H974 Search Results

H9723

Abstract: h9740 l9718 L9712 L9709 L9727 T9934 l9731 L9706 l9735
Contextual Info: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS April 1998 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 QUALITY & RELIABILITY MONITOR REPORT April 1998 TABLE OF CONTENTS Section I: Introduction Section II:

Contextual Info: I A " ± 0 , 10- i i I A A R 6 - 1 29 REV.0 4 -9 1 11 1 0 8 7 DO NOT SCALE METRIC mm PROJECTION PARTNUMBER BOX p a c k a g i n g PARTNUMBER REE L PACKAGING N UNB E R OF POS I T I O N S "A" 7-215464-4 0-215464-4 4 8, 2 7-215464-6 0-215464-6 6 10,7 6, 35

Contextual Info: HMC974LC3C v02.0614 COMPARATORS - SMT 10 GHz, HIGH SPEED WINDOW COMPARATOR Typical Applications Features The HMC974LC3C is ideal for: Propagation delay: 88 ps • ATE Applications Overdrive & Slew Rate Dispersion: 20 ps • High Speed Instrumentation Minimum Detectable Pulse Width: 60 ps

h9740

Abstract: k1917 B934 L9726 Y9846 H9817 n9831 l9735 9806 9826 320
Contextual Info: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS January 1999 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 QUALITY & RELIABILITY MONITOR REPORT January 1999 TABLE OF CONTENTS Section I: Introduction Section II:

h9745

Abstract: H-9745 C-215464 0-215464-8 9-215464-0
Contextual Info: m . *r A ± 0 , 70- -H I 5 ,0 T -ts* B‘ B A A A A A A A A 3, 15 6 ,75 B S E C T I O N A~A R 6 -J 2 9 R E V .0 4 -9 1 > 71 10 8 DO NO T S C A L E DIMENSIONS THIRD ANGLE M IN mm E T R I C PROJECT ION PARTNUMBER REEL PACKAGING NUMBER OF POSITIONS 7-275464-4

h945

Abstract: H944 transistor h945 h965 h946 H948 IR1518 BCM56800 h945 transistor H808
Contextual Info: LatticeECP3 and Broadcom 10 Gbps Physical/MAC Layer Interoperability July 2010 Technical Note TN1218 Introduction This technical note describes a Physical/MAC layer 10-Gigabit Ethernet interoperability test between a LatticeECP3 device and the Broadcom BCM56800 network switch. The test exercises the Physical/MAC layer

h9740

Abstract: B897 T9934 l9735 l9731 L9726 74100 B8948 JESD22-B100 PT 9732
Contextual Info: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS October 1998 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 QUALITY & RELIABILITY MONITOR REPORT October 1998 TABLE OF CONTENTS Section I: Introduction Section II:

H9723

Abstract: h9740 L9727 H9703 PJ 966 IV L9718 L9726 IC L9712 K961 L9712
Contextual Info: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS July 1998 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 QUALITY & RELIABILITY MONITOR REPORT July 1998 TABLE OF CONTENTS Section I: Introduction Section II:

H9745

Abstract: H-9745
Contextual Info: I A " ± 0 , 10- i i I A A R 6 - 1 29 REV.0 4 -9 1 11 1 0 8 7 DO NOT S C A L E DIMENSIONS IN T H I RD METRIC mm ANGLE PROJECTION PARTNUMBER BOX p a c k a g i n g PARTNUMBER REE L PACKAGING N UNB E R OF POS I T I 0 N 5 "A" ~B " 7 -2 1 B464-4 0-215464-4 4

h946

Abstract: H945 H944 h965 H924 h940 295050 transistor h945 H948 transistor BC rx
Contextual Info: LatticeECP3 and Marvell 10 Gbps Physical/MAC Layer Interoperability July 2010 Technical Note TN1219 Introduction This technical note describes a Physical/MAC Layer 10-Gigabit Ethernet interoperability test between a LatticeECP3 device and the Marvell Alaska 88X2040 device. The test exercises the Physical/MAC Layer up to