2a92
Abstract: 27C010A 6E9621 6B9637 3A9315 3E0317 5A9516 5C9550 1B9126 2D1150-9
Contextual Info: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)
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AT-27C010
AT-27C010
E901-14056
2D1147-12
2a92
27C010A
6E9621
6B9637
3A9315
3E0317
5A9516
5C9550
1B9126
2D1150-9
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5A9516
Abstract: 5H9606 5H9605 7H9744 2A9212 5A9524 7H9747 9d9018 5c112 1B9126
Contextual Info: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)
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Original
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AT-27C010
AT-27C010
E901-14056
2D1147-12
5A9516
5H9606
5H9605
7H9744
2A9212
5A9524
7H9747
9d9018
5c112
1B9126
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TSOP 173 g
Abstract: 5H9602 6c9648 3b1326 5G9551 MIL-M-38535 6F9627 4c19 3C1660 atmel 906
Contextual Info: PAGE 1 OF 21 ATMEL COPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C040 CMOS EPROM RELIABILITY DATA* -125°C DYNAMIC OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT
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AT-27C040
MIL-M-38535
AT-27C1024
AT-27C512R
AT-27C010
AT-27C040
12C/TSOP/SOIC/PDIP
6D9702
8B9832
TSOP 173 g
5H9602
6c9648
3b1326
5G9551
6F9627
4c19
3C1660
atmel 906
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49f040
Abstract: 6H9709 6h1026 6e9620 7G1040-1 atmel AT49F040 6H9652 8P0211C-1
Contextual Info: Page 1 of 11 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-49F040 FLASH MEMORY RELIABILITY DATA - 150°C OPERATING LIFE TEST - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT - 85°C/85% RELATIVE HUMIDITY OPERATING LIFE TEST
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AT-49F040
AT-49F040
6H0885
6H0278
6H0279
6H1077
6H1026
7E0195
6H23C
6H1500
49f040
6H9709
6h1026
6e9620
7G1040-1
atmel AT49F040
6H9652
8P0211C-1
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