ENDURANCE TEST REPORT Search Results

RR502A

Abstract: RR504 x2864 X2864A X2816A RR-504 predicting xicor X2816A
Contextual Info: U ff !' VH I I I I iiJ r r* > 3* / y h \ 'i DETERMINING SYSTEM RELIABILITY FROM E2PROM ENDURANCE DATA By Richard Palm • D ata retention refers to the capability of a non­ volatile m emory device to retain valid data under worst case conditions. Xicor has published numerous reliability reports

Contextual Info: EEPROM Reliability The reliability of AMD's NS-18 process used in the fabrication of 64K EEPROMs is described in this report. The reliability monitors used at AMD were designed to predict the future operating life results by accelerat­ ing failure rates. The monitors include data from endur­

TA-NWT-000983

Abstract: Mil-Std-883D SG608 CDX2155 CDX2622 SDX1155 UL-94-VO mil-std 883d method 1010 MILSTD-883D
Contextual Info: Interim Qualification Report 2000 Hours Endurance Reliability Data CDX2155, CDX2622 Summary The CDX2155 and CDX2622 transceivers have been successfully qualified in accordance with the requirements of Bellcore document TA-NWT-000983, under the supervision of HewlettPackard FCO Quality and

sd667

Abstract: SE621 FDX1125B SDX1155 SDX1155B UL-94-VO IEC-68-2-20 TA-NWT-000983 se6303 SE6211
Contextual Info: Interim Qualification Report 2000 Hours Endurance Reliability Data SDX1155B, FDX1125B Summary This report summarizes the Qualification testing of both the SDX1155B and FDX1125B over a range of environmental and mechanical extremes as set out in Bellcore TA-NWT-000983. All

CTL4468-002

Abstract: lbff 1408150-1
Contextual Info: 501-672 Qualification Test Report 30Jan08 Rev A Series MMCX 50 Ohm Micro-Miniature Connectors 1. INTRODUCTION 1.1. Purpose Testing was performed on the Tyco Electronics Series MMCX 50 ohm micro-miniature connectors to determine their conformance to the requirements of Product Specification 108-2084 Revision A.

X28C64

Abstract: X28C256 ucl 11 A12C UCl 21
Contextual Info: RR-511 W 0114-1 X 2 8 C 6 4 /X 2 8 C 2 5 6 RELIABILITY REPORT 10-1 INTRODUCTION The X28C64 and X28C 256 are nonvolatile bytewide E2PROM s configured as 8K x 8 and 32K x 8 respectively. Both devices are com pliant with the JEDEC approved pinout for byte-w ide m em ories.

sim reader

Abstract: sim card chips 292405-1 ASHL-0004-ES
Contextual Info: Qualification Test Report 501-5476 Rev. O1 Product Specification : 108-5826 Reference Test Report No. : TR100395 Date : 26Mar2003 Classification : Unrestricted Prepared by C.OHASHI PE Reviewed by PE Manager Approved by QA Manager NO Tyco Electronics AMP Shanghai Ltd.

IEC 61754-20

Abstract: dust cap LC EIA-526-14A EIA-455 Bly 53
Contextual Info: Qualification Test Report 501-700 30Apr09 Rev A LC Duplex Sealed Plug and Receptacle Singlemode and Multimode Connectors ODVA Conforming 1. INTRODUCTION 1.1. Purpose Testing was perform ed on Tyco Electronics Fiber Optic LC Duplex Sealed Plug and Receptacle

OJ-SH-112LMH

Abstract: IEC60255 GP035
Contextual Info: Qualification Test Report 501-79075 Was S-36091~36112 認定試験報告書 2 October 2007 Rev. A OJ-SH-112LMH リレー OJ-SH-112LMH Relay １.はじめに Introduction 1.1 目 的 Purpose 本試験はリレー製品規格書 108-79075 Rev. O1 に規定された性能必要条件に合致しているか

PCD-124-D2M

Abstract: IEC60255 koike relays GP035 hp410
Contextual Info: Qualification Test Report 認定試験報告書 501-79726 Was S-45668～45689 5 October 2007 Rev. A PCD-124D2M リレー PCD-124D2M Relay １.はじめに Introduction 1.1 目 的 Purpose 本試験はリレー製品規格書 108-79726 Rev. O に規定された性能必要条件に合致しているか

koike relays

Abstract: IEC60255 TOS8700 GP035 VH-6200 hp410
Contextual Info: Qualification Test Report 501-79386 Was S-15772 ~ 15793 2 October 2007 Rev. A 認定試験報告書 ＰＣＦ-１２４Ｄ２Ｍ リレー PCF-124D2M Relay １.はじめに Introduction 1.1 目 的 Purpose 本試験はリレー製品規格書 108-79386 Rev. O1 に規定された性能必要条件に合致しているか

