TMS 374 CHIP Search Results

tms 374

Abstract: tms 374 chip ACT8990 8 bit LFSR 8 bit LFSR for test pattern generation 8 bit LFSR advantages scan test during normal operation
Contextual Info: JTAG-Compatible Devices Simplify Board-Level Design for Testability by Lee Whetsel This paper was presented at the WESTCON Conference, 1989. Introduction A specification for an integrated circuit IC test bus and boundary scan architecture has been developed by the Joint

2N3904 ND

Abstract: 2N3904-NPN 0X00 TRANSISTOR BC 373 jtag bsdl cypress TRANSISTOR BC 814 tms 374 chip bsdl ultra37000
Contextual Info: Back Using IEEE 1149.1 Boundary Scan JTAG With Cypress Ultra37000 CPLDs Introduction As Printed Circuit Boards (PCBs) have become multi-layered with double-sided component mounting and Integrated Circuits have incorporated smaller lead spacing and higher pin

g545

Contextual Info: R iB b I i i i i i i i i i i i i i i External Interface The processor external interface consists of signals for bus operations and for system control. This chapter details the MB86933H signal set, describes basic bus timing, and describes the programmable wait-state generator, on-chip timer, and same-page

equivalent bc 517

Abstract: bc 312 equivalent Controller BC 415 MPC561 MPC563 BC2 373 EQUIVALENT BC 309 26vf 3410Z BC 247
Contextual Info: SECTION 25 IEEE 1149.1-COMPLIANT INTERFACE JTAG 25.1 IEEE 1149.1 Test Access Port (TAP) and Joint Test Action Group (JTAG) The chip design includes user-accessible test logic that is compatible with the IEEE 1149.1-1994 Standard Test Access Port and Boundary Scan Architecture. The

Contextual Info: MB86680B Edition 3.0 1. OVERVIEW 1.1 Outline The Fujitsu MB86680B is a self-routing ATM cell switch element SRE which can be used as a basic building block for a variety of 155Mb/s ATM switch fabrics. The switch element includes four expansion inputs, which are provided to

mdo 365

Abstract: MPC566 motorola 2443 MPC565 504 BC equivalent bc 517 4700Z BC 213 Motorola
Contextual Info: SECTION 24 IEEE 1149.1-COMPLIANT INTERFACE JTAG 24.1 IEEE 1149.1 Test Access Port (TAP) and Joint Test Action Group (JTAG) The chip design includes user-accessible test logic that is compatible with the IEEE 1149.1-1994 Standard Test Access Port and Boundary Scan Architecture.The implementation supports circuit-board test strategies based on this standard. An overview

BOSCH fpg

Abstract: A32140DX PCA82C250T PQFP160 Bosch TMS
Contextual Info: CANaccess A FPG n o B . CAN2 data sheet Features: • CAN 2.0B, up to 1Mbit/s • Trace Capability on Bit Level • MC683xx compatible Interface 300 ns • Access to all Internal Status, Error Counters • Frame Reference, TX Bus, RX Bus internally and externally available (FIFO

MB86900

Contextual Info: MB86930_ FUJITSU 930 Serles 32-BIT RISC EMBEDDED PROCESSOR May 25,1994 • Included to maximize theperformanceof the system with minimum glue logic, are chip select outputs, program­ mable wait-state generation and built-in support for a high performance connection to page-mode DRAM. See

lm39401t

Abstract: blm21p300 MOSFET R166 5361AS PANASONIC sram card 34 pin philips cdi schematics max232cwe 5361bs PQFP240 rpack8
Contextual Info: CRD42528 Reference Design for the CS49300 and CS42528 Features Description Supports 4 digital S/PDIF IEC60958/IEC61937 inputs 8 Discrete analog inputs using the CS42528 + 3 external CS5351 ADCs for 8 analog channels of input at 48 kHz and 96 kHz 2 Channel upsampling supported

2454 transistor

Abstract: IN 5358 IT 245 transistor 1047 SmartDie transistor y-217 gel 335 tms 374 X8050360150 243292
Contextual Info: Preliminary Mobile Pentium Processor with MMX Technology SmartDie® Product Specification • Support for MMX™ Technology ■ Low Voltage CMOS Silicon Technology ■ Compatible with Large Software Base ■ 4 Mbyte Pages for Increased TLB Hit — MS-DOS*, Windows*, OS/2*, UNIX*

ntc 47d

Abstract: ti75b NTC 4.7d -7 BIG IP F5 D30 ntc 5 om d21 ufc 101 vc
Contextual Info: MB86683B Edition 2.0 1. OVERVIEW The NTC is a full duplex device which can be used to provide broadband term ination functions in a variety of applications. Its primary use is for term inating the user or network ends of a user-netw ork interface based on ITU-T,

