3B93 Search Results

Contextual Info: SSI 32R2220RW ¿¡¡kmsustans’ +5V, 2-, 4-Channel Thin Film Read/Write Device A TDK Group/Company Advance Information February 1995 DESCRIPTION FEATURES The SSI 32R2220RW is a BiCMOS m onolithic integrated circuit designed for use with two-terminal recording heads. It provides a low noise read amplifier,

Contextual Info: SSI 32R2220RW ¿ +5V, 2-, 4-Channel Thin Film Read/Write Device ih m s y s te m s A TDK Group/Company Advance Information February 1995 DESCRIPTION FEATURES The SSI 32R2220RW is a BiCMOS monolithic Integrated circuit designed for use with two-terminal recording heads. It provides a low noise read amplifier,

2a92

Abstract: 27C010A 6E9621 6B9637 3A9315 3E0317 5A9516 5C9550 1B9126 2D1150-9
Contextual Info: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)

27C1024

Abstract: MIL-M-38535 2C9237 4B942 3B93
Contextual Info: PAGE 1 OF 12 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C1024 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C DATA RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT

MB90F0

Abstract: H352 MB90F931
Contextual Info: FUJITSU MICROELECTRONICS CONTROLLER MANUAL CM44-10150-1E F2MC-16LX 16-BIT MICROCONTROLLER MB90930 Series HARDWARE MANUAL F2MC-16LX 16-BIT MICROCONTROLLER MB90930 Series HARDWARE MANUAL For the information for microcontroller supports, see the following web site.

specification of curve tracer

Abstract: coros steel 1541 ATV2500 VPP MIL-M-38535 2C9240
Contextual Info: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-22V10 CMOS PROGRAMMABLE LOGIC ARRAYS RELIABILITY DATA* - 125°C DYNAMIC OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) - 125°C RETENTION BAKE (PLASTIC)

5A9516

Abstract: 5H9606 5H9605 7H9744 2A9212 5A9524 7H9747 9d9018 5c112 1B9126
Contextual Info: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)

q9898

Abstract: ac3b 639E 221C A127 m7217 j631
Contextual Info: ! ! " #$ % && ' ! ' % ' * + *,* -, * , . /! ' 0, & 1 2 !& ' $34& 5 " * ' * , ,* $" % 677 8 & 8 *7 3 7 ', ' ' , 3 ( 6 , ( & 0, !"# &' () *+ 122 %31 5 ) 4!33 , - . & $ % *) + $& / 0. + 123 # %122 %31 %6 # ) "3 2!4!3 7 8 , $629 7 %122 %31 %6 6 " 1= 9 = 1 & 3

TSOP 173 g

Abstract: 5H9602 6c9648 3b1326 5G9551 MIL-M-38535 6F9627 4c19 3C1660 atmel 906
Contextual Info: PAGE 1 OF 21 ATMEL COPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C040 CMOS EPROM RELIABILITY DATA* -125°C DYNAMIC OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT

2a92

Abstract: 3B9335 3C9343 AT29C010 32PDIP
Contextual Info: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-29C010 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - 200°C RETENTION BAKE - CYCLE TEST - 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 85°C/85% RELATIVE HUMIDITY OPERATING LIFE TEST

28c64b

Abstract: 28HC64b 5a9520 6D1565 7A3015-1 MIL-M-38535 6C9646 6D9702
Contextual Info: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28C64B PEROM RELIABILITY DATA -150°C OPERATING LIFE TEST -200°C RETENTION BAKE -CYCLE TEST -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT -85°C/85% RELATIVE HUMIDITY OPERATING LIFE TEST

G1338

Contextual Info: 123456789ABCDEDFDBC 11B3 1234546789A8B2CDEFD8 254728C88A8  F3 !"# # $%!&3B9D7'936B62  1! 3 3 !"#3

29C256

Abstract: 29C257 report on PLCC tsop 6 MIL-M-38535 3A0081
Contextual Info: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-29C256 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - CYCLE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC LIFE TEST (PLASTIC) - 125°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT

M1014

Abstract: K2078 1c9136 5D9602 AT27C010 AT27C512R 1C9133 27c256r 1A9110 3D9352
Contextual Info: PAGE 1 OF 15 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C256R CMOS EPROM RELIABILITY DATA* * - 200°C DATA RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST - 125°C HIGH TEMPERATURE REVERSE BIAS (HTRB) - TEMPERATURE CYCLE, CENTRIFUGE, FINE AND GROSS

27c080

Abstract: tsop 138 atmel 27c080 resistor activation energy MIL-M-38535 tsop40 3D0442-1
Contextual Info: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C080 EPROM RELIABILITY DATA - 125°C OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT * This report was generated from AT-27C080 reliability testing.

27c512r

Abstract: ATMEL AT27c512 8a039 6J24 233759A-13 4b23 3C1091 2d9306 9c9949 5c2484
Contextual Info: PAGE 1 OF 17 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C512R CMOS EPROM RELIABILITY DATA* -125°C OPERATING LIFE TEST -150°C HIGH TEMPERATURE REVERSE BIAS (HTRB) -200°C RETENTION BAKE -PROGRAM/ERASE CYCLE -125°C OPERATING LIFE TEST (PLASTIC)

28HC64

Abstract: 28PC64 28HC16 MIL-M-38535 9C8944 Activation Energy
Contextual Info: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28HC64 CMOS EEPROM RELIABILITY DATA* - 125°C DYNAMIC OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) - 15 PSIG PRESSURE POT - CYCLE TEST * This report was generated from AT-28HC64 reliability testing.

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D3950

Contextual Info: 123456789AB7C2D71EF 123456  !2"#$21A%!A& 1234546789A892BCDECF8 254728BF88A8  F3 !" #$%!&'1 &F& 3B9D7*936B62 'C2(&AC1"# 3 !" 3 +

EEPROM 28C256

Abstract: 7b9729 1C0302 28C040 28C256 82307 28C256 atmel 4b23 6D9708 6C9638
Contextual Info: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28C256 CMOS EEPROM RELIABILITY DATA -150°C DYNAMIC OPERATING LIFE TEST -CYCLE TEST -200°C RETENTION BAKE -125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)

29C256

Abstract: 29C257 PLCC 64
Contextual Info: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-29C256 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - CYCLE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC LIFE TEST (PLASTIC) - 125°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT

29c512 datasheet

Abstract: 29c512 3B9317 1H0050 at 29c512 datasheet 6F9631 1H0208 ATMEL 940
Contextual Info: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-29C512 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - CYCLE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT

rj45-8p8c

Abstract: RJ458P8C RJ45 8p8c rj45-8p 6p6c 8P8C RJ45
Contextual Info: XRJS Series RJ11/RJ45, Unshielded/Shielded, S M T T y p e it Numbering: XRJS - X - X X - X - X - X - X X X C O LD PLATING OPTIONS SPECIAL CODES SHIELDING OPTIONS s: Shielded U: Unshielded RUNNING CODES NUMBER OF PORTS NUMBER OF POSITIONS LED COLOR OPTIONS

22V10B

Abstract: ATV750 MIL-M-38535
Contextual Info: PAGE 1 OF 2 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-V750B EPLD RELIABILITY DATA* -125°C OPERATING LIFE TEST * This report was generated from ATV750 reliability testing. This data is applicable to the following device types due to same technology grouping as defined in MIL-M-38535 Appendix A: