PALCE20V8 Search Results

20V8Q

Abstract: SL06 20V8H-15 20V8 GAL20V8 PAL20R8 PALCE20V8 PD3024 pal20v8
Contextual Info: COM'L: H-5/7/10/15/25, Q-10/15/25 IND: H-15/25, Q-20/25 PALCE20V8 Family EE CMOS 24-Pin Universal Programmable Array Logic DISTINCTIVE CHARACTERISTICS ◆ Pin and function compatible with all PAL 20V8 devices ◆ Electrically erasable CMOS technology provides reconfigurable logic and full testability

htw 323

Abstract: plji palce programming algorithm
Contextual Info: COM’L: H-5/7/10/15/25, Q-10/15/25 IND: H-15/25. Q-20/25 MIL: H-15/20/25 PALCE20V8 Family EE CMOS 24-Pin Universal Programmable Array Logic Advanced Micro Devices DISTINCTIVE CHARACTERISTICS • Pin, function and fuse-map compatible with all GAL 20V8/AS ■ Electrically erasable CMOS technology pro­

20V8

Abstract: 20L8 PALCE20V8
Contextual Info: 20V8 PALCE20V8 Flash Erasable, Reprogrammable CMOS PAL Device Features • QSOP package available — 10, 15, and 25 ns com’l version • Active pull-up on data input pins • Low power version 20V8L — 55 mA max. commercial (15, 25 ns) — 15, and 25 ns military/industrial versions

GAL20V8

Abstract: PAL20R8 PALCE20V8
Contextual Info: FINAL COM’L: H-5/7/10/15/25, Q-10/15/25 IND: H-15/25, Q-20/25 PALCE20V8 Family EE CMOS 24-Pin Universal Programmable Array Logic DISTINCTIVE CHARACTERISTICS • Pin and function compatible with all GAL ■ ■ ■ ■ ■ ■ Peripheral Component Interconnect PCI

20V8H-7

Abstract: 20V8H-5 20V8H 20V8H-15 gal programming algorithm 20V8Q-10 SG111 20V8Q GAL20V8 PAL20R8
Contextual Info: FINAL COM’L: H-5/7/10/15/25, Q-10/15/25 IND: H-15/25, Q-20/25 Advanced Micro Devices PALCE20V8 Family EE CMOS 24-Pin Universal Programmable Array Logic DISTINCTIVE CHARACTERISTICS • Pin and function compatible with all GAL ■ ■ ■ ■ ■ ■ Peripheral Component Interconnect PCI

Contextual Info: COM’L: H-5 PALCE20V8H-5 EE CMOS 24-Pin Universal Programmable Array Logic Advanced Micro Devices DISTINCTIVE CHARACTERISTICS • Pin, function, and fuse-map compatible with all GAL 20V8/A ■ Programmable enable/disable control ■ Electrically erasable CMOS technology pro­

rom5000

Contextual Info: »FINAL COM’L: Q-10 Advanced Micro Devices PALCE20V8Q-10 EE CMOS 24-Pin Universal Programmable Array Logic DISTINCTIVE CHARACTERISTICS • Pin, function and fuse-map compatible with all GAL 20V8/A ■ Programmable output polarity ■ Programmable enable/disable control

20V8-25

Abstract: 20L8 20V8 PALCE20V8 ULTRA37000TM CG-02
Contextual Info: USE ULTRA37000TM FOR ALL NEW DESIGNS PALCE20V8 Flash-Erasable Reprogrammable CMOS PAL Device Features • QSOP package available — 10, 15, and 25 ns com’l version • Active pull-up on data input pins — 15, and 25 ns military/industrial versions • Low power version 20V8L

pal 007a

Abstract: pal 003a pal 010a Pal programming IS916 PAL 002a GAL20V8 PAL20R8 PALCE20V8
Contextual Info: COM’L: H-10/15/25, Q-15/25 MIL: H-15/20/25 a PALCE20V8 Family Advanced Micro Devices EE CMOS 24-Pin Universal Programmable Array Logic DISTINCTIVE CHARACTERISTICS • Pin, function and fuse-map compatible with all GAL 20V8/AS ■ Electrically erasable CMOS technology

Contextual Info: CYPRESS PALCE20V8 Flash Erasable, Reprogrammable CMOS PAL Device Features • QSOP package available — 10,15, and 25 ns com’l version • Active pull-up on data input pins • Low power version 20V8L — 55 mA max. commercial (15, 25 ns) — 15, and 25 ns military/industrial versions

Q2025H

Abstract: GAL20V8 PAL20R8 PALCE20V8 PAL20L2 programming specification PALCE20v8h gal20v8 amd
Contextual Info: COM’L: H-5/7/10/15/25, Q-10/15/25 IND: H-15/25. Q-20/25 MIL: H-15/20/25 PALCE20V8 Family EE CMOS 24-Pin Universal Programmable Array Logic H Advanced Micro Devices DISTINCTIVE CHARACTERISTICS • Pin, function and fuse-map compatible with all GAL 20V8/AS

20V8

Abstract: 20V88 20L8 PALCE20V8 PALCE20V8-5
Contextual Info: 20v8: Friday, June 3, 1994 Revision: October 17, 1995 PALCE20V8 Flash Erasable, Reprogrammable CMOS PAL D Features D D grammable array logic device. It is impleĆ Ċ Output polarity control mented with the familiar sumĆofĆproduct Low power version 20V8L

