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    RELIABILITY TEST METHODS FOR PACKAGED DEVICES Search Results

    RELIABILITY TEST METHODS FOR PACKAGED DEVICES Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    EP1800ILC-70
    Rochester Electronics LLC EP1800 - Classic Family EPLD PDF Buy
    EP1800GM-75/B
    Rochester Electronics LLC EP1800 - Classic Family EPLD PDF Buy
    EP1810GC-35
    Rochester Electronics LLC EP1810 - Classic Family EPLD, Logic, 900 Gates, 48 Macrocells, 35ns, Commercial PDF Buy
    EP910DI-35
    Rochester Electronics LLC EP910 - Classic Family EPLD, Logic,450 Gates,24 Macrocells PDF Buy
    EP610DI-30
    Rochester Electronics LLC EP610 - Classic Family EPLD, Logic,300 Gates,16 Macrocells PDF Buy

    RELIABILITY TEST METHODS FOR PACKAGED DEVICES Datasheets Context Search

    Catalog Datasheet Type Document Tags PDF

    Contextual Info: Known Good Die: The Challenge of the Technology M ark Lippold and Sherburne Bridges National Semiconductor, Inc. South Portland, M aine Abstract The challenges of supplying high yield, high quality, cost effective Known Good Die KGD are discussed in detail. A review of the history behind die supply processing and technology drivers provide insight into the


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    3SF11

    Abstract: CA95323 E64380
    Contextual Info: SHARP OPTO-ELECTRONIC DEVICES DIVISION ELECTRONIC COMPONENTS GROUP SHARP CORPORATION SPECIFICATION f DEVICE SPECIFICATION FOR PHOTOTRIAC COUPLER MODEL No. 3SF11 Business dealing name o PC3SF11NTZBF PC3SF11YTZBF Specified for Enclosed please find copies of the Specifications which consists of 14 pages including cover.


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    3SF11 PC3SF11NTZBF PC3SF11YTZBF ED-04P101 PC3SF11NT2BF 3SF11 CA95323 E64380 PDF

    Contextual Info: SHARP OPTO-ELECTRONIC DEVICES DIVISION ELECTRO N IC COM PONENTS GROUP SHARP CORPORATION SPECIFICATION D EV ICE SPECIFICATION FO R PHOTOCOUPLER M O D EL No. PC815 Business dealing name PC815XJ0000F PC815XYJ000F Specified for Enclosed please find copies o f the Specifications which consists o f 14 pages including cover.


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    PC815 PC815XJ0000F PC815XYJ000F 171mm PC815XYJOOOF) PDF

    schematic WELDER

    Abstract: gold melting furnace ultrasonic bond
    Contextual Info: Bonding and Handling Procedures for Chip Devices DISCUSSION Chip diode devices for use in integrated circuit and hybrid integrated circuits have proliferated in the last few years. Today's circuit designer is faced with a multiplicity of alter­ natives in the selection of diodes and packaging with each


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    OT-23 schematic WELDER gold melting furnace ultrasonic bond PDF

    Contextual Info: PR33MA11NTZF PR33MA11NTZF IT rms ≤0.3A, Non-Zero Cross type DIP 6pin SSD •Description ■Agency approvals/Compliance PR33MA11NTZF Solid State Device (SSD) are an integration of an infrared emitting diode (IRED), a Phototriac Detector. These devices are ideally suited for controlling high


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    PR33MA11NTZF PR33MA11NTZF OP13017EN PDF

    Contextual Info: PR33MA11NTZF PR33MA11NTZF IT rms ≤0.3A, Non-Zero Cross type DIP 6pin SSR •Description ■Agency approvals/Compliance PR33MA11NTZF Solid State Relays (SSR) are an integration of an infrared emitting diode (IRED), a Phototriac Detector. These devices are ideally suited for controlling high


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    PR33MA11NTZF PR33MA11NTZF OP13017EN PDF

    eiaj-c3

    Abstract: GA1A1S201WP ED-06G070
    Contextual Info: SPEC. No. ED-06G070 ISSUE October 12,2006 SHARP OPTO-ANALOG DEVICES DIVISION ELECTRONIC COMPONENTS GROUP SHARP CORPORATION SPECIFICATION “ DEVICE SPECIFICATION FOR OPIC LIGHT DETECTOR MODEL No. GA1A1S201WP Specified for Enclosed please find copies of the Specifications which consists of 14 pages including cover.


