls, allowing individual

Contextual Info: 1.0 Product Description The R S8228 Octal ATM Transm ission Convergence TC PH Y device dram ati­ cally increases the level o f integration for switches and access systems. The R S8228 integrates all o f the ATM Layer processing functions found in the ATM