CY7C909 Search Results

CY7C909

Abstract: CY7C911-30JC cy7c911
Contextual Info: CY7C909 CY7C911 CYPRESS SEMICONDUCTOR CMOS Micro Program Sequencers Features • Fast — CY7C909/11 has a 30 ns min. clock to output cycle time; commercial and military • Low Power — I c e (max.) = 55 mA; commercial and military • V'cc margin — 5 V ± 10%

Contextual Info: CY7C909 CY7C911 CYPRESS SEMICONDUCTOR Features • Fast — CY7C909/11 has a 30-ns min. clock-to-output cycle time (com­ mercial and military) • Low power — Ic c (max.) = 55 mA (commercial and militaiy) • V cc margin — 5V+10% — All parameters guaranteed over

CY7c911

Abstract: CY7C909 stk 654 C909 CY7C911-30PC Register push pop
Contextual Info: CY7C909 CY7C911 CMOS Micro Program Sequencers CYPRESS SEMICONDUCTOR Features • Fast — CY7C909/11 has a 30-ns min. clock-to-output cycle time (com­ mercial and military) • Low power — Icc (max.) = 55 mA (commercial and military) • V<x' margin —5V+1»%

CY7C911

Abstract: 7c909
Contextual Info: CY7C909 CY7C911 CYPRESS SEMICONDUCTOR CMOS Micro Program Sequencers • Capable o f withstanding > 2001V stat­ ic discharge voltage Features • Fast — C Y7C909/U has a 30-ns min. clock-to-output cycle time (com­ mercial and military) • Low power — I(X (max.) = 55 mA (commercial

CY27S03A

Abstract: 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide
Contextual Info: Thermal Management and Component Reliability slope of the logarithmic plots is given by the activation energy of the failure mechanisms causing thermally activated wear out of the device see Figure 1 . One of the key variables determining the long-term reliability

CY7C9101

Abstract: CY7C510 CY7C190 cy7c189 G30-88 CY7c910 EA 9394 cy3341 CY6116 cy7c901
Contextual Info: fax id: 8511 Thermal Management Thermal Management and Component Reliability One of the key variables determining the long-term reliability of an integrated circuit is the junction temperature of the device during operation. Long-term reliability of the semiconductor chip degrades proportionally with increasing temperatures following an exponential function described by the

CY7C2901

Contextual Info: ÌB Ìcy p ress • Table 10. Die Sizes of Cypress Devices continued P a rt N um ber Size (mil2) P a rt N um ber Size (mil2) ECL Logic CY 2909A 7968 CY100E301L 14875 CY2910A 21750 CY100E302L 14875 CY2911A 7968 CY100E422 6960 11800 CY100E474 10830 CY7C510