28F512 INPUT ID Search Results
28F512 INPUT ID Result Highlights (5)
| Part | ECAD Model | Manufacturer | Description | Download | Buy |
|---|---|---|---|---|---|
| MD82510/B |
|
82510 - Serial I/O Controller, CMOS, CDIP28 |
|
||
| MR82510/B |
|
82510 - Serial I/O Controller, CMOS |
|
||
| MD8251A |
|
8251A - Serial I/O Controller, 2 Channel(s), 0.078125MBps, HMOS, CDIP28 |
|
||
| 54F153/BEA |
|
54F153 - Dual 4-Input Multiplexer |
|
||
| MR8251A/B |
|
8251A - Serial I/O Controller, 2 Channel(s), HMOS, CDIP28 - Dual marked (5962-87548023A) |
|
28F512 INPUT ID Datasheets Context Search
| Catalog Datasheet | Type | Document Tags | |
|---|---|---|---|
2SF512Contextual Info: 28F512 D Q q -D Q 7 E R A S E V O LTAG E IN P U T / O U T P U T SW ITC H BUFFERS TO A R R A Y SO U R C E ST A T E C O N TR O L COMMAND R E G IST ER IN T EG R A T ED STO P T IM ER u PGM V O LTAG E SW ITC H C H IP E N A B L E O U T PU T E N A B L E CE# • DAT A |
OCR Scan |
28F512 28F512 P28F512 P28F512-120 P28F512-150 N28F512-120 N28F512-150 TP28F512-120 TN28F512-120 2SF512 | |
|
Contextual Info: In te l 28F512 512K 64K x 8 CMOS FLASH MEMORY Flash Electrical Chip-Erase — 1 Second Typical Chip-Erase Quick-Pulse Programming Algorithm — 10 /as Typical Byte-Program — 1 Second Chip-Program 100,000 Erase/Program Cycles 12.0V ± 5 % Vpp High-Performance Read |
OCR Scan |
28F512 ER-20, ER-24, RR-60, AP-316, AP-325 TP28F512-120, TN28F512-120 4fl5bl75 D154flbb | |
28F512
Abstract: 28F512 input id intel 28f512 80C186 N28F512 P28F512 80C186 programming
|
OCR Scan |
28F512 28F512-120 ER-20, ER-24, RR-60, AP-316, AP-325 TP28F512-120, TN28F512-120 28F512 28F512 input id intel 28f512 80C186 N28F512 P28F512 80C186 programming | |
|
Contextual Info: 28F512 512K 64K x 8 CMOS FLASH MEMORY • Flash Electrical Chip-Erase — 1 Second Typical Chip-Erase ■ Quick-Pulse Programming Algorithm — 10 )j.s Typical Byte-Program — 1 Second Chip-Program ■ 100,000 Erase/Program Cycle Typical ■ 12.0V ±5% VPP |
OCR Scan |
28F512 Flas12-120 N28F512-120 TP28F512-120 P28F512-150 N28F512-150 TN28F512-120 ER-20, ER-24, RR-60, | |
AP28F512-120Contextual Info: 512K 64K X 8 A28F512 CMOS FLASH MEMORY (Automotive) Extended Automotive Temperature Range: -4 0 °C to +125°C Flash Electrical Chip-Erase — 1 Second Typical Chip-Erase Quick-Pulse Programming Algorithm — 10 juts Typical Byte-Program — 1 Second Chip-Program |
OCR Scan |
A28F512 32-LEAD AP28F512-150 AP28F512-120 AN28F512-150 AN28F512-120 EFt-20, ER-23, RR-60, | |
N28F512-150
Abstract: 26F512 intel PLD
|
OCR Scan |
D07fa233 28F512 -32-L P28F512-120 P28F512-150 N28F512-120 N28F512-150 TP28F512-120 TN28F512-120 ER-20, 26F512 intel PLD | |
