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    EPROM RETENTION BAKE Search Results

    EPROM RETENTION BAKE Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    27C16Q55/B
    		Rochester Electronics LLC 27C16 - 2Kx8 EPROM PDF Buy
    MD2716M/B
    		Rochester Electronics LLC 2716M - 2Kx8 EPROM PDF Buy
    MD27512-25/B
    		Rochester Electronics LLC 27512 - 512K (64K x 8) EPROM PDF Buy
    MR27C64-25/B
    		Rochester Electronics LLC 27C64 - 64K (8K x 8) EPROM PDF Buy
    MD27C64-35
    		Rochester Electronics LLC 27C64 - 64K (8K x 8) EPROM PDF Buy

    EPROM RETENTION BAKE Datasheets Context Search

    Catalog Datasheet Type Document Tags PDF

    27C2048

    Abstract: 7A9819 MIL-M-38535 plcc failures
    Contextual Info: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C2048 CMOS EPROM RELIABILITY DATA - 150°C RETENTION BAKE (PLASTIC) - EXTENDED THERMAL SHOCK - EXTENDED TEMPERATURE CYCLE - 85°C/85% RETENTION HUMIDITY OPERATING LIFE TEST - 15 PSIG PRESSURE POT


    Original     		AT-27C2048 MIL-M-38535 AT-27C2048 6B1924 6B9633 7A0378-2 27C2048 7A9819 plcc failures PDF

    MIL-M-38535

    Contextual Info: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27BV4096 CMOS EPROM RELIABILITY DATA - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - EXTENDED TEMPERATURE CYCLE - 85°C/85% RETENTION HUMIDITY OPERATING LIFE TEST


    Original     		AT-27BV4096 MIL-M-38535 AT-27BV4096 7B0853 7B9745 7C9817 8B9922 0G2297 PDF

    27C4096

    Abstract: 7G9737 27C4096 eprom 4E0421 MIL-M-38535
    Contextual Info: PAGE 1 OF 11 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C4096 EPROM RELIABILITY DATA - 125°C OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT - EXTENDED TEMPERATURE CYCLE


    Original     		AT-27C4096 MIL-M-38535 AT-27C040 AT-27C010 AT-27C4096 3G0346 3J0350 4E0421 5F0514 27C4096 7G9737 27C4096 eprom 4E0421 PDF

    27C4096

    Abstract: 6B9635 3J0350 MIL-M-38535 40-VSOP
    Contextual Info: PAGE 1 OF 11 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C4096 EPROM RELIABILITY DATA - 125°C OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT - EXTENDED TEMPERATURE CYCLE


    Original     		AT-27C4096 MIL-M-38535 AT-27C040 AT-27C010 AT-27C4096 7G9737 8E9913 3G0346 3J0350 27C4096 6B9635 3J0350 40-VSOP PDF

    5A9516

    Abstract: 5H9606 5H9605 7H9744 2A9212 5A9524 7H9747 9d9018 5c112 1B9126
    Contextual Info: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)


    Original     		AT-27C010 AT-27C010 E901-14056 2D1147-12 5A9516 5H9606 5H9605 7H9744 2A9212 5A9524 7H9747 9d9018 5c112 1B9126 PDF

    TSOP 173 g

    Abstract: 5H9602 6c9648 3b1326 5G9551 MIL-M-38535 6F9627 4c19 3C1660 atmel 906
    Contextual Info: PAGE 1 OF 21 ATMEL COPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C040 CMOS EPROM RELIABILITY DATA* -125°C DYNAMIC OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT


    Original     		AT-27C040 MIL-M-38535 AT-27C1024 AT-27C512R AT-27C010 AT-27C040 12C/TSOP/SOIC/PDIP 6D9702 8B9832 TSOP 173 g 5H9602 6c9648 3b1326 5G9551 6F9627 4c19 3C1660 atmel 906 PDF

    2a92

    Abstract: 27C010A 6E9621 6B9637 3A9315 3E0317 5A9516 5C9550 1B9126 2D1150-9
    Contextual Info: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)


    Original     		AT-27C010 AT-27C010 E901-14056 2D1147-12 2a92 27C010A 6E9621 6B9637 3A9315 3E0317 5A9516 5C9550 1B9126 2D1150-9 PDF

    27C1024

    Abstract: MIL-M-38535 2C9237 4B942 3B93
    Contextual Info: PAGE 1 OF 12 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C1024 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C DATA RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT


    Original     		AT-27C1024 MIL-M-38535 AT-27C010 AT-27C1024 27C1024 2C9237 4B942 3B93 PDF

    27c080

    Abstract: tsop 138 atmel 27c080 resistor activation energy MIL-M-38535 tsop40 3D0442-1
    Contextual Info: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C080 EPROM RELIABILITY DATA - 125°C OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT * This report was generated from AT-27C080 reliability testing.


