DS2068
Abstract: DS2068S 8K X 8 Static RAM 100N 100NS H000402 for 64K RAM RAM64K 90-2068S DALLAS SOIC PRODUCT CHANGE
Contextual Info: DALLAS SEMICONDUCTOR 4401 South Beltwood Parkway Dallas, Texas 75244-3292 972 371-4000 Date: July 10, 2000 Product Change Notice – H000402 Subject: Product Obsolescence – DS2068 8K x 8 Static RAM Description of Change: Effective July 10, 2000 Dallas Semiconductor will no longer produce the DS2068 8K x 8 Static
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DALLAS SEMICONDUCTOR Ds1235
Abstract: megatest tester DS1235 ds1630 megatest tester datasheet DS2237 DS1217 dallas ds1230 DS1220 ON SEMICONDUCTOR TRACEABILITY
Contextual Info: DALLAS SEMICONDUCTOR 4401 South Beltwood Parkway Dallas, Texas 75244-3292 972 371-4000 Date: 05/24/97 Subject: PRODUCT CHANGE NOTICE - E71301 Description: Tester Change for DS2016, DS2064, DS2068, and DS2257
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e71301ds2016ds2064ds2068+11ds2257ds1217dallas semiconductor ds1235megatest testerds1235ds1630megatest tester datasheetds2237dallas ds1230ds1220on semiconductor traceability
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DS2503
Abstract: DS12C885 DS2505 DS1225Y DS2068 DS2414 DS1868 c1 a6 B712 DS83C950
Contextual Info: RMP Process Samples 0.8 µm Double Poly, Double Metal Monitor Device s Product Rev DS2154 DS2152 A2 DS2154 A2 DS80CH10 A3 DS80CH10 A5 0.6 µm 0.6 µm A2 DS32KHZ A6 A3 Double Poly, Double Metal (Ti/TiN layers used on all Metals) Product Rev DS1722 A2 DS1775
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A7W 34
Abstract: a7w 20 DS146 a7w 9 ds1480 ds1216 ds2503 DS1722 DS1671 AC501
Contextual Info: RMP Process Samples 0.8 µm 0.6 µm Double Poly, Double Metal 0.8 µm Rev DS80CH10 A3 A2 DS21352 A4 A5 Product Rev DS1722 A2 DS1722 A4 DS1775 A1 DS1775 A2 DS1820 B5 DS1820 B5 DS1820 B6 DS1822 B6 DS1822 B6-PA DS1847 B1 DS1848 B1 DS21352 A3 DS21352 A4 DS21354
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DS1868
Abstract: DS1207 MUBW20-12 A7 DS2505 DS1640
Contextual Info: RMP Process Samples 0.8 µm Double Poly, Double Metal Monitor Device s Product DS2154 DS2152 A2 DS2154 A2 DS80CH10 A3 DS80CH10 A5 0.6 µm A2 DS32KHZ A6 Double Poly, Double Metal (Ti/TiN layers used on all Metals) Product 0.6 µm Rev Rev DS1722 A2 DS1775 A1
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DS-1100
Abstract: DS1620 C2 ds-2197 ds1216 DS13d12 DS2414 DS1868 DS2505 DS1225Y DS1640
Contextual Info: RMP Process Samples 0.8 µm Double Poly, Double Metal Monitor Device s Product Rev DS2154 DS2152 A2 DS2154 A2 DS80CH10 A3 DS80CH10 A5 0.6 µm 0.6 µm A2 Product Rev DS1722 A2 DS1775 A1 DS21352 A3 DS21352 A4 DS21354 A1 DS2148 A1 DS21552 A3 DS21554 A3 DS2196
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max14574
Abstract: MAX1786 MAX1788 MAX8899 DS1849 MAX16908 MAX4967 DS3610 max17018 max13487
Contextual Info: Monitor Reports by Product: 1. Find the product of interest in the table below. Note the process and/or package for that product. 2. Use the "Back" button to return to the home page. 3. Select the process in the "Process Reliability" for the product of interest.
