SEC450 Search Results
SEC450 Datasheets (2)
| Part | ECAD Model | Manufacturer | Description | Datasheet Type | PDF Size | Page count | |
|---|---|---|---|---|---|---|---|
| SEC4501C | Sanken Electric | Devices for Automotive Application | Original | 2.59MB | 152 | ||
| SEC4503C | Sanken Electric | Devices for Automotive Application | Original | 2.59MB | 152 |
SEC450 Datasheets Context Search
| Catalog Datasheet | Type | Document Tags | |
|---|---|---|---|
teradyne A360Contextual Info: Reliability Summary of SEC450 GaAs:Si IRED Chip Long-Term Operating Life Study Figure 1 IRED CHIP DEGRADATION STUDIES Honeywell is engaged in an ongoing study of degradation of radiant output over time as a function of temperature for the SEC450 GaAs IRED gallium |
OCR Scan |
sec450sep8505sep8506sep8507+1 | |
SEC4203C
Abstract: SEC4403C SEC4503C SEC4703C SEC4803C SEC4903C SEC-400
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Original |
sec4003sec4203csec4803csec4903c+6 | |
SEC4701C
Abstract: SEC4201C SEC4401C SEC4401E-TG SEC4501C SEC4801C SEC4901C
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sec4001sec4901csec4701csec4401c+7 | |
teradyne A360
Abstract: IRED A360 SE1450 SE2460 SE3450 SE5450 SEP8505 SEP8506 SE1455
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sec450se1450/1455se3450/5450sep8505+10 | |
teradyne A360Contextual Info: Reliability Reliability Summary of SEC450 GaAs:Si IRED Chip Long-Term Operating Life Study Figure 1 IRED CHIP DEGRADATION STUDIES Honeywell is engaged In an ongoing study of degradation of radiant output over time as a function of temperature for the SEC450 GaAs IRED gallium |
OCR Scan |
sec450se1450se1470se3453/5453+6 | |
SMA2409M
Abstract: MN638S SSD103 SPF3004 sta464c spf0001 spf7211 relay Re 04501 sta509a SLA2402M
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Original |
5871faxh1-c01je0-0605010tasma2409mmn638s+8 | |
SK 18752
Abstract: SK 18751 2SC5586 SI-18752 fn651 709332a CTB-34D SLA6102 SLA4052 SI 18751
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o03ed0dete7837h1-o03ed0-0805020nmsk 18752+9 | |
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Contextual Info: Reliability Summary of SEC555 AIGaAsrSi IRED Chip Long-Term Operating Life Study IRED CHIP DEGRADATION STUDIES MECHANICAL RELIABILITY Honeywell has an ongoing study ot degradation of radiant output over time as a function of temperature and current for the SEC555 aluminum gallium arsenide |
OCR Scan |
sec555se3470 | |
triac zd 607
Abstract: transistor C5586 bridge rectifier sanken rb40 rb40 bridge rectifier rb60 bridge rectifier ZD 607 - triac CTPG2F CTX12S Toshiba transistor c4468 STA524A
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the32-246622h1-o03ea0-0510020nmtriac zd 607transistor c5586+8 | |
HONEYWELL OPTOELECTRONICS
Abstract: HFE4023 "se-3352" teradyne A360 HFE4003 C616C HFE4000 sidelooker DIODE HFE4020 se3352
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sec589mil-q-9858hfe4023hlc3001+9 | |
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Contextual Info: 5-1 Visible Light LEDs Absolute Maximum Ratings ●Visible Light Unicolor Lamp Parameter Unit PD IF ∆IF IFP VR Top Tstg mW mA mA/°C mA V °C °C Ratings GaP GaAsP GaAlAs AlGaInP InGaN Conditions GaN 120 75 30 −0.45 100 25°C or higher f=1kHz, tw ≤100 µ s |
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HFE4023Contextual Info: Application Note Long-Term Power Output Reliability of Cap Rock SEC589 LED Chip ABSTRACT Honeywell Optoelectronics is conducting an ongoing study of degradation of radiant output over time as a function of temperature and current for the SEC589 "CAP ROCK” fiber optic, light emitting diode (LED) chip. This |
OCR Scan |
sec589mil-q-9858hfe4023hlc3001 | |
SK 18752
Abstract: 2SC5586 SK 18751 sla6101 sk c4467 STR20012 SLA6102 sk A1186 SK C5071 fn651
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Original |
tf320mtf341mtf320m-atf321m-a+15 | |
SMA2409M
Abstract: spf 9001 sanken mn638s SPF0001 SPF3004 SPF3006 relay Re 04501 Ignition ICs SPF7211 ssd103
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h1-c01ed0-0607020tasma2409mspf 9001 sankenmn638s+7 | |
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