9944 K Search Results

sf 818 transistor

Abstract: D-30916
Contextual Info: SALES OFFICES CANADA NEPEAN ONTARIO K2H 9C4 301 Moodie Drive Suite 307 Tel. 613 829-9944 Telefax (613) 829-8996 U.S.A. NORTH & SOUTH AMERICAN MARKETING HEADQUARTERS 55 Old Bedford Road LINCOLN, MA 01773 Tel. (781) 259-0300 Telefax (781) 259-4421 ALABAMA

Contextual Info: Product Preview PP/9944/1 December 2013 DE9944 SDR Demonstrator Software Defined Radio Demonstrator for FDMA Digital/Analogue PMR Introduction DE9944 Brief Description FDMA 6.25 kHz digital PMR is an enabler to achieve highly functional solutions by using low

DS-1000

Abstract: DS1302 DIE REVISION DH020 ds1000m-100 25409
Contextual Info: RELIABILITY MONITOR DS1000M-100 OCT '99 MONITOR DEVICE REVISION DATE CD LOT NUMBER PINS PACKAGE WIDTH ASSEMBLY SITE DS1000 E3 300 9944 PROCESS Single Poly, Single Metal DH927108AJC 8 PDIP CPS ChipPac, China 1.2 µm Standard Process JOB NO DESCRIPT Cf: 60%

ru 94vo circuit

Abstract: 604 LEM ru 94vo LAS 50-TP/SP1 lem lp tp LAS 50-TP-SP1 lem 9944 TCA 875 PN 1204 LPN.500
Contextual Info: feL; ¿^^-9944- Current Transducer LAS 50-TP IPN = 50 A For the electronic measurement of currents: DC, AC, pulsed, mixed, with a galvanic isolation between the primary circuit high power and the secondary circuit (electronic circuit). Preliminary Electrical data

microprocessors architecture of 8253

Abstract: embedded microprocessors 8284 microprocessor architecture JAYA46000 malaysia microelectronic solution 5ST86
Contextual Info: FF-stpc.qxd 24-09-1998 9:05 Pagina 1 SALES OFFICES AMERICAS BRAZIL 05413 SÃO PAULO R. Henrique Schaumann 286-CJ33 Tel. 55-11 883-5455 Telefax (55-11) 282-2367 CANADA NEPEAN ONTARIO K2H 9C4 301 Moodie Drive Suite 307 Tel. (613) 829-9944 Telefax (613) 829-8996

Hyundai 9944

Abstract: nseb ds1000m-100 DS2165Q
Contextual Info: RELIABILITY MONITOR DS1000M-100 OCT '99 MONITOR DEVICE REVISION DATE CODE LOT NUMBER PINS PACKAGE WIDTH ASSEMBLY SITE DS1000 E3 DIP 300 CPS ChipPac, C 9944 PROCESS Single Poly, Single Metal DH927108AJC 8 1.2 µm Standard Process JOB NO DESCRIPT Cf: 60% Ea: 0.7

74 HTC 00

Abstract: 74 HTC 08 DS1302 DIE REVISION Hyundai 9944
Contextual Info: RELIABILITY MONITOR DS1000M-100 OCT '99 MONITOR DEVICE REVISION DATE CD LOT NUMBER PINS PACKAGE WIDTH ASSEMBLY SITE DS1000 E3 300 9944 PROCESS Single Poly, Single Metal DH927108AJC 8 PDIP CPS ChipPac, China 1.2 µm Standard Process JOB NO DESCRIPT Cf: 60%

DTL-930

Abstract: dtl 930 9945 9962 G. 994.4 9932 DTL 9934 9946 9948 dtl 9946
Contextual Info: BIPOLAR DIGITAL ICs continued DTL-930 series4 LU Q >- t- z o HQ_ C • a a & E L] Q - DC X s H — L i. C J co Ü J a Gates 9930 9932 9933 9934* 9935 9936 9944 9946 9962 Flip-flops 9093 9094 9097 9099 9945 9948 h~ O z < LU O < u < a. Expandable dual 4-input

dallas date code ds1230

Abstract: dallas date code dallas ds1230 code 25807
Contextual Info: RELIABILITY MONITOR STRESS: VAPOR PHASE REFLOW CONDITIONS: 217C MONITOR DATE ASSEMBLY DATE PRODUCT REV JOB NO CODE FACILITY LOT NO. DS5002 C4 PACKAGE READ POINT QTY FAIL APR '00 25428 0004 Carsem DM925587AAF MQFP 3 203 DS87C520 A14 NOV '99 24798 9931 ATK Anam, K

Ablebond 71

Abstract: 9727
Contextual Info: 08/08/2002 RELIABILITY REPORT FOR DS1004, Rev E1 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

9945a

Abstract: ic 9945 a 8 pin ci 9933 b 9945 A transistor 9945 A 9962 GH cx 3120 inverter circuit diagram 9936 9936 GN diode 9948
Contextual Info: FAIRCHILD DIODE-TRANSISTOR MICROLOGIC INTEGRATED CIRCUITS COMPOSITE DATA SHEET A FAIRCHILD COMPATIBLE CURRENT SINKING LOGIC PRODUCT 0 °C TO 7 5 °C TEM PERATURE RANGE GENERAL DESCRIPTION— Fairchild Diode Transistor Micrologic DT/j L Integrated Circuits family uses

ic 9945 a 8 pin

Abstract: 9945 A transistor ic 9945 a 4 pin L9944 diode 9948 LT 9949 fairchild micrologic 3m 9962 9932 DTL fairchild 9946
Contextual Info: FAIRCHILD DIODE-TRANSISTOR MICROLOGIC INTEGRATED CIRCUITS COMPOSITE DATA SHEET A FAIRCHILD COMPATIBLE CURRENT SINKING LOGIC PRO DUCT 0°C TO 75°C TEM PERATURE RAN GE GENERAL DESCRIPTION — Fairchild Diode Transistor Micrologic DT/iL Integrated Circuits family uses

dallas date code ds1230

Abstract: 25091 e8 sot223 24446
Contextual Info: RELIABILITY MONITOR STRESS: WRITE CYCLE STRESS CONDITIONS: 85 C, 7.0 VOLTS MONITOR DATE ASSEMBLY PRODUCT REV DATE JOB NO CODE FACILITY LOT NO. DS1621 A7 JUN '99 24325 9915 ATP Anam, PI DK815282AAB SOIC 50 47 DS1869 A3 SEP '99 24445 9907 NSEB DJ824247ABA SOIC