    Original     		AT-27C080 MIL-M-38535 AT-27C040 AT-27C4096 AT-27C080 A3B0575-2 3B9336 A3B0575-1 3B9331 27c080 tsop 138 atmel 27c080 resistor activation energy tsop40 3D0442-1 PDF

    M1014

    Abstract: K2078 1c9136 5D9602 AT27C010 AT27C512R 1C9133 27c256r 1A9110 3D9352
    Contextual Info: PAGE 1 OF 15 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C256R CMOS EPROM RELIABILITY DATA* * - 200°C DATA RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST - 125°C HIGH TEMPERATURE REVERSE BIAS (HTRB) - TEMPERATURE CYCLE, CENTRIFUGE, FINE AND GROSS


    Original     		AT-27C256R from27C256R 4B0691 8703A) M1014 K2078 1c9136 5D9602 AT27C010 AT27C512R 1C9133 27c256r 1A9110 3D9352 PDF

    27c516

    Abstract: 6C9650 6c9640 6C9639 5D9611 27C1024 MIL-M-38535 6b2933
    Contextual Info: PAGE 1 OF 7 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C516 CMOS EPROM RELIABILITY DATA* - 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT - 85°C/85% RELATIVE HUMIDITY OPERATING LIFE TEST


    Original     		AT-27C516 MIL-M-38535 AT-27C1024 AT-27C516 4D20CC 6B9634 7H9841 6C9639 27c516 6C9650 6c9640 6C9639 5D9611 27C1024 6b2933 PDF

    27BV040

    Abstract: MIL-M-38535 6a9618
    Contextual Info: PAGE 1 OF 7 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27BV040 EPROM RELIABILITY DATA - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 85°C/85% RELATIVE HUMIDITY OPERATING LIFE TEST - 15 PSIG PRESSURE POT - EXTENDED TEMPERATURE CYCLING


    Original     		AT-27BV040 MIL-M-38535 AT-27BV010 AT-27BV020 AT-27BV040 4C2309 4C9504 5A1214 5A9521 27BV040 6a9618 PDF

    27c512r

    Abstract: ATMEL AT27c512 8a039 6J24 233759A-13 4b23 3C1091 2d9306 9c9949 5c2484
    Contextual Info: PAGE 1 OF 17 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C512R CMOS EPROM RELIABILITY DATA* -125°C OPERATING LIFE TEST -150°C HIGH TEMPERATURE REVERSE BIAS (HTRB) -200°C RETENTION BAKE -PROGRAM/ERASE CYCLE -125°C OPERATING LIFE TEST (PLASTIC)


    Original     		AT-27C512R MIL-M-38510 AT-27C256R AT-27C010 AT-27C512/512R 2J0301 4J0451 6J0707 7F0721 27c512r ATMEL AT27c512 8a039 6J24 233759A-13 4b23 3C1091 2d9306 9c9949 5c2484 PDF

    2E0210

    Abstract: 8A9835 2h0245
    Contextual Info: PAGE 1 OF 5 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27BV512 CMOS EPROM RELIABILITY DATA* -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT -EXTENDED TEMPERATURE CYCLE JULY 2003 2325 Orchard Parkway San Jose CA. 95131


    Original     		AT-27BV512 AT-27BV512 7D3370-2 7D9812 8D0946-3 8D9901 2H1980A 2H0245 2E0210 8A9835 2h0245 PDF

    MIL-M-38535

    Contextual Info: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27BV256 EPROM RELIABILITY DATA - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT - EXTENDED TEMPERATURE CYCLING - EXTENDED THERMAL SHOCK * This report was generated from AT-27BV256 reliability testing.


    Original     		AT-27BV256 MIL-M-38535 AT-27BV010 AT-27BV020 AT-27BV256 5B1402 5B9552 7D3024B 7D9813 PDF

    TSOP 54 Package

    Abstract: 27bv010 report on PLCC 6A17 MIL-M-38535 5A9530 7C9745 8b99
    Contextual Info: PAGE 1 OF 7 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27BV010 EPROM RELIABILITY DATA - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT - EXTENDED TEMPERATURE CYCLING - EXTENDED THERMAL SHOCK - 85°C/85% RELATIVE HUMIDITY OPERATING LIFE TEST


    Original     		AT-27BV010 MIL-M-38535 AT-27BV040 AT-27BV020 AT-27BV010 5A9516 5A9525 5A9530 TSOP 54 Package 27bv010 report on PLCC 6A17 5A9530 7C9745 8b99 PDF

    report on PLCC

    Abstract: 7B9742 3G0329 TSOP Package MIL-M-38535 0B0027 2G0232
    Contextual Info: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27BV020 EPROM RELIABILITY DATA - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - EXTENDED THERMAL SHOCK - 15 PSIG PRESSURE POT - EXTENDED TEMPERATURE CYCLING * This report was generated from AT-27BV020 reliability testing.


