TESTABILITY Search Results

74ABTH18646A

Contextual Info: SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS166D - AUGUST 1993 - REVISED JULY 1996 Members of the Texas Instruments SCOPE Family of Testability Products One Boundary-Scan Cell Per I/O

programmable storage device

Contextual Info: TMS29F816 16 384-BIT SCOPE DIARY JTAG ADDRESSABLE STORAGE DEVICE SMJS816B-NOVEMBER1990-REVISED JANUARY 1993 FM PACKAGEt TOP VIEW * Member of Texas Instruments SCOPE'“ Family of Testability Products * IEEE 1149.1 Serial Test Bus Compatible * Organization . . . 2048 x 8-Bit Flash Memory

BCT8373A

Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

Contextual Info: SN54ABT8646, SN74ABT8646 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS SCBS123F − AUGUST 1992 − REVISED APRIL 2004 D Members of the Texas Instruments SCOPE  Family of Testability Products D Compatible With the IEEE Standard SN54ABT8646 . . . JT PACKAGE

20V8Q

Abstract: SL06 20V8H-15 20V8 GAL20V8 PAL20R8 PALCE20V8 PD3024 pal20v8
Contextual Info: COM'L: H-5/7/10/15/25, Q-10/15/25 IND: H-15/25, Q-20/25 PALCE20V8 Family EE CMOS 24-Pin Universal Programmable Array Logic DISTINCTIVE CHARACTERISTICS ◆ Pin and function compatible with all PAL 20V8 devices ◆ Electrically erasable CMOS technology provides reconfigurable logic and full testability

TLK1201IRCP

Contextual Info: TLK1201RCP, TLK1201IRCP ETHERNET TRANSCEIVERS SLLS506D − AUGUST 2001 − REVISED AUGUST 2004 at 1.25 Gbps D LVPECL Compatible Differential I/O on High D D D D D D D D Advanced 0.25-µm CMOS Technology No External Filter Capacitors Required Comprehensive Suite of Built-In Testability

BCT245

Abstract: BCT8245A F245 SN54BCT8245A SN74BCT8245A
Contextual Info: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

V5050

Abstract: BCT244 F244 SN54BCT8244A SN74BCT8244A
Contextual Info: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This

LVT18512

Contextual Info: SN54LVT18512, SN54LVT182512, SN74LVT18512, SN74LVT182512 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS711 – OCTOBER 1997 D D D D D D D D D Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

Contextual Info: SN54LVTH18502A, SN54LVTH182502A, SN74LVTH18502A, SN74LVTH182502A 3.3ĆV ABT SCAN TEST DEVICES WITH 18ĆBIT UNIVERSAL BUS TRANSCEIVERS SCBS668C − JULY 1996 − REVISED JUNE 2004 D Members of the Texas Instruments D D D D D D SCOPE  Family of Testability Products

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

Contextual Info: SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS166D – AUGUST 1993 – REVISED JULY 1996 D D D D D D D D Members of the Texas Instruments SCOPE  Family of Testability Products

Contextual Info: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

LVTH18514

Abstract: LVTH182514 SN54LVTH182514 SN54LVTH18514 SN74LVTH182514 SN74LVTH18514 78 hkc
Contextual Info: SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 D D D D D D D D D D Members of the Texas Instruments TI SCOPE  Family of Testability Products

TTL 7474

Abstract: 7474 for shift register 7474 shift register 7474 texas instruments ABT8245 SN54ABT8245 SN74ABT8245 tms 3534
Contextual Info: SN54ABT8245, SN74ABT8245 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS124A - A UGUS T 1992 - REVI SED AUGUS T 1993 ' Members of the Texas Instruments SCOPE Family of Testability Products 1 Compatible With the IEEE Standard 1149.1-1990 JTAG Test Access Port

Contextual Info: SN54ABT18646 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVERS AND REGISTERS SGBS306 – AUGUST 1992 – REVISED AUGUST 1994 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments Widebus  Family

PAL32VX10

Contextual Info: COM’L Advanced Micro Devices PAL32VX10/A 24-Pin Versatile with XOR Programmable Array Logic DISTINCTIVE CHARACTERISTICS • Increased logic power ■ Global register asynchronous/synchronous preset/reset ■ Automatic register preset on power up ■ Preloadable output registers for testability

Contextual Info: FINAL COM’L: H-7/10/15/20 IND: H-7/10/15/20 PALCE20RA10 Family AduaM nlccero 24-Pin Asynchronous EE CMOS Programmable Array Logic Devices DISTINCTIVE CHARACTERISTICS • ■ Low pow er at 100 m A Icc ■ TTL-level register preload for testability A s fast as 7.5 ns m axim um propagation delay

Contextual Info: TLK1201ARCP, TLK1201AIRCP ETHERNET TRANSCEIVERS www.ti.com • • • • • • • • • • • • • • • No External Filter Capacitors Required Comprehensive Suite of Built-In Testability IEEE 1149.1 JTAG Support 2.5-V Supply Voltage for Lowest Power

identification trace code texas

Contextual Info: SN54ACT8997, SN74ACT8997 SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP CONCATENATORS SCAS157D – APRIL 1990 – REVISED DECEMBER 1996 D D D D D D D D D Members of the Texas Instruments SCOPE  Family of Testability Products

DIAGRAM pal 005a

Abstract: pal 005a
Contextual Info: Preliminary a COM’L PAL24R10-10 Series Advanced Micro Devices 10 ns 28-pin TTL Programmable Array Logic DISTINCTIVE CHARACTERISTICS • 10 ns m axim um propagation delay Power-up reset for initialization ■ f MAx = 55.5 MHz Register preload for testability

ecl pal 16 macrocells

Abstract: HD b3c
Contextual Info: AmPAL*10H20EG8/AmPAL10020EG8 IMOX-III ECL Programmable Array Logic PRELIMINARY Asynchronous-RESET and PRESET capability Power-up RESET capability PRELOAD for improved testability Special designed-ln test features for full AC and DC testing Platinum-silicide fuses ensure high programming yield,

Contextual Info: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

Contextual Info: SMJ29F816 16 384-BIT SCOPE DIARY JTAG ADDRESSABLE STORAGE DEVICE S G M S 0 5 3-N O V E M B E R 1 99 0-R E V IS E D JA N U A R Y 1993 FG PACKAGEt TOP VIEW * Member of Texas Instruments SCOPE™ Family of Testability Products * IEEE 1149.1 Serial Test Bus Compatible