Part Number
    Please enter a valid full or partial manufacturer part number with a minimum of 3 letters or numbers

    HAMMING Search Results

    HAMMING Datasheets Context Search

    Catalog Datasheet Type Document Tags PDF

    E160

    Abstract: E193 MC10193 SY100E193 SY10E193
    Contextual Info: Micrel, Inc. SY10E193 SY100E193 SY10E193 ERROR DETECTION/ CORRECTION CIRCUIT FEATURES SY100E193 DESCRIPTION • Hamming code generation ■ Extended 100E VEE range of –4.2V to –5.5V The SY10/100E193 are error detection and correction EDAC circuits designed for use in new, high- performance


    Original
    sy10e193sy100e193sy10/100e193mc10193+3m9999-032006e160e193 PDF

    XG404

    Abstract: DB10 DS3595-5 ds35954 DS3595
    Contextual Info: 54HSC/T630 54HSC/T630 Radiation hard 16-Bit ParallelError Detection & Correction Replaces June 1999 version, DS3595-4.0 DS3595-5.0 January 2000 The 54HSC/T630 is a 16-bit parallel Error Detection and Correction circuit. It uses a modified Hamming code to generate a 6-bit check word from each 16-bit data word. The


    Original
    54hsc/t63016-bitds3595-4ds3595-5+522-bitxg404db10ds35954ds3595 PDF

    Contextual Info: * ERROR DETECTION/ CORRECTIVE CIRCUIT SYNERG Y SEMICONDUCTOR |Y100E193 O i l U 1 1 1 y%3 D ESCRIPTIO N FEATURES The SY10E/100E/101E193 is an errordetection and correction EDAC circuit designed for use in new, high performance ECL systems. The E193 generates hamming parity codes on an 8 -bit


    OCR Scan
    y100e193sy10e/100e/101e19310kh00 PDF

    Contextual Info: 632 54F/74F632 32-Bit Parallel Error Detection and Correction Circuit The 32-bit parallel error detection and correction circuit EDAC in p £ ka g e . The EDAC uses a modified Hamming code to generate a 7-fflinph<Kk w fljb ito m a 32-bit data word. This check word is


    OCR Scan
    54f/74f63232-bit PDF

    XTD22

    Contextual Info: AT&T Microelectronics Product Specification Sheet 1042BL initial Use 5ESS EDC32 Description The 1042BL EDC32 performs error detection and correction on a 32-bit data word using seven bits of correction code. The correction code generated by the device is a modified Hamming


    OCR Scan
    1042bledc3232-bitam29c660+268-pinxtd22 PDF

    Contextual Info: NATL S E M I C O N D UP/UC hS O l l S Ô 4DE D DD712bG 1 INSC4 54F/74F420 'M S - n Sem iconductor 54F/74F420 Parallel Check Bit/Syndrome Bit Generator General Description The 'F420 is a parallel check bit/syndrome bit generator. The 'F420 utilizes a modified hamming code to generate 7


    OCR Scan
    dd712bg54f/74f42032-bit420-b+1ily------74f PDF

    "on semiconductor"

    Abstract: E160 MC100E193 MC100E193FN MC100E193FNR2 MC10E193 MC10E193FN MC10E193FNR2 p4350
    Contextual Info: MC10E193, MC100E193 5VĄECL Error Detection/ Correction Circuit The MC10E/100E193 is an error detection and correction EDAC circuit. Modified Hamming parity codes are generated on an 8-bit word according to the pattern shown in the logic symbol. The P5 output gives the parity of the whole word. The word parity is also


    Original
    mc10e193mc100e193mc10e/100e19312-bit+9r14525mc10e193/don semiconductore160mc100e193fnmc100e193fnr2mc10e193fnmc10e193fnr2p4350 PDF

    Contextual Info: * ERROR DETECTION/ CORRECTION CIRCUIT SYNERGY SY10E193 SY100E193 SEMICONDUCTOR FEATURES DESCRIPTION • Hamming code generation ■ Extended 100E V ee range of -4.2V to -5.5V ■ 8-bit wide ■ Expandable for more width ■ Provides parity register ■ Fully compatible with industry standard 10KH,


    OCR Scan
    sy10e193sy100e193lnternal75kmc10e/100e193+228-pinsy10/100e193 PDF

    socket 775 pinout

    Abstract: PLCC28 package
    Contextual Info: MC100E193 5V ECL Error Detection/ Correction Circuit The MC100E193 is an error detection and correction EDAC circuit. Modified Hamming parity codes are generated on an 8-bit word according to the pattern shown in the logic symbol. The P5 output gives the parity of the whole word. The word parity is also


