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Part	ECAD Model	Manufacturer	Description	Download	Buy
SN74BCT8374ADW		Texas Instruments	Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70

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Texas Instruments SN74BCT8374ADW Scan Test Device 0°C to 70°C 24-Pin SOIC Tube
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
Bristol Electronics	SN74BCT8374ADW		1,823			1 - 10 - 100 - 1000 - 10000 -	Get Quote
Vyrian	SN74BCT8374ADW		3,434			1 - 10 - 100 - 1000 - 10000 -	Get Quote
Texas Instruments SN74BCT8374ADWR Scan Test Device
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
Bristol Electronics	SN74BCT8374ADWR		1,823			1 - 10 - 100 - 1000 - 10000 -	Get Quote
Vyrian	SN74BCT8374ADWR		5,549			1 - 10 - 100 - 1000 - 10000 -	Get Quote
Texas Instruments SN74BCT8374ANT 74BCT8374A - Scan Test Devices with Octal D-Type Edge-Triggered Flip-Flops
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
Rochester Electronics	SN74BCT8374ANT		75		1	1 - 10 - 100 - 1000 - 10000 -	Get Quote
Vyrian	SN74BCT8374ANT		6,590			1 - 10 - 100 - 1000 - 10000 -	Get Quote
Others SN74BCT8374DW INSTOCK
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
Chip 1 Exchange	SN74BCT8374DW		75			1 - 10 - 100 - 1000 - 10000 -	Get Quote
Texas Instruments SN74BCT8374ADWRG4 Boundary Scan Bus Driver, BCT/FBT Series, 1-Func, 8-Bit, True Output, BICMOS, PDSO24
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
Vyrian	SN74BCT8374ADWRG4		9,839			1 - 10 - 100 - 1000 - 10000 -	Get Quote

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74BCT8374 Datasheets Context Search

Catalog Datasheet	Type	Document Tags	PDF
74BCT8374 Abstract: D3641 TEX-E wire Contextual Info: SN54BCT8374, 74BCT8374 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS TI0223— 0 3 6 4 1 , JUNE 1990 SN54BCT8374 IT PACKAGE 74BCT8374 . . . DW OR NT PACKAGE Members of Texas Instruments SCOPE Family of Testability Products TOP VIEW	OCR Scan	sn54bct8374 sn74bct8374 ti0223--sn54/74f374 +4sn54/74bct374 74bct8374 d3641 tex-e wire	PDF
bct8374 Abstract: D3641 BSR10 SN74BCT8374 PRPG 74BCT8374 Contextual Info: SN54BCT8374, 74BCT8374 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS TI0223— D3641, JUNE 1990 M em bers o f Texas Instrum ents SCOPE” Family o f Testability P roducts SN54BCT8374 . . . JT PACKAGE 74BCT8374 . . . DW OR NT PACKAGE TOP VIEW	OCR Scan	sn54bct8374 sn74bct8374 ti0223 d3641 +6sn54/74f374 sn54/74bct374 bct8374 bsr10 prpg 74bct8374	PDF
Contextual Info: SN54BCT8374A, 74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBSQ45D - JUNE 1990 - REVISED APRIL 1994 I I I • Members of the Texas Instruments SCOPE Family of Testability Products • Octal Test-Integrated Circuits I I • Functionally Equivalent to SN54/74F374	OCR Scan	sn54bct8374a sn74bct8374a scbsq45d sn54/74f374 +1sn54/74bct374	PDF
TSC500 Abstract: future scope of function generator 74act8990 TS002 abstract and controll circuit TMS320C30 74BCT8244 SPRU031 Signal Path Designer e50p Contextual Info: IEEE 1149.1 Use in Design for Verification and Testability at Texas Instruments by Adam Cron Reprinted with permission of the IEEE. Abstract Texas Instrum ents’ hierarchical testability efforts have pro duced several new products aimed at standardization and cost	OCR Scan	tsc500 sn74bct8244 tms320c3x spru031 +9sgh3001 future scope of function generator 74act8990 ts002 abstract and controll circuit tms320c30 74bct8244 signal path designer e50p	PDF
GDS741S Abstract: SN54BCT8374A SN74BCT8374A SCBS045D-JUNE BI72 74BCT8374 Contextual Info: SN54BCT8374A, 74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS S C B S 0 4 5 D -J U N E 1 9 9 0 - REVISED A P R IL 1 99 4 Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits SN54BCT8374A . . . JT PACKAGE	OCR Scan	sn54bct8374a sn74bct8374a scbs045d-june april1994 +6sn54/74f374 sn54/74bct374 0c174hc1 gds741s bi72 74bct8374	PDF
TSC500 Abstract: TSC700 TGC100 tms0102 motorola catalog Linear Application Book Design Seminar Signal Transmission Digital IC National catalog GE catalog Motorola Bipolar Power Transistor Data Contextual Info: TFXAS In s t r u m e n t s SCOPE Testability Products I I Applications Guide 1990 Semiconductor Group SCOPE™Testability Products Applications Guide Design Automation — Semiconductor Group Texas Instruments Te x a s In s t r u m e n t s IMPORTANT NOTICE	OCR Scan	tsc500 tsc700 tgc100 tms0102 +6motorola catalog linear application book design seminar signal transmission digital ic national catalog ge catalog motorola bipolar power transistor data	PDF