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    3E0319 Datasheets Context Search

    Catalog Datasheet Type Document Tags PDF

    49f040

    Abstract: 6H9709 6h1026 6e9620 7G1040-1 atmel AT49F040 6H9652 8P0211C-1
    Contextual Info: Page 1 of 11 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-49F040 FLASH MEMORY RELIABILITY DATA - 150°C OPERATING LIFE TEST - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT - 85°C/85% RELATIVE HUMIDITY OPERATING LIFE TEST


    Original     		at-49f0406h08856h02786h0279+126h10776h10267e01956h23c6h150049f0406h97096e96207g1040-1atmel at49f0406h96528p0211c-1 PDF

    EEPROM 28C256

    Abstract: 7b9729 1C0302 28C040 28C256 82307 28C256 atmel 4b23 6D9708 6C9638
    Contextual Info: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28C256 CMOS EEPROM RELIABILITY DATA -150°C DYNAMIC OPERATING LIFE TEST -CYCLE TEST -200°C RETENTION BAKE -125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)


    Original     		at-28c256mil-m38535at-28c010at-28c040+131c03023e03193e03233g0338eeprom 28c2567b972928c04028c2568230728c256 atmel4b236d97086c9638 PDF