    Original
    mc100e19312-bitand8020an1404+6an1405an1406an1503an1504socket 775 pinoutplcc28 package PDF

    7 bit hamming code

    Abstract: AN1221 HC05 HC08 hamming encoding
    Contextual Info: MOTOROLA SEMICONDUCTOR APPLICATION NOTE Order this document by AN1221/D AN1221 Hamming Error Control Coding Techniques with the HC08 MCU by Mark McQuilken & Mark Glenewinkel CSIC Applications INTRODUCTION This application note is intended to demonstrate the use of error control coding ECC in a digital transmission system. The HC08 MCU will be used to illustrate the code development of this process. A message


    Original
    an1221/dan12217 bit hamming codehc05+2hc08hamming encoding PDF

    74F632

    Abstract: 74F632QC C1995 DB31 DP8406 DP8406QV V52A F632 Diode cbn 9579
    Contextual Info: DP8406 54F 74F632 32-Bit Parallel Error Detection and Correction Circuit General Description The DP8406 device is a 32-bit parallel error detection and correction circuit (EDAC) in a 52-pin or 68-pin package The EDAC uses a modified Hamming code to generate a 7-bit


    Original
    dp840674f63232-bit52-pin+1068-pin39-bit74f632qcc1995db31dp8406qvv52af632diode cbn9579 PDF

    54HST630

    Abstract: DB10 DS3595-5
    Contextual Info: 54HSC/T630 54HSC/T630 Radiation hard 16-Bit ParallelError Detection & Correction Replaces January 2000 version, DS3595-5.0 DS3595-5.1 July 2002 The 54HSC/T630 is a 16-bit parallel Error Detection and Correction circuit. It uses a modified Hamming code to generate a 6-bit check word from each 16-bit data word. The


    Original
    54hsc/t63016-bitds3595-522-bit+254hst630db10 PDF

    Contextual Info: ERROR DEFECTION SYN ER G Y iv iU E iy j C O R R E C T I O N CIRCl.lH ' V 1Q0 E193 S E M IC O N D U C TO R BH3353I31TS! FEATURES • Hamming code generation ■ Extended 100E V ee range of -4.2V to -5.5V ■ 8-bit wide ■ Expandable for more width ■ Provides parity register


    OCR Scan
    lntemal75kmc10e/100e19328-pinbh3353i31ts+6sy10/100e193sy10e193jcsy10e193jctrsy100e193jcsy100e193jctrj28-1 PDF

    Contextual Info: MOTOROLA SEM ICONDUCTOR TECHNICAL DATA • • • • • • M C10E193 M C100E193 Hamming Code Generation 8-Bit Word, Expandable Provides Parity of Whole Word Scannable Parity Register Extended 100E Vgg Range of -4 .2 V to 75 k il Input Pulldown Resistors


    OCR Scan
    c10e193c100e193mc10e/100e193 PDF

    flash hamming ecc

    Abstract: hamming code 512 bytes SLC nand hamming code 512 bytes hamming hamming code 7 bit hamming code micron ecc nand
    Contextual Info: TN-29-08: Hamming Codes for NAND Flash Memory Devices Overview Technical Note Hamming Codes for NAND Flash Memory Devices For the latest NAND Flash product data sheets, see www.micron.com/products/nand/partlist.aspx. Overview NAND Flash memory products have become the technology of choice to satisfy highdensity, nonvolatile memory requirements in many applications. NAND Flash technology provides large amounts of storage at a price point lower than any of today's semiconductor alternatives. NAND Flash development has focused on low cost per bit,


    Original
    tn-29-0809005aef819bc57109005aef819bc51ctn2908+7flash hamming ecchamming code 512 bytesslc nand hamming code 512 byteshamminghamming code7 bit hamming codemicron ecc nand PDF

    Contextual Info: MC100E193 5V ECL Error Detection/ Correction Circuit The MC100E193 is an error detection and correction EDAC circuit. Modified Hamming parity codes are generated on an 8-bit word according to the pattern shown in the logic symbol. The P5 output gives the parity of the whole word. The word parity is also


