SCANSTA101SMX Search Results
SCANSTA101SMX Result Highlights (1)
| Part | ECAD Model | Manufacturer | Description | Download | Buy |
|---|---|---|---|---|---|
| SCANSTA101SMX/NOPB | Texas Instruments | Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 |
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SCANSTA101SMX Datasheets (5)
| Part | ECAD Model | Manufacturer | Description | Datasheet Type | PDF Size | Page count | |
|---|---|---|---|---|---|---|---|
| SCANSTA101SMX | National Semiconductor | Low Voltage IEEE 1149.1 STA Master | Original | 781.43KB | 32 | ||
| SCANSTA101SMX | National Semiconductor | SCAN Bridge, JTAG Test Port | Original | 386.14KB | 31 | ||
| SCANSTA101SMX | Texas Instruments | SCANSTA101 - Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 | Original | 1.29MB | 39 | ||
| SCANSTA101SMX/NOPB | National Semiconductor | SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master; Package: FBGA; No of Pins: 49; Qty per Container: 2000/Reel | Original | 392.7KB | 32 | ||
| SCANSTA101SMX/NOPB | Texas Instruments | SCANSTA101 - Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 | Original | 1.29MB | 39 |
SCANSTA101SMX Price and Stock
Texas Instruments SCANSTA101SMXLow Voltage STA Master 49-Pin FBGA T/R |
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| Distributors | Part | Package | Stock | Lead Time | Min Order Qty | Price | Buy | ||||
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SCANSTA101SMX | 4,000 | 25 |
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SCANSTA101SMX | 4,000 | 1 |
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National Semiconductor Corporation SCANSTA101SMXLow Voltage STA Master 49-Pin FBGA T/R |
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| Distributors | Part | Package | Stock | Lead Time | Min Order Qty | Price | Buy | ||||
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SCANSTA101SMX | 4,000 | 25 |
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| SCANSTA101SMX | 2,000 | 25 |
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SCANSTA101SMX | 24 |
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SCANSTA101SMX | 6,000 | 1 |
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Texas Instruments SCANSTA101SM/NOPBInterface - Specialized Low Vltg IEEE 1149.1 Sys Test Access A 9 A 926-SCANSTA101SMXNPB |
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| Distributors | Part | Package | Stock | Lead Time | Min Order Qty | Price | Buy | ||||
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SCANSTA101SM/NOPB |
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Texas Instruments SCANSTA101SMX/NOPBInterface - Specialized Low voltage IEEE 114 9.1 system test acc A 926-ANSTA101SM/NOPB |
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| Distributors | Part | Package | Stock | Lead Time | Min Order Qty | Price | Buy | ||||
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SCANSTA101SMX/NOPB |
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SCANSTA101SMX/NOPB | 145 | 1 |
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SCANSTA101SMX/NOPB | 116 |
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SCANSTA101SMX Datasheets Context Search
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Contextual Info: SCANSTA101 www.ti.com SNLS057J – MAY 2002 – REVISED APRIL 2013 SCANSTA101 Low Voltage IEEE 1149.1 System Test Access STA Master Check for Samples: SCANSTA101 FEATURES DESCRIPTION • The SCANSTA101 is designed to function as a test master for an IEEE 1149.1 boundary scan test |
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Contextual Info: SCANSTA101 SCANSTA101 Low Voltage IEEE 1149.1 System Test Access STA Master Literature Number: SNLS057I SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master General Description Features The SCANSTA101 is designed to function as a test master |
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scansta101snls057iscanpsc100 | |
SCANSTA101
Abstract: SCANSTA101SM SCANSTA101SMX
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scansta101sta101scanpsc100scansta101sm+1 | |
SCANSTA101
Abstract: SCANSTA101SM SCANSTA101SMX
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scansta101sta101scanpsc100scansta101sm+1 | |
SCANSTA101
Abstract: SCANSTA101SM SCANSTA101SMX dual H bridge driver
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scansta101sta101scanpsc100scansta101sm+2 | |
SCANSTA101
Abstract: SCANSTA101SM SCANSTA101SMX
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scansta101sta101scanpsc100csp-9-111c2+3 | |
SCANSTA101
Abstract: SCANSTA101SM SCANSTA101SMX
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scansta101sta101scanpsc100scansta101sm+1 | |
SCANSTA101
Abstract: SCANSTA101SM SCANSTA101SMX
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scansta101scanpsc100scansta101smscansta101smx | |
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Contextual Info: SCANSTA101 www.ti.com SNLS057J – MAY 2002 – REVISED APRIL 2013 SCANSTA101 Low Voltage IEEE 1149.1 System Test Access STA Master Check for Samples: SCANSTA101 FEATURES DESCRIPTION • The SCANSTA101 is designed to function as a test master for an IEEE 1149.1 boundary scan test |
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scansta101snls057j16-bit32-bit | |
ppi interface
Abstract: SCANSTA101 SCANSTA101SM SCANSTA101SMX
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scansta101scanpsc100ppi interfacescansta101sm+1 | |
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Contextual Info: SC A N S TA 101 SCANSTA101 Low Voltage IEEE 1149.1 System Test Access STA Master Te x a s In s t r u m e n t s Literature Number: SNLS057I t) a l SCANSTA101 Sem iconductor Low Voltage IEEE 1149.1 System Test Access (STA) Master General Description Features |
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scansta101snls057iscanpsc100 | |
BGA package tray 40 x 40
Abstract: NATIONAL SEMICONDUCTOR MARKING CODE
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scansta101sta101scanpsc10032-bit+3 | |
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Contextual Info: SCANSTA101 www.ti.com SNLS057I – MAY 2004 – REVISED JUNE 2010 SCANSTA101 Low Voltage IEEE 1149.1 System Test Access STA Master Check for Samples: SCANSTA101 FEATURES 1 • 23 • • • • • Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture |
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scansta101snls057i16-bit32-bit | |
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Contextual Info: SCANSTA101 Low Voltage IEEE 1149.1 STA Master General Description Features The SCANSTA101 is designed to function as a test master for a IEEE 1149.1 test system. The minimal requirements to create a tester are a microcomputer uP, RAM/ROM, clock, etc. , SCANEASE r2.0 software, and a STA101. |
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scansta101sta101scanpsc100 |