AMD 28F512Contextual Info: a F IN A L Advanced Micro Devices Am28F512 65,536 X 8-Bit CMOS Flash Memory DISTINCTIVE CHARACTERISTICS • High perform ance - 70 ns m aximum access time ■ Latch-up protected to 100 mA from -1 V to Vcc +1 V ■ Low power consum ption - 30 m A m aximum active current |
OCR Scan |
Am28F512 32-pin 28F512 AMD 28F512 | |
|
Contextual Info: A28F512 512K 64K x 8 CMOS FLASH MEMORY (A u to m o tiv e ) m Extended Automotive Temperature Range: -4 0 °C to +125°C • Flash Electrical Chip-Erase — 1 Second Typical Chip-Erase ■ Quick-Pulse Programming Algorithm — 10 jas Typical Byte-Program |
OCR Scan |
A28F512 AP28F512-150 AN28F512-150 AP28F512-120 AN28F512-120 ER-20, ER-23, A28F512 | |
|
Contextual Info: 512K 64K X 8 A28F512 CMOS FLASH MEMORY (Automotive) Extended Automotive Temperature Range: -40°C to + 125°C Flash Electrical Chip-Erase — 1 Second Typical Chip-Erase Quick-Pulse Programming Algorithm — 10 jas Typical Byte-Program — 1 Second Chip-Program |
OCR Scan |
A28F512 AP28F512-150 AN28F512-150 AP28F512-120 AN28F512-120 EFt-20, ER-23, A28F512 RR-60, AP-316, | |
|
Contextual Info: i n t J . A28F512 512K 64K x 8 CMOS FLASH MEMORY (Automotive) • Extended Automotive Temperature Range: -40°C to + 125'C ■ Flash Electrical Chip-Erase — 1 Second Typical Chip-Erase ■ Quick-Pulse Programming Algorithm — 10 jus Typical Byte-Program |
OCR Scan |
A28F512 120ns AP28F512-150 AN28F512-150 AP28F512-120 AN28F512-120 ER-20, ER-23, A28F512 RR-60, | |
|
Contextual Info: in te i A28F512 512K 64K x 8 CMOS FLASH MEMORY (Automotive) • Extended Automotive Temperature Range: 40°C to +125°C ■ Flash Electrical Chip-Erase — 1 Second Typical Chip-Erase ■ Quick-Pulse Programming Algorithm — 10 jus Typical Byte-Program |
OCR Scan |
A28F512 32-PIN 32-LEAD AP28F512-150 AN28F512-150 AP28F512-120 AN28F512-120 ER-20, ER-23, A28F512 | |
|
Contextual Info: CAT28F512 Licensed Intel second source 512K-Bit CMOS Flash Memory FEATURES • Commercial, Industrial and Automotive ■ Fast Read Access Time: 90/120/150 ns Temperature Ranges ■ Low Power CMOS Dissipation: ■ Stop Timer for Program/Erase –Active: 30 mA max CMOS/TTL levels |
Original |
CAT28F512 512K-Bit 32-pin 28F512 8mmx20mm) 500/Reel 120ns 150ns | |
|
Contextual Info: F IN A L a A m 28F 512 512 Kilobit 65,536 x 8-Bit CMOS 12.0 Volt, Bulk Erase Flash Memory Advanced Micro Devices DISTINCTIVE CHARACTERISTICS • High perform ance ■ — 70 ns m aximum access time ■ ■ CMOS Low pow er consum ption Flasherase Electrical Bulk Chip-Erase |
OCR Scan |
32-Pin Am28F512 28F5l Am28F512-75 02S752A QD32bbS | |
1N914
Abstract: 28F512 CAT28F512 28F512 input id Nippon capacitors
|
Original |
CAT28F512 512K-Bit 32-pin 300-T 1N914 28F512 CAT28F512 28F512 input id Nippon capacitors | |
|
|
|||
|
