ENDURANCE TEST REPORT Search Results

transistor poly3

Abstract: RR510 RR-504 RR-520 X28C256 rr520
Contextual Info: Xicor Endurance Report Xicor Endurance Report RR-520 H. A.R. Wegener INTRODUCTION This report describes endurance relating to Xicor’sproducts employing the Direct WriteTM cell. These devices display enhanced endurance cycling characteristics that are attributable to the direct write cell, process

RR502A

Abstract: RR504 x2864 X2864A X2816A RR-504 predicting xicor X2816A
Contextual Info: U ff !' VH I I I I iiJ r r* > 3* / y h \ 'i DETERMINING SYSTEM RELIABILITY FROM E2PROM ENDURANCE DATA By Richard Palm • D ata retention refers to the capability of a non­ volatile m emory device to retain valid data under worst case conditions. Xicor has published numerous reliability reports

Contextual Info: EEPROM Reliability The reliability of AMD's NS-18 process used in the fabrication of 64K EEPROMs is described in this report. The reliability monitors used at AMD were designed to predict the future operating life results by accelerat­ ing failure rates. The monitors include data from endur­

TA-NWT-000983

Abstract: Mil-Std-883D SG608 CDX2155 CDX2622 SDX1155 UL-94-VO mil-std 883d method 1010 MILSTD-883D
Contextual Info: Interim Qualification Report 2000 Hours Endurance Reliability Data CDX2155, CDX2622 Summary The CDX2155 and CDX2622 transceivers have been successfully qualified in accordance with the requirements of Bellcore document TA-NWT-000983, under the supervision of HewlettPackard FCO Quality and

sd667

Abstract: SE621 FDX1125B SDX1155 SDX1155B UL-94-VO IEC-68-2-20 TA-NWT-000983 se6303 SE6211
Contextual Info: Interim Qualification Report 2000 Hours Endurance Reliability Data SDX1155B, FDX1125B Summary This report summarizes the Qualification testing of both the SDX1155B and FDX1125B over a range of environmental and mechanical extremes as set out in Bellcore TA-NWT-000983. All

SE6211

Abstract: se6303
Contextual Info: W hatHEW LETT mL'HM PACKARD Interim Qualification Report 2000 hours Endurance Reliability Data SDX1155B, FDX1125B Summary This report summarizes the Qualification testing of both the SDX1155B and FDX1125B over a range of environmental and mechanical extrem es as set out in

CTL4468-002

Abstract: lbff 1408150-1
Contextual Info: 501-672 Qualification Test Report 30Jan08 Rev A Series MMCX 50 Ohm Micro-Miniature Connectors 1. INTRODUCTION 1.1. Purpose Testing was performed on the Tyco Electronics Series MMCX 50 ohm micro-miniature connectors to determine their conformance to the requirements of Product Specification 108-2084 Revision A.

24lc56

Abstract: LA 7670 block diagram of electric cooker EEPROM retention testing eprom 24c04 royal fuse curves PIC16C54 PIC16C55 PIC16C56 PIC16C57
Contextual Info: 1995 Reliability Report Published 9/96 INTRODUCTION RELIABILITY CONTROL SYSTEM By adhering to this guiding value, Microchip Technology Inc. has achieved competitive leadership in quality and reliability for its products. Demonstrated performance levels of less than 100 Failures in Time (FITS) for most

X28C64

Abstract: X28C256 ucl 11 A12C UCl 21
Contextual Info: RR-511 W 0114-1 X 2 8 C 6 4 /X 2 8 C 2 5 6 RELIABILITY REPORT 10-1 INTRODUCTION The X28C64 and X28C 256 are nonvolatile bytewide E2PROM s configured as 8K x 8 and 32K x 8 respectively. Both devices are com pliant with the JEDEC approved pinout for byte-w ide m em ories.

ABLEBOND

Contextual Info: 8/29/2006 RELIABILITY REPORT FOR DS1086L, Rev A1 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

GP035

Abstract: CF-110VH-2A PCN-112D3MHZ PCN-104 118D3 PCN-103D3MHZ PCN-103D3M PMC35 CF-110VH GP-035
Contextual Info: Qualification Test Report 認定試験報告書 501-79817 Was S-45624~45645 October 23, 2007 Rev. A1 PCＮ-D3M リレー PCＮ-D3M Relay １.はじめに Introduction 1.1 目 的 Purpose 本試験はリレー製品規格書 108-79817 Rev. A に規定された性能必要条件に合致しているか

GP035

Abstract: diod* GP035 VH-6200 GP-035 GP035-20 TSA-70S-W 55383-A2 relay endurance test report CF-110VH-2A 112d3m
Contextual Info: Qualification Test Report 501-79816 Was S-55377Ａ~55398A October 22, 2007 Rev. A1 認定試験報告書 PCJ-D3M リレー PCJ-D3M Relay １.はじめに Introduction 1.1 目 的 Purpose 本試験はリレー製品規格書 108-79816 Rev. A に規定された性能必要条件に合致しているか

sim reader

Abstract: sim card chips 292405-1 ASHL-0004-ES
Contextual Info: Qualification Test Report 501-5476 Rev. O1 Product Specification : 108-5826 Reference Test Report No. : TR100395 Date : 26Mar2003 Classification : Unrestricted Prepared by C.OHASHI PE Reviewed by PE Manager Approved by QA Manager NO Tyco Electronics AMP Shanghai Ltd.