ACT245

Abstract: 9944 74AC245 smd code book a7 transistor smd diode g6 54ACT 74ACT245 74ACT245MTC 74ACT245PC 74ACT245SC
Contextual Info: 54AC 74AC245  54ACT 74ACT245 Octal Bidirectional Transceiver with TRI-STATE Inputs Outputs General Description Features The ’AC ’ACT245 contains eight non-inverting bidirectional buffers with TRI-STATE outputs and is intended for bus-oriented applications Current sinking capability is 24 mA at

9418 transistor

Abstract: 9241 9329 9944 k 9329 transistor 9648 LTC1043 9944
Contextual Info: RELIABILITY DATA LTC1043 12/8/2000 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE NEWEST DATE CODE CERDIP SIDEBRAZE PLASTIC DIP 381 9226 961 8444 148 8445 1,490 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE PLASTIC DIP

DS1233 a5

Abstract: e8 sot223 9915 dallas 25010 DN819 densit DS1232L ds1232l datasheet DS1869 DK815282AAB
Contextual Info: RELIABILITY MONITOR STRESS: WRITE CYCLE STRESS CONDITIONS: 85 C, 7.0 VOLTS MONITOR DATE ASSEMBLY DATE PRODUCT REV JOB NO CODE FACILITY LOT NO. DS1621 A7 JUN '99 24325 9915 ATP Anam, PI DK815282AAB SOIC 50 45 DS1621 A7 SEP '99 24466 9930 ATP (Anam, PI) DK906731AAC SOIC

9962 GH

Abstract: L9932 l9933 9945 A transistor DTL 9930 9936 GN 9962 6H fairchild 9930 integrated circuits data inverter circuit diagram 9936 FD100 diode
Contextual Info: DIODE-TRANSISTOR MICROLOGIC INTEGRATED CIRCUITS A FAIRCHILD COMPATIBLE CURRENT SINKING LOGIC PRODUCT MILITARY TEMPERATURE RANGE: - 5 5 ° C to + 1 2 5 ° C GENERAL DESCRIPTION The Fairchild 9930 series of Diode Transistor Micrologic is a member of the Compatible Current Sinking Logic CCSL family designed for use in

Contextual Info: RELIABILITY MONITOR PROCESS: STRESS: 0.6 µm Double Poly, Single Metal Ti/TiN layers used on all Metals INFANT LIFE MONITOR DATE ASSEMBLY PRODUCT REV DATE JOB NO CODE FACILITY READ POINT QTY FAILS LOT NO. PACKAGE DS2502 C3 MAR '00 25253 0005 Carsem S DM941226AA

DN901118AAB

Abstract: c5 99 sot223 dk91
Contextual Info: RELIABILITY MONITOR PROCESS: STRESS: 0.6 µm Double Poly, Single Metal Ti/TiN layers used on all Metals INFANT LIFE READ POINT QTY FAILS MONITOR DATE ASSEMBLY PRODUCT REV DATE JOB NO CODE FACILITY LOT NO. PACKAGE DS2502 C2 JUN '99 24169 9915 Carsem S DM846764AA

9933 b

Abstract: st 9935 ic 9945 a 8 pin mos 9945 A transistor l9933 fairchild micrologic AD 9946 lt 9093 inverters diagrams UL9930
Contextual Info: DIODE-TRANSISTOR MICROLOGIC INTEGRATED CIRCUITS A FAIRCHILD COMPATIBLE CURRENT SINKING LOG IC PRODUCT MILITARY TEMPERATURE RANGE: -5 5 ° C to +125°C G E N E R A L D E S C R IP T IO N The 9932 buffer has active pull-up to provide increased capacitive drive and

218E-08

Abstract: ti 9919
Contextual Info: RELIABILITY MONITOR PROCESS: STRESS: 0.6 µm Double Poly, Single Metal Ti/TiN layers used on all Metals INFANT LIFE MONITOR DATE ASSEMBLY PRODUCT REV DATE JOB NO CODE FACILITY READ POINT QTY FAILS LOT NO. PACKAGE DS2502 C2 MAR '99 24153 9913 Carsem S DM842206AL

LT1413

Abstract: R340 9848
Contextual Info: RELIABILITY DATA LT1413 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SOIC/SOT/MSOP NEWEST DATE CODE 50 9522 50 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SOIC/SOT/MSOP 200 9347

LT1413

Abstract: R340
Contextual Info: RELIABILITY DATA LT1413 12/8/2000 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SOIC/SOT/MSOP 100 9513 100 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SOIC/SOT/MSOP 200 9347 200 • PRESSURE COOKER TEST AT 15 PSIG, +121°C

LT1460

Abstract: LT1790 LT6660 74822
Contextual Info: RELIABILITY DATA LT1460 / LT1790 / LT6660 10/17/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE PLASTIC DIP SOIC/SOT/MSOP NEWEST DATE CODE 438 9640 441 9633 879 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH PACKAGE TYPE SAMPLE