CERAMIC LEADLESS CHIP CARRIER

Abstract: PACKAGE CERAMIC LEADLESS CHIP CARRIER LCC PALCE20V8-15JC 20L8 PALCE20V8
Contextual Info: fax id: 6010 ; : ' ''mLSKordtiu. -:V:V:V:V:V:^:- : i i ^ i :^ 3 ; ; ^ »* • M i i m : : M ; M i i i S H H R J ? /^^T5pT7C !0 _ PALCE20V8 Flash Erasable, Reprogrammable CMOS PAL Device Features • Q S O P p ack ag e av a ila b le

20V8

Abstract: PALCE20V8 20L8
Contextual Info: PALCE20V8 Flash Erasable, Reprogrammable CMOS PAL Device • QSOP package available — 10, 15, and 25 ns com’l version Features • Active pull-up on data input pins • Low power version 20V8L — 55 mA max. commercial (15, 25 ns) — 15, and 25 ns military/industrial versions

20v8h

Abstract: 20V8Q
Contextual Info: COM'L: H-5/7/10/15/25, Q-15/25 IND: H-15/25, Q-20/25 PALCE20V8 Family EE CMOS 24-Pin Universal Programmable Array Logic DISTINCTIVE CHARACTERISTICS ◆ Pin and function compatible with all PAL 20V8 devices ◆ Electrically erasable CMOS technology provides reconfigurable logic and full testability

AL3000A

Abstract: EME-6300H PALCE20V8
Contextual Info: Qualification Report November 1995, QTP# 95173, Version 1.0 PALCE20V8 Flash Erasable, Reprogrammable CMOS PAL PAL is a registered trademark of Advanced Micro Devices, Inc. CYPRESS SEMICONDUCTOR PAGE 2 PRODUCT DESCRIPTION (for qualification) Information provided in this document is intended for generic qualification and technically describes the Cypress part

Contextual Info: COM’L: H-10/15/25, Q-15/25 MIL: H-15/20/25 PALCE20V8 Family Advanced Micro Devices EE CMOS 24-Pin Universal Programmable Array Logic DISTINCTIVE CHARACTERISTICS • Pin, function and fuse-map compatible with all GAL 20V8/AS ■ Electrically erasable CMOS technology

20v8q

Abstract: 20V8H-15 20V8 GAL20V8 PAL20R8 PALCE20V8 PAL20V8 PD3024 PALCE20V8H5JC5
Contextual Info: COM'L: H-5/7/10/15/25, Q-10/15/25 IND: H-15/25, Q-20/25 PALCE20V8 Family EE CMOS 24-Pin Universal Programmable Array Logic DISTINCTIVE CHARACTERISTICS ◆ Pin and function compatible with all PAL 20V8 devices ◆ Electrically erasable CMOS technology provides reconfigurable logic and full testability

64 CERAMIC LEADLESS CHIP CARRIER LCC

Abstract: 20V8-5 CERAMIC LEADLESS CHIP CARRIER 20L8 20V8 PALCE20V8 28-PIN
Contextual Info: fax id: 6010 1P AL CE 20 V8 PALCE20V8 Flash Erasable, Reprogrammable CMOS PAL Device Features • QSOP package available — 10, 15, and 25 ns com’l version • Active pull-up on data input pins • Low power version 20V8L — 55 mA max. commercial (15, 25 ns)

20V88

Abstract: 20L8 20V8 PALCE20V8
Contextual Info: fax id: 6010 1P AL CE 20 V8 PALCE20V8 Flash Erasable, Reprogrammable CMOS PAL Device Features • QSOP package available — 10, 15, and 25 ns com’l version • Active pull-up on data input pins • Low power version 20V8L — 55 mA max. commercial (15, 25 ns)

plji

Contextual Info: COM’L: H-5/7/10/15/25, Q-10/15/25 IND: H-15/25. Q-20/25 MIL: H-15/20/25 PALCE20V8 Family EE CMOS 24-Pin Universal Programmable Array Logic Advanced Micro Devices DISTINCTIVE CHARACTERISTICS • Pin, function and fuse-map compatible with all GAL 20V8/AS ■ Electrically erasable CMOS technology pro­

PAL20L2 programming specification

Abstract: 20v8q SL0311 20V8H-5 PALCE20V8
Contextual Info: COM'L: H-5/7/10/15/25, Q-10/15/25 IND: H-15/25, Q-20/25 PALCE20V8 Family EE CMOS 24-Pin Universal Programmable Array Logic DISTINCTIVE CHARACTERISTICS ◆ Pin and function compatible with all PAL 20V8 devices ◆ Electrically erasable CMOS technology provides reconfigurable logic and full testability

Contextual Info: PALCE20V8 9 1 / CYPRESS Features • Active pull-up on data input pins • Low power version 20V8L — 55 mA max. commercial (15,25 ns) — 65 mA max. military/industrial (15,25 ns) • Standard version has low power — 90 mA max. commercial (15,25 ns)

E9320

Contextual Info: COM'L: H-5/7/10/15/25, Q-10/15/25 IND: H-15/25, Q-20/25 PALCE20V8 Family BEYOND PERFORM ANCE EE CMOS 24-Pin Universal Programmable Array Logic DISTINCTIVE CHARACTERISTICS ♦ Pin and function compatible with all PAL 20V8 devices ♦ Electrically erasable CMOS technology provides reconfigurable logic and full testability