RELIABILITY DATA Search Results

JESD-B-102

Abstract: AVAGO DIP JESD-A102 JA113
Contextual Info: ACPL-M71U, ACPL-M72U Wide Operating Temperature High Speed, Low Power CMOS Digital Optocoupler with R2CouplerTM Isolation Reliability Data Sheet Description Definition of Failure The reliability data shown includes Avago Technologies reliability test data from the reliability qualification done

04-May-99

Abstract: 7086 M2024 M1009 M2003 M2004 M2015 vishay siliconix 70863-Revision
Contextual Info: Product Reliability Vishay Siliconix Vishay Siliconix Product Reliability Programs Product reliability at Vishay Siliconix is assured by two primary programs: the Reliability Qualification Program and the Product Reliability Monitor Program. Qualification Program Purpose

Contextual Info: Reliability Datasheet Philips Lumileds SignalSure Qualification Reliability Testing Reliability testing based on Philips Lumileds’ in-house quality test – Multi Environment Over Stress Test MEOST The development of SignalSure included extensive operational life-time and

Contextual Info: Reliability Datasheet Philips Lumileds SnapLED Qualification Reliability Testing Reliability testing based on Philips Lumileds’ in-house quality test – Multi Environment Over Stress Test MEOST The development of SnapLED included extensive operational life-time and

max232 16 pin diagram with pin function

Abstract: MAX232 MAX232 pin diagram 9434 8 pin integrated circuit max232 specification max232 diagram MXL902 NSO package MAX232 all pin diagram MAX202, MAX232
Contextual Info: February 1996 RR-2B Surface-Mount Devices Reliability Report This report presents reliability data for Maxim’s surfacemount devices, including the results of extensive reliability stress tests performed solely on epoxy surface-mount packages since 1991.

XC2018 PC84

Abstract: xc4300 XC4020 HQFP208 HQFP34 XC1765D XC3342 XC4305 XC4005E PHYSICAL XC500 356E-09
Contextual Info: The Reliability Data Program Expanded Version April 1, 1998 Cover TABLE OF CONTENTS Introduction .3 The Reliability Program. .3

M123A02BXB105KC

Abstract: BX DIELECTRIC c062 x7r capacitor CKS53 104j capacitor 104j 100v ELKO capacitors EIA-469 k 3918 M123A02BXB564KC
Contextual Info: CERAMIC HIGH-RELIABILITY GR900 SERIES & M IL-C-123 CAPACITORS F-3054D 6/97 CERAMIC HIGH RELIABILITY CERAMIC HIGH RELIABILITY CAPACITORS CERAMIC HIGH RELIABILITY PRODUCTS Ceramic Chips, Radial Molded KEMET Electronics Corporation has been known for many years as the leader in the ceramic high reliability products. KEMET produces high reliability

Contextual Info: Reliability Datasheet Philips Lumileds SignalSure Qualification Reliability Testing Reliability testing based on Philips Lumileds’ in-house quality test – Multi Environment Over Stress Test MEOST The development of SignalSure included extensive operational life-time and

M7401

Abstract: m74010 m7402 M74050 M74040 M74064 m80129 hyundai 9750 9745-1 VIC068A cy7c199zi
Contextual Info: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 1, 1998 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Marc Hartranft Reliability Manager CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT

max785cai

Abstract: MAX6809 MAX232CPE MAX232CPE application sheet MAX232ACPE MAX232AEPE MAX691ACPE T 9722 MAX232ECPE MAX233 application notes
Contextual Info: January 1999 Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1997/1998. It is separated into seven fabrication processes: 1

5 mm White LED

Abstract: Luxeon lens Luxeon RD25 110C 245C Philips led light 1998 RD-25 Luxeon Emitter Assembly Information silicon submount mttf water distribution
Contextual Info: Reliability Datasheet RD25 LUXEON Reliability Introduction LUXEON® Power Light Sources represent a revolutionary advance over conventional small signal LED light sources. This application note summa rizes the reliability performance of the LUXEON family. The application note

