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    teradyne A360

    Contextual Info: Reliability Summary of SEC450 GaAs:Si IRED Chip Long-Term Operating Life Study Figure 1 IRED CHIP DEGRADATION STUDIES Honeywell is engaged in an ongoing study of degradation of radiant output over time as a function of temperature for the SEC450 GaAs IRED gallium


    OCR Scan     		sec450sep8505sep8506sep8507+1teradyne a360 PDF

    teradyne A360

    Abstract: IRED A360 SE1450 SE2460 SE3450 SE5450 SEP8505 SEP8506 SE1455
    Contextual Info: Reliability Summary of SEC450 GaAs:Si IRED Chip Long-Term Operating Life Study INTRODUCTION Honeywell is committed to the manufacture of reliable, high quality optoelectronic products. An ISO 9001 quality system is maintained, providing the necessary controls to assure that all product meets or exceeds the


    Original     		sec450se1450/1455se3450/5450sep8505+10sep8506sep8507teradyne a360ireda360se1450se2460se3450se5450se1455 PDF

    teradyne A360

    Contextual Info: Reliability Reliability Summary of SEC450 GaAs:Si IRED Chip Long-Term Operating Life Study Figure 1 IRED CHIP DEGRADATION STUDIES Honeywell is engaged In an ongoing study of degradation of radiant output over time as a function of temperature for the SEC450 GaAs IRED gallium


    OCR Scan     		sec450se1450se1470se3453/5453+6se3455/5455se34705470sep8505sep8705sep8506teradyne a360 PDF