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    ED-06G070 GA1A1S201WP 5to30Â eiaj-c3 GA1A1S201WP PDF

    reliability data analysis

    Contextual Info: 1 GENERAL INFORMATION Reliability INTRODUCTION Vantis’ and AMD’s Qualification Maintenance Program QMP is used to measure the reliability of all process technologies on a regular basis. This is an extensive effort that is aimed at providing generic fab process coverage for all fab process technologies. Typically about 30,000 devices per


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    MIL-STD-883 Method 2010

    Contextual Info: DICE PRODUCTS INTRODUCTION Linear Technology Corporation LTC offers a wide variety of precision linear ICs in die form. It is our intent to offer dice electrically tested to levels which can be expected to yield the best possible performance in hybrid circuits.


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    MIL-STD-883 Method 2010

    Contextual Info: DICE PRODUCTS INTRODUCTION Linear Technology Corporation LTC offers a wide variety of precision linear ICs in die form. It is our intent to offer dice electrically tested to levels which can be expected to yield the best possible performance in hybrid circuits.


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    MIL-STD-883 Method 2010

    Contextual Info: DICE PRODUCTS INTRODUCTION Linear Technology Corporation LTC offers a wide variety of precision linear ICs in die form. It is our intent to offer dice electrically tested to levels which can be expected to yield the best possible performance in hybrid circuits.


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    PC123Y82FZ0F

    Abstract: PC123Y92FZ0F PC123Y12FZ0F PC123Y22FZ0F pc123y22 PC123Y82 PC123Y52FZ0F pc123y52 PC123 VDE PC123 pin out
    Contextual Info: I S H A R P I' jfU. SPEC. No. ED-04P126A p. ’:U ; .‘ '>>' J'V/ ^ " fP JSSUE -November24,200| OPTO-ELECTRONTC DEVICES DIVISION ELECTR O N IC CO M PO N EN TS GROUP SH A RP CORPORATION SPECIFICATION DEV ICE SPECIFICATION FO R PHOTOCOUPLER M O D EL No. PC123


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    PC123Y12FZ0F PC123Y22FZ0F PC123Y52FZ0F PC123Y82FZ0F PC123Y92FZ0F PC123Y82FZ0F PC123Y92FZ0F PC123Y12FZ0F PC123Y22FZ0F pc123y22 PC123Y82 PC123Y52FZ0F pc123y52 PC123 VDE PC123 pin out PDF

    Contextual Info: Analog Devices Welcomes Hittite Microwave Corporation NO CONTENT ON THE ATTACHED DOCUMENT HAS CHANGED www.analog.com www.hittite.com THIS PAGE INTENTIONALLY LEFT BLANK Standard & Custom Products, DC to 110 GHz! Analog, Digital & Mixed-Signal ICs, Modules, Subsystems & Instrumentation


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    AS9100 MIL-PRF-38534-K MIL-PRF-38535-S PDF

    Contextual Info: Analog Devices Welcomes Hittite Microwave Corporation NO CONTENT ON THE ATTACHED DOCUMENT HAS CHANGED www.analog.com www.hittite.com THIS PAGE INTENTIONALLY LEFT BLANK Space Qualified Processes, People & Facilities! Analog, Digital & Mixed-Signal ICs, Modules, Subsystems & Instrumentation


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    AS9100 PDF

    S2083

    Abstract: JESD22-A113 J-STD-033 S2080
    Contextual Info: Application Note S2080 Moisture Effects on the Soldering of Plastic Encapsulated Devices Introduction Improper packaging, storage, and handling of plastic encapsulated devices PED’s can trap moisture within the devices and lead to damage during reflow soldering


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    S2080 S2083 JESD22-A113 J-STD-033 S2080 PDF

    JEP140

    Abstract: AN-400 JESD22-A102 JESD22-A103 JESD22-A108 JESD22-A110 JESD22-A113 JESD22-B100 JESD22-B102 JESD22-B105
    Contextual Info: AN-400 April 2008 Surface Mount Plastic Packages for High Reliability Applications Applications Note Introduction Holt Integrated Circuits specializes in the design and manufacture of components for military and aerospace applications. Traditionally the aerospace industry has specified the


