8D89 Search Results

8E89

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specification of curve tracer

Abstract: coros steel 1541 ATV2500 VPP MIL-M-38535 2C9240
Contextual Info: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-22V10 CMOS PROGRAMMABLE LOGIC ARRAYS RELIABILITY DATA* - 125°C DYNAMIC OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) - 125°C RETENTION BAKE (PLASTIC)

Contextual Info: 12 2 1 1 1 1 231345546154781349A1BCDE1F1C31D1 2 2 2 F1C331 2 ◆2 CDA749EBF39D6E6A2 ・124DF52FBD7529D4A582 ・1B8526A58D642588DA52 ・17AB257DF2D7266D46452 2 ◆B 8E4DB ・ 6!2B586ADF2985"5FE2 #$2 ・%695A27A6F682EBF9B86FE527EC2672&'2

Contextual Info: 1 1 1 1 1 1 1234567829A7BC2DA7EF87 A3 A 7 A7F87 1 ◆1 CDA749EBF39D6E6AB 1 ・x115× !"1#151$4C%B91 1 ・&F69A1'46C%E1C6155C35341 1 ◆B 8E4DB ・A1DA691941 ・

M1014

Abstract: K2078 1c9136 5D9602 AT27C010 AT27C512R 1C9133 27c256r 1A9110 3D9352
Contextual Info: PAGE 1 OF 15 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C256R CMOS EPROM RELIABILITY DATA* * - 200°C DATA RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST - 125°C HIGH TEMPERATURE REVERSE BIAS (HTRB) - TEMPERATURE CYCLE, CENTRIFUGE, FINE AND GROSS

28C64 EEPROM

Abstract: eeprom 28c64 28c64 OB9028 K1909 6D9709 8823 2C9236 6B1999-1 6A9616
Contextual Info: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28C64 CMOS EEPROM RELIABILITY DATA -150°C DYNAMIC OPERATING LIFE TEST -DATA RETENTION BAKE (200°C) -CYCLE TEST -125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) -15 PSIG PRESSURE POT -85°C/85% RELATIVE HUMIDITY LIFE TEST

A47E

Abstract: D898D A4-7E E86A EB86 EF4 D4 9ga47 EFD8 87AD lg 86A
Contextual Info: =:,009 DA><7 DE5E8 C8>5I `yw-jjua 9MJYZWMX Q Q Q Q Q Q }*-wv. AGFBGF ut 6A@FDA> |AI A@dEF4F8 D8E<EF4@68 +;AFA <EA>4F<A@ ilgg0D?E 7<8>86FD<6 EFD8@:F; v@H<DA@?8@F4> BDAF86F<A@ BDA7G6F 4H4<>45>8 `,AyE _ 1vvv 6A?B><4@Fa 78D6C<BE<A@ {xdjjw -8D<8E A998D jdji0ut <@BGF 6A@FDA> 4@7 GE8 }*-wv. F86;@A>A:K FA BDAH<78 4@ 86A@A?<64> 4@7 D8><45>8 ?8F;A7 A9

27c512r

Abstract: ATMEL AT27c512 8a039 6J24 233759A-13 4b23 3C1091 2d9306 9c9949 5c2484
Contextual Info: PAGE 1 OF 17 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C512R CMOS EPROM RELIABILITY DATA* -125°C OPERATING LIFE TEST -150°C HIGH TEMPERATURE REVERSE BIAS (HTRB) -200°C RETENTION BAKE -PROGRAM/ERASE CYCLE -125°C OPERATING LIFE TEST (PLASTIC)

28HC64

Abstract: 28PC64 28HC16 MIL-M-38535 9C8944 Activation Energy
Contextual Info: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28HC64 CMOS EEPROM RELIABILITY DATA* - 125°C DYNAMIC OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) - 15 PSIG PRESSURE POT - CYCLE TEST * This report was generated from AT-28HC64 reliability testing.

E09A 81aa

Abstract: E896 8a6c E856 E78E 8E89
Contextual Info: 付録 機能一覧 .200 こんなときは.211 エラーメッセージ一覧.214

EEPROM 28C256

Abstract: 7b9729 1C0302 28C040 28C256 82307 28C256 atmel 4b23 6D9708 6C9638
Contextual Info: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28C256 CMOS EEPROM RELIABILITY DATA -150°C DYNAMIC OPERATING LIFE TEST -CYCLE TEST -200°C RETENTION BAKE -125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)