EV VIBRATION TESTING Search Results

nichicon capacitor

Abstract: nichicon aluminum capacitor nichicon catalog Electric Double Layer Capacitors, Radial Lead Type NICHICON CAPACITORS CATALOG
Contextual Info: Automotive Application Catalog Standard Process for Developing Custom Products 2015.3 We propose the best products for our customers, based on application, size and a variety of other design needs. Customer Nichicon Evaluation and approval of verification testing,

306E-09

Abstract: MQFP-208 XC7000 XC4005E PHYSICAL HT 208 X9500 XC1700D XC2000 XC4000E XC5000
Contextual Info: Reliability Testing Summary High Temperature Life Test Qualification & Monitor Combined Technology: Device Type: Package Type: Actual Temperature Actual Voltage: Assumed Activation Energy: XC1700D Period: 26 Combined Started Lot: 26 Combined Completed Lots:

TR902

Contextual Info: AMP J - 0 0 2 m LO I no Product Specification CO 108-5351 o AMP-LATCH Series. FCRC Puddle card Connector This specification may change without notice as a result of product design change amd product evaluation testing. Eo m <D CD ♦_> QJ - 1. Scope : 1.1

5082-2080

Abstract: 5082-2826 5082-2835 MTTF 5965-8870E Y2272 DOD-HDBK-1686
Contextual Info: Passivated General Purpose Schottky Diodes Reliability Data The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-750. Data was gathered from the 1N5711/12 5082-2800/04/05

XLO8

Abstract: diode hp 5082-2080 hp 5082-2830 DOD-HDBK-1686A DOD-HDBK-1686 hp 5082-2900 diode
Contextual Info: WhoI H EW L E T T 1 "KM PA CK A R D Tri Metal Beam Lead Schottky Diodes Reliability Data HSCH-5300 Series HSCH-5500 Series Conclusion Hewlett-Packard’s beam lead diodes have successfully passed stringent environmental testing. Hewlett-Packard beam lead diodes may be used in military

Contextual Info: Product Specification Grace Inertia Connector 2.0 EV 108-106001 23MAR.’09 REV:E 1 Scope : 1.1 Contents This specification covers the requirements for product performance, test methods and quality assurance provisions of GIC 2.0 EV. Applicable product description and part numbers are as shown in Appendix 1.

1N5711, 5082-2800

Contextual Info: 1N5711, 5082-2800 1N5712, 5082-2810/11 5082-2835 Avago Technologies Glass Package RF Schottky Diodes Reliability Data Sheet Description The following cumulative test results have been obtained from testing performed at Avago Technologies. For the purpose of this reliability data sheet, a failure is

ARM-184

Abstract: ASM-663 1030mhz ARINC 568 AC0820 Transponder ID 48 mil 50071 G.N.M 2nd year IFR 640 AN/ARM-184
Contextual Info: Avionics IFR 6015 Ramp Test Set The IFR 6015 is a compact, lightweight and weatherproof unit designed for testing transponder modes 1,2,3A/C/S, TCAS I, II and Military E-TCAS as well as TACAN. • One main user screen for each test mode • Detachable antenna

JIS C 7021 A10

Abstract: AVAGO DIP
Contextual Info: HLMP-NM30 / NS30 High Power T1 3 mm Plastic Lamps Reliability Data Sheet Description The following cumulative test results have been obtained from testing performed at Avago Technologies in accordance with the latest revisions of MIL-STD-883 and JIS C 7021.

114-1010

Abstract: 109-21
Contextual Info: APR 13 1987 NOV 0 91989 PRODUCT SPECIFICATION 1 SC0PE 1.1. TENTATIVE Content This specification covers the performance, tests and quality requirements for the AMP* Circular Multi-Pin Connectors with removable crimp contacts and the printed circuit board headers with fixed contacts. The connectors are designed for use

JEP122

Abstract: manson college website design 100C
Contextual Info: Knowledge Based Reliability Evaluation of New Package Technologies Utilizing Use Conditions March 1999 Order Number: 245162-001 Information in this document is provided in connection with Intel products. No license, express or implied, by estoppel or otherwise, to any intellectual

Contextual Info: Integrated Resistor Lamps Reliability Data The following cumulative test results have been obtained from testing performed at HP Optoelectronics Division in accordance with the latest revision of MIL-STD-883. T-1 and T-1 3/4 Lamps, 5 V and 12 V Series. Subminiature Lamps

Denso L 918 8

Abstract: Denso L 918 P-PGA-132 MQFP-208 XC4000 XC4000E XC5000 XC1765D 145C XC1700D
Contextual Info: The Reliability Data Program October 1, 1996 Expanded Version Index • • • • • • HTOL High Temperature Operating Life . 85/85 (Bias Moisture Life). PCT (Unbiased Pressure Pot).

yazaki terminals

Abstract: AEV110122 AEV18024 matsushita varistor ZNR YAZAKI 7283 znr varistor y YAZAKI 7283-1020 YAZAKI 7282-1020 AEV19024 matsua varistor ZNR
Contextual Info: EV AEV CAPSULE CONTACT MECHANISM AND HIGH-CAPACITY CUTOFF COMPACT RELAY FEATURES 10A 80A 300A RoHS Directive compatibility information http://www.nais-e.com/ 1. High-voltage, high-current control capable 400 V DC high-voltage switching cutoff has been achieved thanks to a sealed

1197X

Contextual Info: Quality and Reliability CO M M ITM EN T T O Q U A L IT Y Dense-Pac Microsystems produces only high quality modules and m onolithic devices. Q uality is designed into all products, whether utilized in military or in commercial applications. Long term reliability is the standard by

maxim 77

Contextual Info: Maxim Integrated Products 120 San Gabriel Drive Sunnyvale, CA 94086 Phone: 408-737-7600, FAX: 408-470-5841 Product Reliability Qualification Document ID: 10-3006, Rev. H Maxim Integrated Products Effective: 6/27/01 TABLE OF CONTENTS PURPOSE. 3

INCOMING leadframe INSPECTION procedure

Abstract: mttf water distribution INCOMING Plate INSPECTION
Contextual Info: May 1997 Quality Assurance 2-1 Ericsson Components AB is the main company within the components business area in the Ericsson Coporation. An overall quality policy, common to all business areas, is defined by the Ericsson Corporate Executive Committee. Pre-specification

Contextual Info: D A T A S H E E T ACULED VHL IR ACL01-SC-IIII-005-C01-L-V000 The new ACULED® VHL Very High Lumen delivers outstanding brightness, improved wall plug efficiency and excellent thermal management, all in a compact, easy-to-assemble package. Features and Benefits

photodiode lens siemens

Abstract: siemens spc 2
Contextual Info: APPLICATIONS OPTOELECTRONICS Wilhelm Kraus ● Gerhard Kuhn Quality assurance in fiber optic components: BIDI module passes Bellcore test The BIDI bidirectional module developed by Siemens shows how fiber optic components can meet exacting quality requirements. The module has

TRANSISTOR A104b

Abstract: TRANSISTOR A107 EIAJ ED-4701 305 water pumping machine control schematic electromigration calculation for TTL smd transistor AIT AAAA series SMD transistor schematic diagram atom ED-4701 A103-C
Contextual Info: [ 3 ] Reliability Testing Contents 1. What is Reliability Testing . 1 1.1 Significance and Purpose of Reliability Testing. 1 1.2 1.3 Before Testing . 1

HEDS-9700

Contextual Info: Small Optical Encoder Modules Reliability Data HEDS-9700 Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard Optoelectronics Division in accordance with the latest revision of MIL- STD-883. Hewlett-Packard tests parts at

MIL-STD-883 method 2003

Contextual Info: HDSP-Uxxx, HDSP-Axxx, HDSP-3xxx, HDSP-4xxx, HDSP-7xxx Seven Segment Displays – Ultra Mini, 0.3 " Mini, 0.3 " Reliability Data Sheet Description The following cumulative test results have been obtained from testing performed at Avago Technologies in accordance with the latest revision of MIL-STD-883.

Contextual Info: Optical Encoder Modules Reliability Data HEDT-9040, 9140 Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard Optoelectronics Division in accordance with the latest revision of MIL- STD-883. Hewlett-Packard tests parts at

HEDS-5500

Abstract: HEDS-6500 HEDS-9000
Contextual Info: HEDS-5500, HEDS-6500 and HEDS-9000, 9100, 9200 Series Motion Sensing Products, Optical Encoder Modules Reliability Data Description Failure Rate Prediction The following cumulative test results have been obtained from testing performed at Avago Technologies in accordance with the latest revision of MIL- STD-883.