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    28C64 EEPROM

    Abstract: eeprom 28c64 28c64 OB9028 K1909 6D9709 8823 2C9236 6B1999-1 6A9616
    Contextual Info: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28C64 CMOS EEPROM RELIABILITY DATA -150°C DYNAMIC OPERATING LIFE TEST -DATA RETENTION BAKE (200°C) -CYCLE TEST -125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) -15 PSIG PRESSURE POT -85°C/85% RELATIVE HUMIDITY LIFE TEST


    Original     		at-28c64187-3b133317b2232510b-2+153a07813a0782b14b19734d19714d1971-228c64 eepromeeprom 28c6428c64ob9028k19096d970988232c92366b1999-16a9616 PDF

    28HC64

    Abstract: 28PC64 28HC16 MIL-M-38535 9C8944 Activation Energy
    Contextual Info: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28HC64 CMOS EEPROM RELIABILITY DATA* - 125°C DYNAMIC OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) - 15 PSIG PRESSURE POT - CYCLE TEST * This report was generated from AT-28HC64 reliability testing.


    Original     		at-28hc64mil-m-38535at-28hc191/291at-28pc64+9at-28c256at-28hc16/17033474c234583c128hc6428pc6428hc169c8944activation energy PDF