    Original
    mc100e19312-bitmc100e193/d PDF

    DS3595-5

    Abstract: 54HST630 DB10 DS3595 XG404
    Contextual Info: 54HSC/T630 54HSC/T630 Radiation hard 16-Bit ParallelError Detection & Correction Replaces January 2000 version, DS3595-5.0 The 54HSC/T630 is a 16-bit parallel Error Detection and Correction circuit. It uses a modified Hamming code to generate a 6-bit check word from each 16-bit data word. The


    Original
    54hsc/t63016-bitds3595-522-bit+454hst630db10ds3595xg404 PDF

    block diagram code hamming

    Abstract: SECDED 7 bit hamming code hamming code E160 E193 MC10193 SY100E193 SY10E193 generate the parity after shift register block
    Contextual Info: *SYNERGY ERROR DETECTION/ CORRECTION CIRCUIT S E M IC O N D U C TO R FEATURES SY10E193 SY100E193 D E S C R IP T IO N I Hamming code generation i 8-bit wide Expandable for more width Provides parity register ESD protection of 2000V Fully compatible with Industry standard 10KH,


    OCR Scan
    sy10e193sy100e193lnternal75kiimc10e/100e193+10s0013a1000d7d2block diagram code hammingsecded7 bit hamming codehamming codee160e193mc10193generate the parity after shift register block PDF

    7 bit hamming code

    Abstract: AN1221 HC05 HC08 AN-1221 ARCO A70 Motorola application Note 1221 IASM08
    Contextual Info: Order this document by AN1221/D Freescale Semiconductor AN1221 Hamming Error Control Coding Techniques with the HC08 MCU by Mark McQuilken & Mark Glenewinkel CSIC Applications Freescale Semiconductor, Inc. INTRODUCTION This application note is intended to demonstrate the use of error control coding ECC in a digital transmission system. The HC08 MCU will be used to illustrate the code development of this process. A message


    Original
    an1221/dan12217 bit hamming codehc05+5hc08an-1221arco a70motorola application note 1221iasm08 PDF

    BK 4367

    Contextual Info: £31 National iufl Semiconductor 54F/74F420 Parallel Check Bit/Syndrome Bit Generator General Description TTe 'F420 is a parallel check bit/syndrome bit generator. TTe ’F420 utilizes a modified hamming code to generate 7 check bits from a 32-bit dataword, in 15 ns, when operated


    OCR Scan
    54f/74f42032-bit420-a420-b+1bk 4367 PDF

    420AB

    Contextual Info: 420 59 National mm Semiconductor 54F/74F420 Parallel Check Bit/Syndrome Bit Generator General Description The ’F420 ¡s a parallel check bit/syndrome bit generator. The ’F420 utilizes a modified hamming code to generate 7 check bits from a 32-bit dataword, in 15 ns, when operated


    OCR Scan
    54f/74f42032-bit420-a420-b+1420ab PDF

    Contextual Info: GEC P L E S S E Y S E M I C O N D U C T O R S DS3595-3.3 54HSC/T630 RADIATION HARD 16-BIT PARALLEL ERROR DETECTION & CORRECTION The 54HSC/T630 is a 16-bit parallel Error Detection and Correction circuit. It uses a modified Hamming code to generate a 6-bit check word from each 16-bit data word. The


    OCR Scan
    ds3595-354hsc/t63016-bit22-bit+3cobalt-60mil-std-8833x1011rad PDF

    49C460

    Abstract: 7 bit hamming code 49C465 sd1623 XOR16 SD815
    Contextual Info: APPLICATION NOTE AN-151 USING 32-BIT EDCS IN 8-BIT AND 16-BIT APPLICATIONS Integrated Device Technology, Inc. By Anupama Hegde INTRODUCTION The 49C460 and 49C465 are 32-bit error detection and correction EDC devices that use a modified Hamming code easily adaptable to 16 , 32 or 64-bit applications. 16-bit


    Original
    an-15132-bit16-bit49c460+649c46564-bit7 bit hamming codesd1623xor16sd815 PDF

    Contextual Info: ERROR DETECTION/ CORRECTION CIRCUIT SYNERGY SY10E193 SY100E193 SEMICONDUCTOR DESCRIPTION FEATURES • Hamming code generation ■ Extended 100E V ee range of -4 .2 V to -5 .5 V ■ 8-bit wide ■ Expandable for more width ■ Provides parity register ■ Fully com patible with industry standard 10KH,


    OCR Scan
    sy10e193sy100e193lnternal75kc10e/100e193+510/100esy10e193jcj28-1sy10e193jctrsy100e193jc PDF