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A6W 37
Abstract: A7W 14 a7w 16 a7w 37 A7W 34 A7W 29 ds1480 a4w 29 DS1868 DS1722
Contextual Info: RMP Process Samples 0.6 µm Standard Process Monitor Device s DS21Q43 A3-A Friday, December 28, 2001 Product DS2401 C2 Rev DS12885 B1 DS12885 B1-C DS12887 A2-C DS1425 F1 DS1425 F2 DS1501 A4-Y DS1501 A6-W DS1501 A6-Y DS1511 A6-W DS1511 DS1553 A6-Y A1 DS1543
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DS1485
Abstract: DS1585 DS2016 DS2064 DS2068
Contextual Info: DALLAS SEMICONDUCTOR 4401 South Beltwood Parkway Dallas, Texas 75244–3292 214 450–0400 Date: August 21, 1994 To: Subject: PRODUCT CHANGE NOTICE – F40101 Description: SRAM Implant Change An extra implant step is being added to the SRAM products produced by Dallas Semiconductor for the
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DS1868
Abstract: DS2433 ds1480 DS2505 DS1640
Contextual Info: RMP Process Samples 0.8 µm 0.6 µm Double Poly, Double Metal Product Rev DS32KHZ A6 DS80CH10 A5 Rev DS1232 C2-L DS1722 A2 DS1775 A1 DS1775 A2 DS1820 B5 DS1820 B5 DS1820 B6 DS21352 A3 DS21352 A4 DS21354 A1 DS21354 A4 DS2148 A2 DS21552 A3 DS21552 A4 DS21554
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DS1235YW
Abstract: ds1480 DS1235YWl DS2228-1MG DS1242 DS2402 ds2403 DS1990A-f50 DS2228-4MG DS1833A
Contextual Info: RELIABILITY MONITOR PROCESS TECHNOLOGY SAMPLING PLAN VEHICLE TECHNOLOGY 0.8 µ Double Poly, Single Metal w/TEOS-OxyNitride Passivation DS87520 DS1302 DS1315 DS17485 DS21S07A DS2153 DS1868 DS1706 DS1800 DS1817 DS1866 DS1305 DS17285 DS1306 DS17485 DS1307 DS17885
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ds1480
Abstract: DS13d12 DS13D14 DS83C950 DS-1100 DS1214 ds1272 ds1216 DS1671 DS1868
Contextual Info: RMP Process Samples 0.8 µm Double Poly, Double Metal Monitor Device s Product Rev DS2154 DS2152 A2 DS2154 A2 DS80CH10 A3 DS80CH10 A5 0.6 µm 0.6 µm A2 A6 Double Poly, Double Metal (Ti/TiN layers used on all Metals) Product Rev DS1775 A1 DS21352 A3 DS21354
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dallas date code
Abstract: sony DATE code 9438 diode DS1243Y DS2064
Contextual Info: DALLAS SEMICONDUCTOR 4401 South Beltwood Parkway Dallas, Texas 75244–3292 214 450–0400 Date: August 9, 1994 To: Subject: PRODUCT CHANGE NOTICE – G42501 Description: DS1243Y to Use Sony 64K SRAM Starting work week 9438 (the week of September 19, 1994) Dallas Semiconductor will allow the use
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DS1223
Abstract: ds1232l datasheet dallas ds1213 DS1267A dallas ds2501 Datasheet DS2501 dallas ds2501 ds2501 Datasheet DS1272 ds1213
Contextual Info: DALLAS SEMICONDUCTOR 4401 South Beltwood Parkway Dallas, Texas 75244–3292 214 450–0400 Date: March 28, 1997 Subject: PRODUCT CHANGE NOTICE – B71801–A ERRATA Description: Traceability Marking Location Change – SOICs Errata Description: There is an error in PCN B71801 – A number of devices were inadvertently overlooked while others
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DS1235YW
Abstract: DS1235YWL DS2228-1MG DS1242 DS1868 DS1187 ds1480 DS1671 DS83520 DS1241
Contextual Info: RELIABILITY MONITOR PROCESS TECHNOLOGY SAMPLING PLAN VEHICLE DS87520 TECHNOLOGY 0.8 µ Double Poly, Single Metal w/TEOS-OxyNitride Passivation DS87520 DS1302 DS1585 DS1306 DS17485 DS1307 DS17885 DS1315 DS1803 DS1623 DS1806 DS1627 DS2430A DS1670 DS2437 DS1673
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