IEC 61754-20

Abstract: dust cap LC EIA-526-14A EIA-455 Bly 53
Contextual Info: Qualification Test Report 501-700 30Apr09 Rev A LC Duplex Sealed Plug and Receptacle Singlemode and Multimode Connectors ODVA Conforming 1. INTRODUCTION 1.1. Purpose Testing was perform ed on Tyco Electronics Fiber Optic LC Duplex Sealed Plug and Receptacle

"vlsi technology" abstract

Abstract: "vlsi technology" abstract for split-gate flash
Contextual Info: Endurance Characteristics of SuperFlash Memory Xian Liu*, Viktor Markov, Alexander Kotov, Tho Ngoc Dang, Amitay Levi Silicon Storage Technology, Inc., 1171 Sonora Court, Sunnyvale, CA94086, USA Ian Yue, Andy Wang, and Rodger Qian SST China, Ltd., Bldg. 24, No.115, Lane 572, Bibo Road, Zhangjiang Hi-Tech Park, Shanghai, 201203, P.R. China

1746854-1

Abstract: tyco Qualification Test Report
Contextual Info: Qualification Test Report 認定試験報告書 シールドフィンガー2411 （ 1. はじめに 1.1 目 501-5816 6MAR’07 Rev. A Shield Finger2411） 的 本試験はシールドフィンガー 2411の、製品規格 108-5967-2 Rev.A に規定された性能必要条件に合致し

OJ-SH-112LMH

Abstract: IEC60255 GP035
Contextual Info: Qualification Test Report 501-79075 Was S-36091~36112 認定試験報告書 2 October 2007 Rev. A OJ-SH-112LMH リレー OJ-SH-112LMH Relay １.はじめに Introduction 1.1 目 的 Purpose 本試験はリレー製品規格書 108-79075 Rev. O1 に規定された性能必要条件に合致しているか

MIL-C-675C

Abstract: alcohol sensor data sheet 3M Touch Systems ASTM-D-1308-87 capacitive touchscreen MIL-C-675-C alcohol sensor Gardner touch screen 3M hardness tester
Contextual Info: Technical Data ClearTek Capacitive Touch Screens ELECTRICAL Input Method Finger. TouchPen available with qualified sensor, attachments and electronics Accuracy and Precision Area Reported touch coordinates are within 1.0% of true position based on viewing area dimensions when linearized

28HC64

Abstract: 28PC64 28HC16 MIL-M-38535 9C8944 Activation Energy
Contextual Info: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28HC64 CMOS EEPROM RELIABILITY DATA* - 125°C DYNAMIC OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) - 15 PSIG PRESSURE POT - CYCLE TEST * This report was generated from AT-28HC64 reliability testing.

PCD-124-D2M

Abstract: IEC60255 koike relays GP035 hp410
Contextual Info: Qualification Test Report 認定試験報告書 501-79726 Was S-45668～45689 5 October 2007 Rev. A PCD-124D2M リレー PCD-124D2M Relay １.はじめに Introduction 1.1 目 的 Purpose 本試験はリレー製品規格書 108-79726 Rev. O に規定された性能必要条件に合致しているか

6K tantalum capacitors

Contextual Info: NIC Doc #R-NTC02 Page 1 of 6 70 Maxess Road ! Melville, New York 11747 631 396-7500 ! Fax (631) 396-7575 NTC SERIES TANTALUM CHIP CAPACITORS ! ! ! ! FAILURE RATE ESTIMATION DE-RATED OPERATION LIST OF RELIABILITY TESTS LIFE TEST SUMMARY FAILURE RATE ESTIMATION

koike relays

Abstract: IEC60255 TOS8700 GP035 VH-6200 hp410
Contextual Info: Qualification Test Report 501-79386 Was S-15772 ~ 15793 2 October 2007 Rev. A 認定試験報告書 ＰＣＦ-１２４Ｄ２Ｍ リレー PCF-124D2M Relay １.はじめに Introduction 1.1 目 的 Purpose 本試験はリレー製品規格書 108-79386 Rev. O1 に規定された性能必要条件に合致しているか

IEC60255

Abstract: koike relays GP035 Qualification Test Report
Contextual Info: Qualification Test Report 認定試験報告書 501-79725 Was S-45694～45715 5 October 2007 Rev. A PCD-112D2M リレー PCD-112D2M Relay １.はじめに Introduction 1.1 目 的 Purpose 本試験はリレー製品規格書 108-79725 Rev. O に規定された性能必要条件に合致しているか

PCJ-112D3MH

Abstract: IEC60255 GP035 2502A koike relays s3598
Contextual Info: Qualification Test Report 501-79544 Was S-35983~36004 3 October 2007 Rev. A 認定試験報告書 PCJ-112D3MH リレー PCJ-112D3MH Relay １.はじめに Introduction 1.1 目 的 Purpose 本試験はリレー製品規格書 108-79544 Rev. O に規定された性能必要条件に合致しているか