CY7B135 Search Results

sem 2106

Abstract: sem 2106 data set sem 2106 24 pin
Contextual Info: PRELIMINARY Features CY7B134 CY7B135 CY7B1342 SEMICONDUCTOR 4K x 8 Dual-Port Static RAMs and 4K x 8 Dual-Port Static RAM with Semaphores • 0.8-micron BiCMOS for high performance • High-speed access — 20 ns commercial — 25 ns (militaiy) • Automatic power-down

Contextual Info: P R ELIM IN A R Y CY7B134 CY7B135 CY7B1342 SEMICONDUCTOR 4K x 8 D ual-P ort Static R A M s and 4K x 8 D ual-Port Static R A M with Sem aph ores Features F unctional D escription • 0 . 8 - m ic r o n IU C M O S t o r h ig h p e r fo r m a n c e • H ig h -s p e e d a c c e s s

CY7C9101

Abstract: CY7C510 CY7C190 cy7c189 G30-88 CY7c910 EA 9394 cy3341 CY6116 cy7c901
Contextual Info: fax id: 8511 Thermal Management Thermal Management and Component Reliability One of the key variables determining the long-term reliability of an integrated circuit is the junction temperature of the device during operation. Long-term reliability of the semiconductor chip degrades proportionally with increasing temperatures following an exponential function described by the

m63044

Abstract: m64076 M64026 m7108 M64073 M63062 M64021 M71081 M63006 M71064
Contextual Info: RELIABILITY MONITOR SUMMARY QUARTERLY SUMMARY, QUARTER 1, 1997 April 17, 1997 PERFORMED PER THE REQUIREMENTS OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION. CYPRESS SEMICONDUCTOR PRODUCT RELIABILITY STANDARD STRESS TEST DESCRIPTIONS Test HTOL HTOL2

UM61256FK-15

Abstract: YD 6409 philips diode PH 33J um61256 um61256ak-15 PZ 5805 PHILIPS UM6164 KM6264BLS-7 UM61256ak sram IDT8M624
Contextual Info: QUICKSWITCH PRODUCTS HIGH-SPEED CMOS QUICKSWITCH QUAD 2:1 MUX/DEMUX QS3257 QS32257 FEATURES/BENEFITS DESCRIPTION • • • • • • • • The QS3257 is a high-speed CMOS LVTTL-compatible Quad 2:1 multiplexer/demultiplexer. The QS3257 is a function and pinout compatible QuickSwitch