MTTF ANALYSIS DATA Search Results

WO7430

Abstract: 13KHZ 25KHZ ANTIFUSE
Contextual Info: Standard Products Reliability Analysis of Programmed UTMC PROMs following Post-Program Conditioning July 1998 Summary—Life test data were obtained on the UTMC Microelectronic Systems 64K and 256KBit programmable read-only memories PROMs following post-program conditioning (PPC). PPC is used to enhance the reliability

Coffin-Manson Equation

Contextual Info: "Reliability and MTBF Overview" Prepared by Scott Speaks Vicor Reliability Engineering Introduction Reliability is defined as the probability that a device will perform its required function under stated conditions for a specific period of time. Predicting with some degree of

JESD22-B101

Abstract: MTTF analysis data
Contextual Info: 10/2/2006 RELIABILITY REPORT FOR DS3050W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

MTTF analysis data

Abstract: JESD22-B101
Contextual Info: 10/2/2006 RELIABILITY REPORT FOR DS3030W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

5 mm White LED

Abstract: Luxeon lens Luxeon RD25 110C 245C Philips led light 1998 RD-25 Luxeon Emitter Assembly Information silicon submount mttf water distribution
Contextual Info: Reliability Datasheet RD25 LUXEON Reliability Introduction LUXEON® Power Light Sources represent a revolutionary advance over conventional small signal LED light sources. This application note summa rizes the reliability performance of the LUXEON family. The application note

JESD22-B101

Abstract: ML2020R
Contextual Info: 10/2/2006 RELIABILITY REPORT FOR DS3070W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

JESD22-B117

Contextual Info: 10/2/2006 RELIABILITY REPORT FOR DS3065W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

JESD22-B101

Contextual Info: 10/2/2006 RELIABILITY REPORT FOR DS2070W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

JESD22-B101

Abstract: 211624 DS1310
Contextual Info: 10/2/2006 RELIABILITY REPORT FOR DS3045W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

78,79 series ics

Abstract: NME0305D NME0309D NME0312D N*1205
Contextual Info: NME SERIES Isolated 1W Single Output features Single Isolated Output 1kVDC Isolation Pin Compatible with LME & NML SIP & DIP Package Styles Efficiency to 75% Power Density 1.45W/cm3 3.3V, 5V, 12V, 24V & 48V Input 2 - NME SERIES 3.3V, 5V, 9V, 12V and 15V Output

ph9a

Abstract: Ablebond 71-1 60-circuit
Contextual Info:  PH9 Reliability Application Note # 51 - Rev. A MWTC MARKETING March 1997 1.0. Introduction This application note provides a summary of reliability and environmental testing performed to date on 0.25 µm gate length PHEMT processes PH9A and PH9B at HP-MWTC. The

Nitto GE 100

Abstract: nitto GE J-STD-020 NITTO GE-100 GE-100L
Contextual Info: 10/25/2006 RELIABILITY REPORT FOR DS33R41, Rev A1 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

Z5 1512

Contextual Info: Document Number: MMG3014NT1 Rev. 4, 8/2014 Freescale Semiconductor Technical Data Heterojunction Bipolar Transistor Technology InGaP HBT MMG3014NT1 Broadband High Linearity Amplifier The MMG3014NT1 is a general purpose amplifier that is internally input

PWR1546A

Abstract: murata process 300 watts amplifier circuit diagram pwr1546ac
Contextual Info: PWR1546AC 5 Watts Regulated DC/DC Converters FEATURES 1mVp-p MAXIMUM OUTPUT NOISE 5W RATED OUTPUT POWER SHORT-CIRCUIT PROTECTION SIX-SIDED SHIELDING INTERNAL INPUT AND OUTPUT FILTERING FULLY REGULATED APPLICATIONS HIGH RESOLUTION DATA ACQUISTION PRECISION TEST EQUIPMENT

NMS1215

Abstract: NMS12
Contextual Info: NMS SERIES 6kVDC Isolated 2W Dual Output features BS EN 60950 Certified 6kVDC Isolation Dual Output Low Profile Package Efficiency to 80% Power Density 0.65W/cm3 5V & 12V Input 2 - NMS SERIES 5V, 9V, 12V and 15V Output Footprint 4.75 cm2 UL 94V-0 Package Material

NMH0505 application

Abstract: NMH0515 NMH 80 NMH0512
Contextual Info: NMH SERIES Isolated 2W Dual Output features Full 2 Watt Output Power Pin Compatible with NMA 1kVDC Isolation Dual Outputs SIP & DIP package Styles Efficiency to 80% Power Density 1.42W/cm3 2 - NMH SERIES 5V, 12V, 24V & 48V Input 5V, 9V, 12V, and 15V Output

JESD22-A113

Abstract: JEDEC JESD22-B117 JESD22A-113 ML2020R JESD22-B107 JESD22-B100
Contextual Info: 7/22/2005 RELIABILITY REPORT FOR DS2065W, Rev A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

Contextual Info: NMS SERIES 6kVDC Isolated 2W Dual Output features p BS EN 60950 Certified p 6kVDC Isolation p Dual Output p Low Profile Package p Efficiency to 80% p Power Density 0.65W/cm3 p 5V & 12V Input p Footprint 4.75 cm2 p UL 94V-0 Package Material p No Heatsink Required

JESD22-B107

Abstract: JEDEC JESD22-B117 JESD22-B101 JESD22-A113 JESD22-B117 JESD22A-113
Contextual Info: 7/20/2005 RELIABILITY REPORT FOR DS2030AB & Y, Rev A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

JESD22-B107

Abstract: JESD22-B101 JESD22-A113 JESD22-B100 JEDEC JESD22-B117 PHYSICAL DIMENSIONS JESD22-B100 JESD-22-A113
Contextual Info: 7/22/2005 RELIABILITY REPORT FOR DS2050W, Rev A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

Jesd22-A113

Abstract: JEDEC JESD22-B117 PHYSICAL DIMENSIONS JESD22-B100 JESD22-B107
Contextual Info: 7/20/2005 RELIABILITY REPORT FOR DS2045AB & Y, Rev A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

JESD22-B117

Abstract: JEDEC JESD22-B117 JESD22-B101 JESD22-A113 ML614R
Contextual Info: 7/28/2005 RELIABILITY REPORT FOR DS2030L, Rev A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

JEDEC JESD22-B117

Abstract: JESD22-B107 JESD22-B101 JESD22-A113
Contextual Info: 7/28/2005 RELIABILITY REPORT FOR DS2045L, Rev A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

receiving inspection procedure

Contextual Info: QUALITY SYSTEM QUALITY AND RELIABILITY F-om management to manufacturing, quality is the top priority at Fox. Processes are constantly monitored to ensure Fox products adhere to each specification. Quality products result from a combination of the following: