PRPG Search Results

Contextual Info: fc>6 18 wa W23C4096 IVinbond 512K X 8 CMOS MASK ROM GENERAL DESCRIPTION FEATURES Active: lOOmW typ. The W23C4096 is a high speed, low power mask-prpgrammable read-only memory organ­ Standby: 25¿¿W(typ.) ized as 524288X8 bits • Low power consumption:

a1310a

Contextual Info: SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS _ _ SCBS165A-AUGUST 1 9 9 3 - REVISED AUGUST 1994 Members of the Texas Instruments

74ABTH18646A

Contextual Info: SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS166D - AUGUST 1993 - REVISED JULY 1996 Members of the Texas Instruments SCOPE Family of Testability Products One Boundary-Scan Cell Per I/O

BCT8373A

Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

Contextual Info: SN74LVTH18502AĆEP, SN74LVTH182502AĆEP 3.3ĆV ABT SCAN TEST DEVICES WITH 18ĆBIT UNIVERSAL BUS TRANSCEIVERS SCAS744A − DECEMBER 2003 − REVISED JUNE 2004 D Controlled Baseline D D D D D D D D UBT  Universal Bus Transceiver − One Assembly/Test Site, One Fabrication

Contextual Info: SN54ABT8646, SN74ABT8646 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS SCBS123F − AUGUST 1992 − REVISED APRIL 2004 D Members of the Texas Instruments SCOPE  Family of Testability Products D Compatible With the IEEE Standard SN54ABT8646 . . . JT PACKAGE

Contextual Info: CASE FINISH CURRENT AMPS SOLDER WORKING VOLTAGE -5 5 X TO +85T AC MAXIMUM DC RESISTANCE (OHMS) -5S C 10 +12SC DC AC DC 100 3.0 150 MAXIMUM VOLTAGE DROP DC AC .18 16 41 PART MARKING: 5 1 -3 1 1 -3 2 1 SCI DATE CODE •050X.070 Slot (2X) -[1.27X1.77] ò .758 MAX ▼

Contextual Info: CASE FINISH CURRENT AMPS SOLDER 0.5 WORKING VOLTAGE -5 5 X TO +85T AC DC 200 AC DC 125 150 PART MARKING: cn 5 1 -3 1 1 -3 1 5 DATE CODE MAXIMUM VOLTAGE DROP MAXIMUM DC RESISTANCE (OHMS) -5S C 10 +12SC DC AC MINIMUM CAPACITANCE (uF) MIN. INSERTION LOSS PER M IL-STD-220,

BCT245

Abstract: BCT8245A F245 SN54BCT8245A SN74BCT8245A
Contextual Info: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

V5050

Abstract: BCT244 F244 SN54BCT8244A SN74BCT8244A
Contextual Info: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This

LVT18512

Contextual Info: SN54LVT18512, SN54LVT182512, SN74LVT18512, SN74LVT182512 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS711 – OCTOBER 1997 D D D D D D D D D Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

Contextual Info: SN54LVTH18502A, SN54LVTH182502A, SN74LVTH18502A, SN74LVTH182502A 3.3ĆV ABT SCAN TEST DEVICES WITH 18ĆBIT UNIVERSAL BUS TRANSCEIVERS SCBS668C − JULY 1996 − REVISED JUNE 2004 D Members of the Texas Instruments D D D D D D SCOPE  Family of Testability Products

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

Contextual Info: SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS166D – AUGUST 1993 – REVISED JULY 1996 D D D D D D D D Members of the Texas Instruments SCOPE  Family of Testability Products

LVTH18514

Abstract: LVTH182514 SN54LVTH182514 SN54LVTH18514 SN74LVTH182514 SN74LVTH18514 78 hkc
Contextual Info: SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 D D D D D D D D D D Members of the Texas Instruments TI SCOPE  Family of Testability Products

samsung NAND FSR

Abstract: 29cd16 NAND IC s CIRCUIT DIAGRAM OF 15 INCH SAMSUNG MONITOR 264Byte
Contextual Info: KM29N16000 2M x 8 Bit NAND Flash Memory SEMICONDUCTOR PRELIMINARY- June 1994 FEATURES GENERAL DESCRIPTION • Single 5 - volt Supply • Organization - Memory Cell Array : 2M +64K x 8 - Data Register : (258 + 8) x 8 • Automatic Program and Erase - Page Program : (256 + 8)Byte

TTL 7474

Abstract: 7474 for shift register 7474 shift register 7474 texas instruments ABT8245 SN54ABT8245 SN74ABT8245 tms 3534
Contextual Info: SN54ABT8245, SN74ABT8245 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS124A - A UGUS T 1992 - REVI SED AUGUS T 1993 ' Members of the Texas Instruments SCOPE Family of Testability Products 1 Compatible With the IEEE Standard 1149.1-1990 JTAG Test Access Port

SN54ABT18502

Abstract: H TR 1A60 texas instruments 486 TR 1A60
Contextual Info: SN54ABT18502 SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER SCBS109C - AU G U S T 1992 - RE V IS E D AU G U S T 1994 SCOPE Instruction Set - IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ - Parallel-Signature Analysis at Inputs With

KVT 20 Temperature

Abstract: SN54ABTH182504A SN54ABTH18504A SN74ABTH182504A SN74ABTH18504A
Contextual Info: SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS - S C B S 1 6 5 A - AU G U S T 1993 - REVISED AU G U S T 1994 ' Members of the Texas Instruments

Contextual Info: SN54ABT18646 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVERS AND REGISTERS SGBS306 – AUGUST 1992 – REVISED AUGUST 1994 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments Widebus  Family

Contextual Info: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

SN54ABT8652

Abstract: SN74ABT8652
Contextual Info: SN54ABT8652, SN74ABT8652 « SCAN TEST d e v ic e s WITH OCTAL BUS TRANSCEIVERS AND REGISTERS - _ • Members of the Texas Instruments SCOPE Family of Testability Products • Compatible With the IEEE Standard 1149.1-1990 JTAG Test Access Port and

Contextual Info: SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS164E – AUGUST 1993 – REVISED DECEMBER 1996 D D D D D D D D Members of the Texas Instruments SCOPE  Family of Testability Products

bct8240a

Contextual Info: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This