    Original     		AT-27BV020 MIL-M-38535 AT-27BV040 AT-27BV020 4C2629 4C9501 6A0980-1 9B9930 1C0144 report on PLCC 7B9742 3G0329 TSOP Package 0B0027 2G0232 PDF

    ST62T20

    Abstract: EPROM retention bake st6220 programmer ST6220 ST62t20* programming
    Contextual Info: APPLICATION NOTE SELECTING BETWEEN ROM AND OTP FOR A MICROCONTROLLER by Microcontroller Division Applications INTRODUCTION A customer who develops an MCU based application needs different levels of flexibility in the ability to perform code modifications these levels are explained on the next page . To satisfy


    Original     		PDF

    st6220 programmer

    Abstract: AN1068 AN886 ST6220 ST62T20 EPROM retention bake
    Contextual Info: AN886 APPLICATION NOTE SELECTING BETWEEN ROM, FASTROM AND OTP FOR A MICROCONTROLLER by Microcontroller Division Applications INTRODUCTION A customer who develops an MCU-based application needs various levels of flexibility in order to perform code modifications at different times in the life cycle of the product these levels are


    Original     		AN886 AN1068 st6220 programmer AN886 ST6220 ST62T20 EPROM retention bake PDF

    EPROM retention bake

    Abstract: st6220 programmer ST6220 ST62T20 eprom st62t20
    Contextual Info: APPLICATION NOTE SELECTING BETWEEN ROM AND OTP FOR A MICROCONTROLLER by the Micro Divisions INTRODUCTION A customer who develops an MCU based application needs different levels of flexibility in the ability to perform code modifications these levels are explained on the next


    Original     		PDF

    QRR0001

    Abstract: ST16 m29f002 065um ST M27C256B PART MARKING FM27c1024 QRR000
    Contextual Info: QRR0001 QUALITY & RELIABILITY REPORT April 1999 March 2000 EPROM, Flash Memory, EEPROM, NVRAM and SMARTCARD Products INTRODUCTION STMicroelectronics manufactures a wide range of memory types which include: Non-volatile memories: Flash memory, UV EPROM, OTP EPROM and


    Original     		QRR0001 QRR0001 ST16 m29f002 065um ST M27C256B PART MARKING FM27c1024 QRR000 PDF

    ST M27C256B PART MARKING

    Abstract: M29W080 QRR0003 stmicroelectronics datecode m27C256 Marking STMicroelectronics m27c256 m29w160 reliability report M29W160 QRR000 QRR0001 ST16
    Contextual Info: QRR0003 QUALITY & RELIABILITY REPORT October 1999 September 2000 EPROM, Flash Memory, EEPROM, NVRAM and SMARTCARD Products INTRODUCTION STMicroelectronics manufactures a wide range of memory types which include: Non-volatile memories: Flash memory, UV EPROM, OTP EPROM and


    Original     		QRR0003 ST M27C256B PART MARKING M29W080 QRR0003 stmicroelectronics datecode m27C256 Marking STMicroelectronics m27c256 m29w160 reliability report M29W160 QRR000 QRR0001 ST16 PDF

    flash "high temperature data retention" mechanism

    Abstract: EPROM retention bake ST62t20* programming st6220 programmer AN1068 ST6220 ST62T20
    Contextual Info: APPLICATION NOTE SELECTING BETWEEN ROM, FASTROM AND OTP FOR A MICROCONTROLLER by Microcontroller Division Applications INTRODUCTION A customer who develops an MCU-based application needs various levels of flexibility in order to perform code modifications at different times in the life cycle of the product these levels are


    Original     		AN1068. flash "high temperature data retention" mechanism EPROM retention bake ST62t20* programming st6220 programmer AN1068 ST6220 ST62T20 PDF

    M25C

    Abstract: Marking STMicroelectronics m27c256 QRR0001 QRR0002 ST16 M29W160 M275 M27C512 marking QRR000 ST M27C256B PART MARKING
    Contextual Info: QRR0002 QUALITY & RELIABILITY REPORT July 1999 June 2000 EPROM, Flash Memory, EEPROM, NVRAM and SMARTCARD Products INTRODUCTION STMicroelectronics manufactures a wide range of memory types which include: Non-volatile memories: Flash memory, UV EPROM, OTP EPROM and


    Original     		QRR0002 M25C Marking STMicroelectronics m27c256 QRR0001 QRR0002 ST16 M29W160 M275 M27C512 marking QRR000 ST M27C256B PART MARKING PDF