2a92
Abstract: 27C010A 6E9621 6B9637 3A9315 3E0317 5A9516 5C9550 1B9126 2D1150-9
Contextual Info: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)
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at-27c010e901-140562d1147-122a92+927c010a6e96216b96373a93153e03175a95165c95501b91262d1150-9
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27C1024
Abstract: MIL-M-38535 2C9237 4B942 3B93
Contextual Info: PAGE 1 OF 12 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C1024 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C DATA RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT
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at-27c1024mil-m-38535at-27c01027c1024+32c92374b9423b93
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5A9516
Abstract: 5H9606 5H9605 7H9744 2A9212 5A9524 7H9747 9d9018 5c112 1B9126
Contextual Info: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)
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at-27c010e901-140562d1147-125a9516+95h96065h96057h97442a92125a95247h97479d90185c1121b9126
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TSOP 173 g
Abstract: 5H9602 6c9648 3b1326 5G9551 MIL-M-38535 6F9627 4c19 3C1660 atmel 906
Contextual Info: PAGE 1 OF 21 ATMEL COPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C040 CMOS EPROM RELIABILITY DATA* -125°C DYNAMIC OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT
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at-27c040mil-m-38535at-27c1024at-27c512r+13at-27c01012c/tsop/soic/pdip6d97028b9832tsop 173 g5h96026c96483b13265g95516f96274c193c1660atmel 906
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M1014
Abstract: K2078 1c9136 5D9602 AT27C010 AT27C512R 1C9133 27c256r 1A9110 3D9352
Contextual Info: PAGE 1 OF 15 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C256R CMOS EPROM RELIABILITY DATA* * - 200°C DATA RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST - 125°C HIGH TEMPERATURE REVERSE BIAS (HTRB) - TEMPERATURE CYCLE, CENTRIFUGE, FINE AND GROSS
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at-27c256rfrom27c256r4b06918703a+10m1014k20781c91365d9602at27c010at27c512r1c913327c256r1a91103d9352
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27c512r
Abstract: ATMEL AT27c512 8a039 6J24 233759A-13 4b23 3C1091 2d9306 9c9949 5c2484
Contextual Info: PAGE 1 OF 17 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C512R CMOS EPROM RELIABILITY DATA* -125°C OPERATING LIFE TEST -150°C HIGH TEMPERATURE REVERSE BIAS (HTRB) -200°C RETENTION BAKE -PROGRAM/ERASE CYCLE -125°C OPERATING LIFE TEST (PLASTIC)
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at-27c512rmil-m-38510at-27c256rat-27c010+15at-27c512/512r2j03014j04516j07077f072127c512ratmel at27c5128a0396j24233759a-134b233c10912d93069c99495c2484
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28HC64
Abstract: 28PC64 28HC16 MIL-M-38535 9C8944 Activation Energy
Contextual Info: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28HC64 CMOS EEPROM RELIABILITY DATA* - 125°C DYNAMIC OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) - 15 PSIG PRESSURE POT - CYCLE TEST * This report was generated from AT-28HC64 reliability testing.
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at-28hc64mil-m-38535at-28hc191/291at-28pc64+9at-28c256at-28hc16/17033474c234583c128hc6428pc6428hc169c8944activation energy
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CE5C
Contextual Info: 1 234561789A8B1 2CDEF1BEACCD91 ACA91891 889981 81 CDFDB5FCF75 A8BADB1981A1ACCA889B 1 D1A6AE8B1A1D81CDED 11 1 4 5 51289AE1 7 1 D!712DCA1 !2711 "#1$ 4#1% %#1D91 4 &' 21 &&&! 1D1 $&& &&&!(1
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