0H20EV8 Search Results
0H20EV8 Datasheets Context Search
| Catalog Datasheet | Type | Document Tags | |
|---|---|---|---|
PAL10H20EV8Contextual Info: PALI 0H20EV8-6/PAL10020EV8-6 Advanced Micro Devices ECL Registered Programmable Array Logic DISTINCTIVE CHARACTERISTICS High-performance; tpo “ 6 ns, fjviAX * 125 MHz Eight user-programmable output logic macrocells for registered or combinatorial operation |
OCR Scan |
0h20ev8-6/pal10020ev8-6pal10h20eg8pal10020eg8c-017a+2 | |
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Contextual Info: il Advanced Micro Devices PALI 0H20EV8-6/PAL10020EV8-6 ECL Registered Programmable Array Logic DISTINCTIVE CHARACTERISTICS High-performance; l p o “ 6 ns, f^ A X * 125 MHz Eight user-programmable output logic macrocetls for registered or combinatorial operation |
OCR Scan |
0h20ev8-6/pal10020ev8-6pal10h20eg8pal10020eg806176c-0i7a+2 | |
ecl pal 16 macrocells
Abstract: HD b3c
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OCR Scan |
10h20eg8/ampal10020eg80h20ev8ampal10020ev86176a+4 | |
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Contextual Info: AmPAL*10H20EG8/AmPALI0020EG8 IMOX-III ECL Programmable Array Logic PRELIMINARY • • • • • High-performance tpp = 6 ns, fMAX = 125 MHz Eight user-programmable output logic macrocells for latched or combinatorial operation A registered version of the device is available as |
OCR Scan |
10h20eg8/ampali0020eg80h20ev80020ev86176a+1 | |
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Contextual Info: AmPAL*0H20EV8/AmPALI0020EV8 IMOX-III E C L Program m able Array Logic PR ELIM IN A RY Asynchronous-RESET and PRESET capability Power-up RESET capability PRELOAD for improved testability Special designed-in test features for AC and DC testing Platinum-silicide fuses ensure high programming yield, |
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10h20ev8/ampali0020ev810kh/100k50-ohm24-pin+5 | |
64 CERAMIC LEADLESS CHIP CARRIER LCC
Abstract: PD3024
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OCR Scan |
10h20ev8/ampal10020ev8am-pal10h20eg80020eg86545a+4 | |
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Contextual Info: AmPAL*0H20EV8/AmPAL10020EV8 IMOX-III ECL Programmable Array Logic PRELIMINARY Asynchronous-RESET and PRESET capability Power-up RESET capability PRELOAD for improved testability Special designed-in test features for full AC and DC testing Platinum-silicide fuses ensure high programming yield, |
OCR Scan |
10h20ev8/ampal10020ev8ampal10h20eg8ampal10020eg8o0545a+1 | |
Pal programming
Abstract: CD3024 PD3024 ecl pal 16 macrocells L35H
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OCR Scan |
10h20eg8/ampal10020eg80h20ev8ampal10020ev86176a+7 |