121C-2

Abstract: XC1765D XC95108 XL mp8000ch4 p103 pot datasheet reliability report PQFP240 XC95xxx 17256d D1 PGA 478
Contextual Info: The Reliability Data Program Expanded Version Jan. 1, 2000 Cover P1 TABLE OF CONTENTS Introduction .…4 The Reliability Program. .…4

cy7c9101

Abstract: M82054 M74070 97356 M8201 CY7C199-DMB 130C 140C CY7C1009-VC 519701901
Contextual Info: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 2, 1998 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Marc Hartranft Reliability Manager CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT

MAX785

Abstract: st 9635 DG302 to220 MAX232CPE MAX232 integrated chips IC 9637 MAX333 equivalent max232 MTBF calculation MAX232 mtbf st 9548
Contextual Info: December 1997 RR-1K Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1996. It is separated into seven fabrication processes: 1 Standard

PowerPC603r

Abstract: 21x21mm
Contextual Info: Tuesday, July 24, 2001 603r Reliability Data 603r Reliability & Qualification Data This is the reliability & qualification data for the PowerPC 603r microprocessor. The FIT and MTBF graphs for this device are located at the bottom of this page. Stress Results

2391

Abstract: 603EV
Contextual Info: Tuesday, July 24, 2001 603ev Reliability Data 603ev Reliability & Qualification Data This is the reliability & qualification data for the PowerPC 603ev microprocessor. The FIT and MTBF graphs for this device are located at the bottom of this page. Stress Results

A9701

Abstract: MIL-PRF38535 XC1700D XC7000 XC9500 xc4310 XC3390A vqfp100 package XC95XX XCS40 failure
Contextual Info: The Reliability Data Program Expanded Version Jan. 1, 1999 Cover P1 TABLE OF CONTENTS Introduction .… 4 The Reliability Program. .… 4

tms 9937

Abstract: M9922 TSMC fuse PALC22V10B-15PC 135C-6 cy7c136 PALC22V10B Hyundai 9944 140C CY7B923-JI
Contextual Info: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 4, 1999 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Director CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1999

MS1562

Abstract: SPX29150 SPX29300 reliability report and tests for failure rate the1000
Contextual Info: Reliability and Qualification Report Silan BP4 Process Reliability Qualification using the SPX29150 Prepared By: Salvador Wu & Greg West QA Engineering Date: September 15, 2006 SPX29150 Reliability Report Reviewed By: Fred Claussen VP Quality & Reliability

W49C65

Abstract: 9938 9952 l28 cypress 9938 G 9948 PALC22V10B Taiwan Alpha TSMC Flash cy82
Contextual Info: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 1, 2000 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Director CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 2000

general electric v420la20a

Abstract: V100ZA15 z1 V22ZA3 1021 MOV 2500V V100ZA05 CO60 Series at1012 V12ZA2 Littelfuse
Contextual Info: Varistor Products High Reliability Varistors MIL QPL High Reliability Varistors Description DA Series Littelfuse High Reliability Varistors offer the latest in increased product performance, and are available for applications requiring quality and reliability assurance levels

ST 9427

Abstract: 155-0241 155-0241-02 M726* TRANSISTOR st 9635 1550371 74935 M605030 806-0300 transistor 9427
Contextual Info: December 1997 RR-B2A High-Frequency Bipolar Products Reliability Report This report presents the product reliability data for Maxim’s High-Frequency Bipolar analog and digital products. This data was collected from extensive reliability stress tests performed between June 1, 1994 and

Contextual Info: Reliability Datasheet Philips Lumileds SignalSure Qualification Reliability Testing Reliability testing in accordance with AEC-Q101 Rev C The development of SignalSure included extensive operational life-time testing and environmental testing. Table 1 summarizes the tests applied and cumulative test results obtained from testing

MAX7845

Abstract: MAX232 MAX232 mtbf mar 9109 MAX333 equivalent MAX9690 equivalent scr 9117 maxim 9114 max232 specification MAX252 8 pin
Contextual Info: RR-1G Product Reliability Report This report presents the product reliability data for Maxim’s analog products. This data is a result of extensive reliability stress testing that we performed from 1990 to 1992. It is separated into four groups: Metal Gate