RELIABILITY DATA ANALYSIS REPORT Search Results

WO7430

Abstract: 13KHZ 25KHZ ANTIFUSE
Contextual Info: Standard Products Reliability Analysis of Programmed UTMC PROMs following Post-Program Conditioning July 1998 Summary—Life test data were obtained on the UTMC Microelectronic Systems 64K and 256KBit programmable read-only memories PROMs following post-program conditioning (PPC). PPC is used to enhance the reliability

receiving inspection procedure

Abstract: reliability report QA procedure failure analysis research data reliability data analysis report
Contextual Info: Quality and Reliability Report 4. Customer Return Handling Flow and Failure Analysis Procedures Customer Return Handling Flow Failure Analysis Procedures To ensure that customers receive prompt and ef- A successful failure analysis should indicate the ficient service, Winbond has developed a detailed

Heraeus SOLDER PASTE F645

Abstract: heraeus f816 heraeus F645 SA30C5-89M30 Heraeus paste profile SN63-90 Heraeus paste profile F645 heraeus heraeus f816 SN63-90 Heraeus pb free paste profile
Contextual Info: SLVA333 Application Report May 2009 BGA Package Component Reliability After Long-Term Storage R. Key, B. Lange, R. Madsen ABSTRACT The white paper Component Reliability After Long Term Storage Texas Instruments application report SLVA304, http://focus.ti.com/lit/wp/slva304/slva304.pdf detailed a risk analysis with

Contextual Info: QUALITY ASSURANCE PROGRAMS AND FACILITIES At Dale Electronics, Inc., quality assurance is an independent organization which reports directly to the president. The infrastructure represented above has been in operation for more than 20 years. It symbolizes a commitment to excellence which has been steadily growing in terms of people,

ALTERA EPM7128SLC84

Abstract: FLUKE 8840a FLUKE 8840a specification EPM7128SLC84-7 atmel 160 pin EPM7128SLC84-7 part number atmel programming in c altera altera Date Code Formats ATMEL 340 EPM7128S
Contextual Info: White Paper ATF1500AS Analysis Report Introduction ® The Altera MAX 7000 family has many features that make it a leader in the programmable logic industry. MAX 7000 devices consume minimal power and are reliable at high frequencies. Additionally, these devices were designed for optimum timing characteristics and to support in-system programmability

L504XXX

Abstract: transistor 9427 m507xxx 9437 transistor CLCC 100 1550371 9434 8 pin integrated circuit
Contextual Info: March 1996 RR-B1A High-Frequency Bipolar Products Reliability Report This report presents the product reliability data for Maxim’s High-Frequency Bipolar analog and digital products. This data was collected from extensive reliability stress tests performed between June 1, 1994 and July 1,

MAX635

Abstract: MAX635ACJA MAX635AEJA MAX635BCJA MAX635BEJA MAX636 MAX636ACSA MAX636AESA MAX636AESA-T MAX637
Contextual Info: Maxim > Products > [Power and Battery Management] MAX635, MAX636, MAX637 Preset/Adjustable Output CMOS Inverting Switching Regulators Evaluation Kits none Reliability Reports Show FIT data for: Request Reliability Report for: Software/Models none Ordering Information

Reliability Test Methods for Packaged Devices

Abstract: Surface mount NPN/PNP complementary transistor Thermal Test-Element-Group transistors mos ISSN-0018-9529 Harris catalogue
Contextual Info: S E M I C O N D U C T O R RR002 Intelligent Power Products Reliability Report April 1992 CONCURRENT DESIGN, TEST AND RELIABILITY ENGINEERING OF POWER ASICs By Erwin A. Herr Introduction A program was initiated in July 1987 to develop a new Intelligent Power ASIC chip technology using state-of-the-art type

visual inspection of raw materials

Abstract: quality control procedure reliability test raw data quality and reliability report reliability test data analysis
Contextual Info: Quality and Reliability Report 3. Quality Management tain high standards and rigid specification control Quality Policy To become a world class company offering prod- throughout all the steps in the manufactur- ucts/services that best satisfy our customers, by

Transistor morocco 9740

Abstract: Ablebond 8360 con hdr hrs ablebond 8086 interfacing with 8254 peripheral Date Code Formats diodes St Microelectronics formatter board Canon interfacing of 8237 with 8086 ST tOP MaRKinGS 388BGA
Contextual Info: RELIABILITY REPORT Q98001 SICL BUSINESS UNIT REPORT NUMBER : Q98001 QUALIFICATION TYPE : NEW DEVICE - NEW PACKAGE DEVICE : STPC Client SIP101 SALES TYPES : STPCD0166BTC3 - STPCD0175BTC3 TECHNICAL CODE : MDBT*CHDT1BR PROCESS : HCMOS6 - CROLLES FAB LOCATION

Contextual Info: RELIABILITY MONITOR PROGRAM SECOND QUARTER 2002 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 8/17/02 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those

Contextual Info: RELIABILITY MONITOR PROGRAM SECOND QUARTER 2003 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 06/18/03 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those

Contextual Info: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2002 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 10/17/02 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those

Contextual Info: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 2002 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 01/20/03 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those

WINBOND

Contextual Info: Quality and Reliability Report 1. Introduction In order to guarantee the high standards of individuals with expertise in the design of reliability and quality in ICs supplied by memory ICs, microcomputer and peripherals ICs, Winbond, we have established an on-going

ST 9427

Abstract: 155-0241 155-0241-02 M726* TRANSISTOR st 9635 1550371 74935 M605030 806-0300 transistor 9427
Contextual Info: December 1997 RR-B2A High-Frequency Bipolar Products Reliability Report This report presents the product reliability data for Maxim’s High-Frequency Bipolar analog and digital products. This data was collected from extensive reliability stress tests performed between June 1, 1994 and

RR-63

Contextual Info: inteT RELIABILITY REPORT RR-63 August 1989 4 Static RAM Reliability Report MADHU NIMGAONKAR COMPONENTS CONTRACTING DIVISION QUALITY AND RELIABILITY ENGINEERING Order Number: 240544-001 4-63 SRAM RELIABILITY DATA SUMMARY CONTENTS PAGE 1.0 IN T R O D U C T IO N .4-65

quality acceptance plan

Abstract: in-coming quality control TR-TSY-000357
Contextual Info: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 1998 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 1/29/98 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those

reliability testing report

Contextual Info: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2001 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 4/30/01 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those

Contextual Info: RELIABILITY MONITOR PROGRAM SECOND QUARTER 2000 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 07/20/00 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those

Contextual Info: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2000 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 010/20/00 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those

Contextual Info: RELIABILITY MONITOR PROGRAM FIRST QUARTER 1999 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 4/20/99 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those

Contextual Info: RELIABILITY MONITOR PROGRAM THIRD QUARTER 1999 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 10/20/99 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those

Contextual Info: RELIABILITY MONITOR PROGRAM THIRD QUARTER 1999 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 10/20/99 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those