Contextual Info: a Am28F512 Advanced Micro Devices 512 Kilobit 65,536 x 8-Bit CMOS 12.0 Volt, Bulk Erase Flash Memory DISTINCTIVE CHARACTERISTICS • High performance ■ — 70 ns maximum access time ■ CMOS Low power consumption ■ ■ — No data retention power consumption |
OCR Scan |
Am28F512 32-Pin | |
|
Contextual Info: FINAL A M D ii Am 28F512 512 Kilobit 64 K x 8-Bit CMOS 12.0 Volt, Bulk Erase Flash Memory DISTINCTIVE CHARACTERISTICS • High perform ance ■ Latch-up protected to 100 mA from -1 V to Vcc +1 V ■ Flasherase Electrical Bulk Chip-Erase — 70 ns maximum access tim e |
OCR Scan |
28F512 32-Pin 16-038-S PL032â Am28F512 16-038FPO-5 TS032â 16-038-TSOP-2 | |
|
Contextual Info: FINAL A M D ii Am 28F512 512 Kilobit 64 K x 8-Bit CMOS 12.0 Volt, Bulk Erase Flash Memory DISTINCTIVE CHARACTERISTICS • High perform ance ■ Latch-up protected to 100 mA from -1 V to Vcc +1 V ■ Flasherase Electrical Bulk Chip-Erase — 70 ns maximum access tim e |
OCR Scan |
28F512 32-Pin Am28F512 | |
ac 1084Contextual Info: H EE GEN FR ALO CAT28F512 Licensed Intel second source 512K-Bit CMOS Flash Memory LE A D F R E ETM FEATURES • Commercial, Industrial and Automotive ■ Fast Read Access Time: 90/120/150 ns Temperature Ranges ■ Low Power CMOS Dissipation: ■ Stop Timer for Program/Erase |
Original |
CAT28F512 512K-Bit 32-pin ac 1084 | |
28F512
Abstract: ac 1084 1N914 CAT28F512
|
Original |
CAT28F512 512K-Bit 32-pin 28F512 ac 1084 1N914 CAT28F512 | |
ac 1084
Abstract: 28F512 CAT28F512 200 ns 1N914 CAT28F512
|
Original |
CAT28F512 512K-Bit 32-pin ac 1084 28F512 CAT28F512 200 ns 1N914 CAT28F512 | |
|
Contextual Info: CAT28F512 L ice n se d In tel second so u rce 512K-Bit CMOS Flash Memory FEATURES • Commercial, Industrial and Automotive Temperature Ranges ■ Fast Read Access Time: 90/120/150 ns ■ Low Power CMOS Dissipation: -A ctive: 30 mA max CMOS/TTL levels -S tan d b y: 1 mA max (TTL levels) |
OCR Scan |
CAT28F512 512K-Bit -32-p CAT28F512 28F512-12 28F512-15 28F512 | |
|
Contextual Info: FINAL AMD£I A m 2 8 F 5 1 2 512 Kilobit 64 K x 8-Bit CMOS 12.0 Volt, Bulk Erase Flash Memory DISTINCTIVE CHARACTERISTICS • High perform ance ■ Latch-up protected to 100 mA from -1 V to Vcc +1 V ■ Flasherase Electrical Bulk Chip-Erase — 70 ns maximum access tim e |
OCR Scan |
32-Pin TS032â 16-038-TSOP-2 Am28F512 TSR032â TSR032 | |
Am28F512Contextual Info: Advencü a Information Am28F512 Advanced Micro Devices 65,536 X 8-Bit CMOS Flash E2PROM DISTINCTIVE CHARACTERISTICS • ■ ■ ■ Flashwase Electrical Bulk Chip-Erase — One Second Typical Chip-Erase Compatible with JEDEC Standard Byte Wide 32-pln EEPROM Pinouts |
OCR Scan |
Am28F512 32-pln 32-pin 100ns 100ns. | |
M28F512
Abstract: PDIP32 PLCC32 m28f512-25
|
OCR Scan |
M28F512 100ns 200nA M28F512 PDIP32 PLCC32 m28f512-25 | |