JESD22-B101
Abstract: MTTF analysis data
Contextual Info: 10/2/2006 RELIABILITY REPORT FOR DS3050W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
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MTTF analysis data
Abstract: JESD22-B101
Contextual Info: 10/2/2006 RELIABILITY REPORT FOR DS3030W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
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JESD22-B107
Abstract: JEDEC JESD22-B117 JESD22-B101 JESD22-A113 JESD22-B117 JESD22A-113
Contextual Info: 7/20/2005 RELIABILITY REPORT FOR DS2030AB & Y, Rev A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
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JESD22-B107
Abstract: JESD22-B101 JESD22-A113 JESD22-B100 JEDEC JESD22-B117 PHYSICAL DIMENSIONS JESD22-B100 JESD-22-A113
Contextual Info: 7/22/2005 RELIABILITY REPORT FOR DS2050W, Rev A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
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JESD22-B101
Abstract: ML2020R
Contextual Info: 10/2/2006 RELIABILITY REPORT FOR DS3070W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
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Jesd22-A113
Abstract: JEDEC JESD22-B117 PHYSICAL DIMENSIONS JESD22-B100 JESD22-B107
Contextual Info: 7/20/2005 RELIABILITY REPORT FOR DS2045AB & Y, Rev A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
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ds2045abjesd22-b101jesd22-a11360c/90+3jedec jesd22-b117physical dimensions jesd22-b100jesd22-b107
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JESD22-B117
Contextual Info: 10/2/2006 RELIABILITY REPORT FOR DS3065W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
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JESD22-B101
Contextual Info: 10/2/2006 RELIABILITY REPORT FOR DS2070W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
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JESD22-B101
Abstract: 211624 DS1310
Contextual Info: 10/2/2006 RELIABILITY REPORT FOR DS3045W, Rev A, RoHS Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
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JESD22-B101
Abstract: PHYSICAL DIMENSIONS JESD22-B100 JESD22-A113 JESD22-B107 ML2020R
Contextual Info: 7/26/2005 RELIABILITY REPORT FOR DS2045W, Rev A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
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JESD22-A113
Abstract: JEDEC JESD22-B117 JESD22A-113 ML2020R JESD22-B107 JESD22-B100
Contextual Info: 7/22/2005 RELIABILITY REPORT FOR DS2065W, Rev A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
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JESD22-B101
Abstract: ML2020R JESD22-A113 JEDEC JESD22-B117 JESD22-B117
Contextual Info: 7/25/2005 RELIABILITY REPORT FOR DS2030W, Rev A Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
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BR2032
Abstract: DS1225Y DS1220AB DS1220AD DS1220Y DS1225AB DS1225AD DS1230AB DS1230W DS1270W
Contextual Info: Maxim > App Notes > GENERAL ENGINEERING TOPICS MISCELLANEOUS CIRCUITS STORAGE PRODUCTS Keywords: lithium, SRAM, data retention Sep 11, 2008 APPLICATION NOTE 4289 Low-Temperature Data Retention in Nonvolatile SRAM Abstract: This article dispels any concerns about battery performance at low-temperatures. The article details
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rechargeable coin battery
Abstract: AN3954 BR1225 DS2030AB DS2030W DS2030Y DS2045AB DS2045W DS2045Y DS2050W
Contextual Info: Maxim > App Notes > GENERAL ENGINEERING TOPICS MISCELLANEOUS CIRCUITS Keywords: ML, rechargeable lithium, secondary batteries, single-piece modules, SPM Dec 21, 2006 APPLICATION NOTE 3954 Characteristics of Manganese Lithium ML Batteries Abstract: This study of Manganese Lithium (ML) batteries provides some of the basic electrical characteristics
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