IEC60255

Abstract: koike relays GP035 Qualification Test Report
Contextual Info: Qualification Test Report 認定試験報告書 501-79725 Was S-45694～45715 5 October 2007 Rev. A PCD-112D2M リレー PCD-112D2M Relay １.はじめに Introduction 1.1 目 的 Purpose 本試験はリレー製品規格書 108-79725 Rev. O に規定された性能必要条件に合致しているか

PCJ-112D3MH

Abstract: IEC60255 GP035 2502A koike relays s3598
Contextual Info: Qualification Test Report 501-79544 Was S-35983~36004 3 October 2007 Rev. A 認定試験報告書 PCJ-112D3MH リレー PCJ-112D3MH Relay １.はじめに Introduction 1.1 目 的 Purpose 本試験はリレー製品規格書 108-79544 Rev. O に規定された性能必要条件に合致しているか

koike relays

Abstract: PCF-112D2M IEC60255 GP035 hp410 Qualification Test Report TSA-70S-W 3-1419153 712b 112D2m
Contextual Info: Qualification Test Report 認定試験報告書 501-79385 Was S-36048～36069 2 October 2007 Rev. A PCF-112D2M リレー PCF-112D2M Relay １.はじめに Introduction 1.1 目 的 Purpose 本試験はリレー製品規格書 108-79385 Rev. O1 に規定された性能必要条件に合致しているか

NF C 32-070

Abstract: HP901 RB109 visual inspection of raw materials
Contextual Info: Tyco Electronics Corporation 300 Constitutional Drive Menlo Park, CA. 94025 U.S.A. Raychem No: Rev: Date: Page RB-109 F December 14, 2005 1 of 15 SolderSleeve Devices Specification For Commercial Wire Splices Table of Contents Chapter Pages 1.0 1.1 1.2 General Requirements

JESD78

Contextual Info: 5/24/2006 PRODUCT RELIABILITY REPORT FOR MAXQ2000 Rev A3 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Mark Kwist Sr. Reliability Engineer Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : mark.kwist@dalsemi.com

Contextual Info: 1K Commercial X2212A 2 5 6 x 4 Bit Nonvolatile Static RAM FEATURES • Single 5V Supply • Fully TTL Compatible • JEDEC Standard 18-Pin Package • Infinite E2PROM Array Recall, RAM Read and Write Cycles • Access Time of 250 ns Max. • Nonvolatile Store Inhibit: Vcc = 3V Typical

D35WN-3P3M

Contextual Info: 11/28/2005 PRODUCT RELIABILITY REPORT FOR DS2460, Rev A2 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Don Lipps Staff Reliability Engineer Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : don.lipps@dalsemi.com

NF C 93-400 5b

Abstract: NF C 93-400 36-05-019 NF C 93-400 essai 5b Renault 36-05-019 D45 1730 RSA D45 1730 Application Specification 114-18022 D47 1924 NFC 93400
Contextual Info: Spécification produit Product specification CONNECTEUR DE PUISSANCE DAE 108-15370 03-Dec-2008 Rev. B POWER CONNECTOR DAE 1. 2. DOMAINE D'APPLICATION / PURPOSE . 2 DESCRIPTION / DESCRIPTION . 2

Contextual Info: 12/6/2006 PRODUCT RELIABILITY REPORT FOR DS2756, Rev A1 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

JESD218

Contextual Info: Intel Solid-State Drive DC S3700 Product Specification  Capacity: 2.5-inch : 100/200/400/800 GB 1.8-inch : 200/400 GB  Components: − Intel® 25nm NAND Flash Memory − High Endurance Technology HET Multi-Level Cell (MLC)  Form Factor: 2.5- and 1.8-inch

XICOR x2004

Abstract: X2004 X2004M X2004M-25
Contextual Info: JÜH t PRELIMINARY INFORMATION 4K Military 512x8 Bit X2004M Nonvolatile Static RAM is fabricated w ith the same reliable N-channel floating gate MOS technology used in all Xicor 5V programma­ ble nonvolatile memories. The X2004 features the JEDEC approved pinout for byte-wide memories, com­

XICOR x2004

Abstract: NOVRAM XICOR x2004i
Contextual Info: Commercial Industrial 4K X2004 X2004I 5 1 2 x 8 Bit Nonvolatile Static RAM is fabricated with the same reliable N-channel floating gate MOS technology used in all Xicor 5V programma­ ble nonvolatile memories. The X2004 features the JEDEC approved pinout for byte-wide memories, com­

xicor x2001

Abstract: X2001
Contextual Info: Commercial Industrial 1K mm X2001 X2001I 128x8 Bit Nonvolatile Static RAM is fabricated with the same reliable N-channel floating gate MOS technology used in all Xicor 5V program m a­ ble nonvolatile memories. The X2001 features the JEDEC approved pinout for byte-wide memories, com ­