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    AN-400 JEP140 AN-400 JESD22-A102 JESD22-A103 JESD22-A108 JESD22-A110 JESD22-A113 JESD22-B100 JESD22-B102 JESD22-B105 PDF

    x band diode detector waveguide

    Abstract: CME7660-000 DIODE RL 207 8E08 detector doppler ka CDB7619-000 CDC7630-000 RF 207 Silicon Detector Diodes Alpha Industries
    Contextual Info: Silicon Schottky Barrier Detector Diodes Features 3 Both P–Type and N–Type Low Barrier Silicon Available Low 1/f Noise Bonded Junctions for Reliability Planar Passivated Beam–Lead and Chip Construction See Also Zero Bias Silicon Schottky Barrier Detector Diodes


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    CDB7619-000

    Abstract: CDE7618-000 Silicon Detector Diodes
    Contextual Info: EBA lpha Silicon Schottky Barrier Detector Diodes Features Both P-Type and N-Type Low Barrier Silicon Available Low 1/f Noise Bonded Junctions for Reliability Planar Passivated Beam-Lead and Chip Construction See Also Zero Bias Silicon Schottky Barrier Detector Diodes


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    2N7119

    Abstract: 2N7122 2N7121 2N6967 2N7243 2N724 2N6966 2N7123 JANTX LTPD FOR LOT AND SCREENING DEVICES 2N7242
    Contextual Info: HARRIS SEMICOND SECTOR SbE T> • 430EE71 QÜ42235 ‘ìbb H H A S Military Power Products MOSFETs M ilitary Pow er Products Military and aerospace requirements for high—reliability solid-state devices are extremely large and diverse, not only in terms of performance, operating conditions, and


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    430EE71 QG42235 TC5-204AA 2N7120 T0-204AA 2N7121 2N7122 2N7123 2N7119 2N6967 2N7243 2N724 2N6966 JANTX LTPD FOR LOT AND SCREENING DEVICES 2N7242 PDF

    ultrasonic bond

    Abstract: schematic WELDER Gunn Diode schematic WELDER capacitor M541 varactor beam lead thermal conductive teflon mesa similar
    Contextual Info: Application Note M an A M P com pany Bonding and Handling Procedures for Chip Diode Devices M541 V 2.00 Discussion Microstrip Packages and Chip Carriers Chip diode devices for use in integrated circuit and hybrid integrated circuits have proliferated in the last


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    nitto UV tape

    Abstract: 54AC245 74ACT04 LM108 COB CHIP ON BOARD
    Contextual Info: Technology for the Die Community Die Products Line Card 1999/2000 N Products and Technology for the Die Community As system designers search for ways to derive higher performance and reduced power consumption from smaller form factor integrated circuits ICs , they are turning to


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    ip olivetti cd

    Abstract: GL100MD1MP1 GL100MD1
    Contextual Info: SPEC. No. ED-02157 ISSUE June 21,2002 SH A R P OPTO-ELECTRONIC DEVICES DIVISION ELECTRONIC COMPONENTS GROUP SHARP CORPORATION SPECIFICATION i " DEVICE SPECIFICATION FOR INFRARED EMITTING DIODE MODEL No. Specified for GL100MD1MP1 Olivetti Enclosed please find copies o f the Specifications which consists o f 14 pages including cover.


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    ED-02157 GL100MD1MP1 ip olivetti cd GL100MD1 PDF

    Contextual Info: Packaged PIN Diodes RoHS Compliant Rev V.7 Maximum Power Dissipation Features ♦ ♦ ♦ ♦ ♦ ♦ ♦ High Power Fast Speed Voltage Ratings to 1500 Volts Wide Selection of Carrier Lifetimes Wide Selection of Capacitances Assortment of Packages Styles Available Screened for Military Applications


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    250mW PDF

    MA4P504

    Contextual Info: Packaged PIN Diodes RoHS Compliant Rev V.6 Maximum Power Dissipation Features ♦ ♦ ♦ ♦ ♦ ♦ ♦ High Power Fast Speed Voltage Ratings to 1500 Volts Wide Selection of Carrier Lifetimes Wide Selection of Capacitances Assortment of Packages Styles Available Screened for Military Applications


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    250mW MA4P504 PDF