C 945 P331

Abstract: transistor RCA 467 RCA 417 847 transistor rca4 458 MSX532 P185 RCA 618 727 RCA 937 fairchild PJ 1169
Contextual Info: MSX Register Programming Manual Revision 2.1 February 2003 Revision History Revision 1.0, March 2000—Preliminary Release. Revision 1.1, May 2000—Initial Release. Revision 1.2, July 2000—Updated the RCC[1] connection information in the “Crosspoint Programming” section

74BCT8374

Abstract: D3641 TEX-E wire
Contextual Info: SN54BCT8374, SN74BCT8374 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS TI0223— 0 3 6 4 1 , JUNE 1990 SN54BCT8374 IT PACKAGE SN74BCT8374 . . . DW OR NT PACKAGE Members of Texas Instruments SCOPE Family of Testability Products TOP VIEW

Contextual Info: M B86936 FUJITSU 930 SERIES 32-BIT RISC EMBEDDED PROCESSOR APRIL, 1996 • On-chip clock generator circuit FEATURES • JTAG test interface • 25 and 50 MHz versions • Emulator support hardware • Clock doubler for 50 MHz version • Single vector trapping

OCX1601

Abstract: in107 OCX160 OCX256 IN118 rca 645 iN92 tms 1601
Contextual Info: OCX Register Programming Manual Revision 2.1 February 2003 Revision History Revision 1.0, March 2001—Preliminary Release. Revision 2.0, May 2002—Fairchild Semiconductor Preliminary Release. Revision 2.1, February 2003—Corrected references to OCX160.

tms 374

Abstract: u 741 AH-34 M301 SCAN182373A 25MIL
Contextual Info: 182373A N a tio n a l Semiconductor SCAN182373A Serially Controlled Access Network Transparent Latch with 2 5 il Series Resistor Outputs General Description Features The SCAN182373A is a high performance BiCMOS trans­ parent latch featuring separate data inputs organized into

gu43

Abstract: tms 374 BU 2735 AS SCAN182374A SCAN182374ASSC
Contextual Info: 182374A N a t i o n a l S e m i c o n d u c t o r SCAN182374A Serially Controlled Access Network D Flip-Flop with 25ft Series Resistor Outputs General Description Features The SCAN182374A is a high performance BiCMOS D-type flip-flop featuring separate D-type inputs organized into dual

Ob2 tube

Abstract: ST-52 SCAN182245A
Contextual Info: National 182245A tß Semiconductor SCAN182245A Serially Controlled Access Network Non-Inverting Transceiver with 25H Series Resistor Outputs General Description Features The SCAN182245A is a high performance BiCMOS bidirec­ tional line driver featuring separate data inputs organized

Loctite 576

Contextual Info: Order Number: MPC8245EC/D Rev. 0.4, 9/2001 Semiconductor Products Sector Advance Information MPC8245 Integrated Processor Hardware Specifications The MPC8245 combines a PowerPCTM 603e core microprocessor with a PCI bridge. The PCI support on the MPC8245 will allow system designers to rapidly design systems using peripherals already designed for

schottky DIODE MOTOROLA B14

Abstract: MPC8245 AD17
Contextual Info: Advance Information MPC8245EC/D Rev. 0.5, 10/2001 MPC8245 Integrated Processor Hardware Specifications The MPC8245 combines a G2 core processor with a PCI bridge. The PCI support on the MPC8245 will allow system designers to rapidly design systems using peripherals already

Contextual Info: MB86689A 1. Edition 3.0 OVERVIEW The Address Translation Controller ATC comprises the following major components • Input and output data formatters • Content addressable memory array • Output RAM • Microprocessor Interface The physical interaction of these

transistor f151

Abstract: tms 374 biss 0001 je 243 JE 33 p626 PSX128B PSX96B I-CUBE 51P124
Contextual Info: Introduction This manual provides the information needed to configure the PSX Family devices using the JTAG interface. It is intended for users who plan to write their own code to configure the PSX devices. In addition, this manual explains how the boundary scan features implemented in the PSX devices can be used

p181 g8

Abstract: 105 p180 g8 707 p181 g5209 p115 SPARTAN XC2S50 SPARTAN-II xc2s200 pq208 tms 374 transistor be p88 P140
Contextual Info: Spartan-II 2.5V FPGA Family: Pinout Tables R DS001-4 v2.4 April 30, 2001 Preliminary Product Specification Pin Definitions Pin Name Dedicated Pin Direction Description GCK0, GCK1, GCK2, GCK3 No Input Clock input pins that connect to Global Clock Buffers. These pins become

tms 374

Abstract: tms 374 cd 13 BU 2735 AS 182541A
Contextual Info: 182541A & N a t io n a l Semiconductor SCAN182541A Serially Controlled Access Network Non-Inverting Line Driver with 25ft Series Resistor Outputs General Description Features Tha SCAN 182541A is a high performance BiCMOS line driver featuring separate data inputs organized into dual