SLC49A Search Results

SCANSTA111

Abstract: STA111
Contextual Info: SCANSTA111 Enhanced SCAN bridge Multidrop Addressable IEEE 1149.1 JTAG Port General Description The SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board

AN-1217

Abstract: DS92LV1210 DS92LV1212 SCAN921025 SCAN921025SLC SCAN921226 SCAN921226SLC SCANSTA111
Contextual Info: ご注意：この日本語データシートは参考資料として提供しており内容が最新でない 場合があります。製品のご検討およびご採用に際しては、必ず最新の英文デー タシートをご確認ください。

VTL 10D2

Contextual Info: OBSOLETE October 24, 2011 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 JTAG and at-speed BIST General Description The SCAN921025 transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The SCAN921226

Contextual Info: SCANSTA111 www.ti.com SNLS060K – AUGUST 2001 – REVISED APRIL 2013 SCANSTA111 Enhanced SCAN Bridge Multidrop Addressable IEEE 1149.1 JTAG Port Check for Samples: SCANSTA111 FEATURES DESCRIPTION • The SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The

taiyo PSR4000

Abstract: Shipping Trays kostat 10 x 10 nitto hc100 Kostat tray PSR4000 aus5 EPAK EPAK TRAY JEDEC Kostat PSR4000 aus5
Contextual Info: Table of Contents Introduction . 2 CHIP SCALE PACKAGES . 2

DS92LV1210

Abstract: DS92LV1212 SCAN921025H SCAN921025HSM SCAN921226H SCAN921226HSM SCANSTA111
Contextual Info: SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 JTAG and at-speed BIST General Description The SCAN921025H transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The

20000108

Abstract: SCAN921023 DS92LV1210 DS92LV1212 SCAN921023SLC SCAN921224 SCAN921224SLC SCANSTA111
Contextual Info: SCAN921023 and SCAN921224 20-66 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 JTAG and at-speed BIST General Description The SCAN921023 transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The

Contextual Info: SCANSTA101 www.ti.com SNLS057J – MAY 2002 – REVISED APRIL 2013 SCANSTA101 Low Voltage IEEE 1149.1 System Test Access STA Master Check for Samples: SCANSTA101 FEATURES DESCRIPTION • The SCANSTA101 is designed to function as a test master for an IEEE 1149.1 boundary scan test

Contextual Info: SCANSTA111 www.ti.com SNLS060K – AUGUST 2001 – REVISED APRIL 2013 SCANSTA111 Enhanced SCAN Bridge Multidrop Addressable IEEE 1149.1 JTAG Port Check for Samples: SCANSTA111 FEATURES DESCRIPTION • The SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The

Contextual Info: SCAN921025H, SCAN921226H www.ti.com SNLS185C – OCTOBER 2004 – REVISED MAY 2013 SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 JTAG and at-speed BIST Check for Samples: SCAN921025H, SCAN921226H FEATURES

Contextual Info: SCANSTA101 SCANSTA101 Low Voltage IEEE 1149.1 System Test Access STA Master Literature Number: SNLS057I SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master General Description Features The SCANSTA101 is designed to function as a test master

Contextual Info: NRND SCAN921025, SCAN921226 www.ti.com SNLS148B – MAY 2004 – REVISED OCTOBER 2011 SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 JTAG and at-speed BIST Check for Samples: SCAN921025, SCAN921226 FEATURES

Contextual Info: SCAN921025H, SCAN921226H www.ti.com SNLS185C – OCTOBER 2004 – REVISED MAY 2013 SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 JTAG and at-speed BIST Check for Samples: SCAN921025H, SCAN921226H FEATURES

SCANSTA101

Abstract: SCANSTA101SM SCANSTA101SMX
Contextual Info: SCANSTA101 Low Voltage IEEE 1149.1 STA Master General Description Features The SCANSTA101 is designed to function as a test master for a IEEE 1149.1 test system. The minimal requirements to create a tester are a microcomputer uP, RAM/ROM, clock, etc. , SCANEASE r2.0 software, and a STA101.

SCANSTA101

Abstract: SCANSTA101SM SCANSTA101SMX
Contextual Info: SCANSTA101 Low Voltage IEEE 1149.1 STA Master General Description Features The SCANSTA101 is designed to function as a test master for a IEEE 1149.1 test system. The minimal requirements to create a tester are a microcomputer uP, RAM/ROM, clock, etc. , SCANEASE r2.0 software, and a STA101.

Contextual Info: SCAN921025H, SCAN921226H www.ti.com SNLS185B – OCTOBER 2004 – REVISED DECEMBER 2005 SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 JTAG and at-speed BIST Check for Samples: SCAN921025H, SCAN921226H FEATURES

Contextual Info: SCAN921023, SCAN921224 www.ti.com SNLS133C – MAY 2004 – REVISED NOVEMBER 2004 SCAN921023 and SCAN921224 20-66 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 JTAG and at-speed BIST Check for Samples: SCAN921023, SCAN921224 FEATURES 1

STA111

Abstract: SCANSTA111
Contextual Info: SCANSTA111 Enhanced SCAN Bridge Multidrop Addressable IEEE 1149.1 JTAG Port • Mode Register0 allows local TAPs to be bypassed, General Description The SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved

Contextual Info: SCAN921025H,SCAN921226H SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 JTAG and at-speed BIST Literature Number: SNLS185B SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

Contextual Info: SCAN921023,SCAN921224 SCAN921023 and SCAN921224 20-66 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 JTAG and at-speed BIST Literature Number: SNLS133C SCAN921023 and SCAN921224 20-66 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

SCANSTA111

Abstract: STA111
Contextual Info: SCANSTA111 Enhanced SCAN bridge Multidrop Addressable IEEE 1149.1 JTAG Port General Description The SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board

SCANSTA111

Abstract: MTD48 STA111 Parking counter
Contextual Info: SCANSTA111 Multidrop Addressable IEEE 1149.1 JTAG Multiplexer Product Brief PASS BITS 2 / TDI TDO TMS TCK TRST TRIST 6 / SLOT ADDRESS INPUTS 7 / BACKPLANE TAP TAP CONTROL STA111 SELECTION CONTROL REGISTERS, TIMING, & CONTROL LOCAL SCAN PORT NETWORK 9 / TDI

SCANSTA101

Abstract: SCANSTA101SM SCANSTA101SMX dual H bridge driver
Contextual Info: SCANSTA101 Low Voltage IEEE 1149.1 STA Master General Description Features The SCANSTA101 is designed to function as a test master for a IEEE 1149.1 test system. The minimal requirements to create a tester are a microcomputer uP, RAM/ROM, clock, etc. , SCANEASE r2.0 software, and a STA101.

SCANSTA101

Abstract: SCANSTA101SM SCANSTA101SMX
Contextual Info: SCANSTA101 Low Voltage IEEE 1149.1 STA Master General Description Features The SCANSTA101 is designed to function as a test master for a IEEE 1149.1 test system. The minimal requirements to create a tester are a microcomputer uP, RAM/ROM, clock, etc. , SCANEASE r2.0 software, and a STA101.