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    4B1973 Search Results

    4B1973 Datasheets Context Search

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    28C64 EEPROM

    Abstract: eeprom 28c64 28c64 OB9028 K1909 6D9709 8823 2C9236 6B1999-1 6A9616
    Contextual Info: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28C64 CMOS EEPROM RELIABILITY DATA -150°C DYNAMIC OPERATING LIFE TEST -DATA RETENTION BAKE (200°C) -CYCLE TEST -125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) -15 PSIG PRESSURE POT -85°C/85% RELATIVE HUMIDITY LIFE TEST


    Original
    at-28c64187-3b133317b2232510b-2+153a07813a0782b14b19734d19714d1971-228c64 eepromeeprom 28c6428c64ob9028k19096d970988232c92366b1999-16a9616 PDF

    EEPROM 28C256

    Abstract: 7b9729 1C0302 28C040 28C256 82307 28C256 atmel 4b23 6D9708 6C9638
    Contextual Info: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28C256 CMOS EEPROM RELIABILITY DATA -150°C DYNAMIC OPERATING LIFE TEST -CYCLE TEST -200°C RETENTION BAKE -125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)


    Original
    at-28c256mil-m38535at-28c010at-28c040+131c03023e03193e03233g0338eeprom 28c2567b972928c04028c2568230728c256 atmel4b236d97086c9638 PDF