CY3341DC
Abstract: km350 CY3341PC CY3341
Contextual Info: CY3341 64 x 4 FIFO Serial Memory Features D ata In p u t D ata O utp u t • T he fo u r b its o f d a ta on the Dq through D 3 inputs a re e n te re d into th e first loca tion w hen b o th in p ut ready IR and shift in (SI) are H IG H . This causes IR to go
|
OCR Scan
|
cy334111isicy3341dckm350+1cy3341pc
|
PDF
|
cy3341
Abstract: 7C401 cy7c405 EME-6300H 7C404
Contextual Info: Qualification Report April, 1993, QTP# 7191 & 9504, Version 1.0 64 x 4 and 64 x 5 Cascadeable FIFOs MARKETING PART NUMBER DEVICE DESCRIPTION CY3341 CY7C405 64 x 4 Serial Memory FIFO CY7C401/403 64 x 4 Cascadeable FIFO CY7C402/404 64 x 5 Cascadeable FIFO PRODUCT DESCRIPTION (for qualification)
|
Original
|
cy3341cy7c405cy7c401/403cy7c402/404+4cy3341/cy7c401/402/403/4047c401eme-6300h7c404
|
PDF
|
CY3341
Abstract: CY3341DMB CY3341PC CY3341DC
Contextual Info: CY3341 CYPRESS . . SEMICONDUCTOR Features Data Input Data Output • 1.2-/2-MHz data rate • Fully TTL compatible • Independent asynchronous inputs and outputs • Direct replacement for PMOS 3341 • Expandable in word length and width • CMOS for optimum speed/power
|
OCR Scan
|
cy3341cy3341dmbcy3341pccy3341dc |
PDF
|
CY3341DMB
Abstract: CY3341-2DM
Contextual Info: CY3341 CYPRESS _ SEMICONDUCTOR 64 x 4 FIFO Serial Memory Features Data Input • 1.2/2 M Hz data rate T h e four bits o f d a ta on the Do through D 3 inputs are entered into th e first lo cation w hen both In p u t R eady IR an d Shift In (SI) are H IG H . T his caus
|
OCR Scan
|
cy3341indicati341-2pccy3341-2dccy3341-2dmb+338-00011-bcy3341dmbcy3341-2dm
|
PDF
|
3341PC
Abstract: CY3341PC CY3341
Contextual Info: CY3341 CYPRESS SEMICONDUCTOR 64 x 4 FIFO Serial Memory Features D a ta Inp u t • 1 .2 /2 M H z d a ta rate • F u lly T T L co m p a tib le • In d ep en d en t a sy n c h r o n o u s in p u ts an d ou tp u ts • D ir e c t r e p la cem en t for P M O S
|
OCR Scan
|
cy33413341pccy3341pc |
PDF
|
cy7c9101
Abstract: CY2901 CY7C190 PLD20RA10 CY2149 CY7C122 CY7C148 CY7C149 CY7C150 22V10-Macrocell
Contextual Info: Military Product Selector Guide Static RAMs Size Organization 64 64 1K 1K 4K 4K 4K 4K 4K 8K 8K 16K 16K 16K 16K 16K 16K 16K 16K 16K 32K 32K 32K 32K 32K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 256K 256K 256K 256K 256K 256K 256K 1M 1M
|
Original
|
milstd883d22pin24pin28pin+1232pin300milcy7c9101cy2901cy7c190pld20ra10cy2149cy7c122cy7c148cy7c149cy7c15022v10-macrocell
|
PDF
|
verilog for SRAM 512k word 16bit
Abstract: CY62512V CYM74P436 192-Macrocell 62128 sram 7C1350 Triton P54C palce16v8 programming guide 7C168A intel 16k 8bit RAM chip
Contextual Info: Product Selector Guide Static RAMs Organization/Density Density X1 X4 4K X8 X9 X16 X18 X32 X36 7C148 7C149 7C150 16K 7C167A 7C168A 7C128A 6116 64K to 72K 7C187 7C164 7C166 7C185 6264 7C182 256K to 288K 7C197 7C194 7C195 7C199 7C1399/V 62256/V 62256V25 62256V18
|
Original
|
7c1487c1497c1507c167a+157c168a7c128a7c1877c1647c1667c185verilog for sram 512k word 16bitcy62512vcym74p436192-macrocell62128 sram7c1350triton p54cpalce16v8 programming guideintel 16k 8bit ram chip
|
PDF
|
cy3341
Abstract: 64K X 4 CACHE SRAM CY7C190 pasic380 cy7c189 palce22v10 programming guide palce16v8 programming algorithm STATIC RAM 6264 vhdl code for 8-bit parity checker 64x18 synchronous sram
Contextual Info: Product Selector Guide Static RAMs Organization/Density Density X1 X4 X4 SIO 7C147 2147 7C123 7C148 7C149 7C150 7C189 7C190 2148 2149 7C122 9122 93422 7C167A 7C168A 7C169A 7C170A 7C171A 7C172A 7C128A 7C187 7C164 7C166 7C161 7C162 7C185 6264 7C182 7C197 7C194
|
Original
|
7c1477c1237c1487c149+167c1507c1897c1907c1227c167a7c168acy334164k x 4 cache sramcy7c190pasic380cy7c189palce22v10 programming guidepalce16v8 programming algorithmstatic ram 6264vhdl code for 8-bit parity checker64x18 synchronous sram
|
PDF
|
CY27S03A
Abstract: 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide
Contextual Info: Thermal Management and Component Reliability slope of the logarithmic plots is given by the activation energy of the failure mechanisms causing thermally activated wear out of the device see Figure 1 . One of the key variables determining the long-term reliability
|
Original
|
cy7c122cy27s03a15jc10cy7c190+3cy7c9101cy7c122 dievic068a user guide
|
PDF
|
CY7C9101
Abstract: CY7C510 CY7C190 cy7c189 G30-88 CY7c910 EA 9394 cy3341 CY6116 cy7c901
Contextual Info: fax id: 8511 Thermal Management Thermal Management and Component Reliability One of the key variables determining the long-term reliability of an integrated circuit is the junction temperature of the device during operation. Long-term reliability of the semiconductor chip degrades proportionally with increasing temperatures following an exponential function described by the
|
Original
|
cy7c9101cy7c510cy7c190cy7c189+6g30-88cy7c910ea 9394cy3341cy6116cy7c901
|
PDF
|
Triton P54C
Abstract: cy7c37128 62128 SRAM adapter 48-pin TSOP CY7C37192 CYM74P436 CY3501A CY7C37512 MIB 30 Product Selector Guide
Contextual Info: Product Selector Guide Fast Static RAMs Organization/Density Density X1 X4 X4 SIO X8 4K 7C147 2147 7C123 7C148 7C149 7C150 2148 2149 7C122 9122 93422 16K 7C167A 7C168A 7C128A 6116 64K to 72K 7C187 7C164 7C166 7C185 6264 7C182 256K to 288K 7C197 7C194 7C195
|
Original
|
7c1477c1237c1487c149+167c1507c1227c167a7c168a7c128a7c187triton p54ccy7c3712862128 sramadapter 48-pin tsopcy7c37192cym74p436cy3501acy7c37512mib 30product selector guide
|
PDF
|
