X15V Search Results
X15V Price and Stock
Panduit Corp S050X15VA1Y |
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S050X15VA1Y | 100,000 |
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Phoenix Contact PTFIX-4/18X1-5-VTDistribution block - Basic terminal block with supply - nom. voltage: 450 V - nominal current: 17.5 A - connection method: Push-in connection - Push-in connection - number of connections: 19 - cross section: 0.14 mm² - 2.5 mm² - AWG: 26 - 14 - width: 43.9 mm - height: 17.7 mm - color: violet - mounting type: for snapping onto a DIN rail adapter |
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PTFIX-4/18X1-5-VT |
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Phoenix Contact PTFIX-4/12X1-5-VTDistribution block - Basic terminal block with supply - nom. voltage: 450 V - nominal current: 17.5 A - connection method: Push-in connection - Push-in connection - number of connections: 13 - cross section: 0.14 mm² - 2.5 mm² - AWG: 26 - 14 - width: 31.4 mm - height: 17.7 mm - color: violet - mounting type: for snapping onto a DIN rail adapter |
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PTFIX-4/12X1-5-VT |
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Phoenix Contact PTFIX-4/6X1-5-VTDistribution block - Basic terminal block with supply - nom. voltage: 450 V - nominal current: 17.5 A - connection method: Push-in connection - Push-in connection - number of connections: 7 - cross section: 0.14 mm² - 2.5 mm² - AWG: 26 - 14 - width: 19 mm - height: 17.7 mm - color: violet - mounting type: for snapping onto a DIN rail adapter |
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PTFIX-4/6X1-5-VT |
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Phoenix Contact PTFIX-4X1-5-VTDistribution block - bridged internally - The blocks can be bridged with one another via the conductor shaft. For corresponding plug-in bridges - see accessories - nom. voltage: 450 V - nominal current: 17.5 A - connection method: Push-in connection - number of connections: 4 - cross section: 0.14 mm² - 2.5 mm² - AWG: 26 - 14 - width: 8.3 mm - height: 17.7 mm - color: violet - mounting type: for snapping onto a DIN rail adapter |
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PTFIX-4X1-5-VT |
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X15V Datasheets Context Search
| Catalog Datasheet | Type | Document Tags | |
|---|---|---|---|
74ABTH18646AContextual Info: SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS166D - AUGUST 1993 - REVISED JULY 1996 Members of the Texas Instruments SCOPE Family of Testability Products One Boundary-Scan Cell Per I/O |
OCR Scan |
sn54abth18646asn54abth182646asn74abth18646asn74abth182646a+5 | |
SN54LVTH240
Abstract: SN74LVTH240
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OCR Scan |
sn54lvth240sn74lvth240scbs679a | |
LVTH244A
Abstract: SN54LVTH244A SN74LVTH244A
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OCR Scan |
sn54lvth244asn74lvth244ascas586alvth244a | |
SN74LVC16245AContextual Info: SN74LVC16245A 16-BIT BUS TRANSCEIVER WITH 3-STATE OUTPUTS S C E S 062F - D EC E M B E R 1995 - R EVISED JA N U A R Y 1998 Member of the Texas Instruments Widebus Family EPIC™ Enhanced-Performance Implanted CMOS Submicron Process D Typical V q l p (Output Ground Bounce) |
OCR Scan |
sn74lvc16245a16-bitsces062fmil-std-883+2 | |
SN54ABT162500
Abstract: SN74ABT162500
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OCR Scan |
sn54abt162500sn74abt16250018-bitscbs242d+3 | |
SN74ALVCH16646Contextual Info: SN74ALVCH16646 16-BIT BUS TRANSCEIVER AND REGISTER WITH 3-STATE OUTPUTS S C E S 0 3 2 D -J U L Y 1 995 - REVISED O C TO B ER 1997 • Member of the Texas Instruments Widebus Family d g g , dgv, o r dl packag e t o p • E P IC ™ (Enhanced-Performance Implanted |
OCR Scan |
sn74alvch1664616-bitsces032d-julymil-std-883 | |
SN54ALVTH162244
Abstract: SN74ALVTH162244
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OCR Scan |
sn54alvth162244sn74alvth16224416-bitsces074a-+1 | |
sn74lvc541 application notes
Abstract: LVC541A SN54LVC541A SN74LVC541A
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OCR Scan |
sn54lvc541asn74lvc541ascas298fmil-std-883+3 | |
SN74LVC2952AContextual Info: SN74LVC2952A OCTAL BUS TRANSCEIVER AND REGISTER WITH 3-STATE OUTPUTS SCAS311 D - J A N U A R Y 1993 - R EVISED JU NE 1997 • E P IC Enhanced-Performance Implanted • CMOS Submicron Process Output Ports Have Equivalent 26-il Series Resistors, So No External Resistors Are |
OCR Scan |
sn74lvc2952ascas31126-il10mhz | |
SN54LVTH245A
Abstract: SN74LVTH245A
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OCR Scan |
sn54lvth245asn74lvth245ascbs1300 | |
OC75
Abstract: SN54ABT651 SN74ABT651
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OCR Scan |
sn54abt651sn74abt651scbs083dmil-std-883+5 | |
SN74LVC841AContextual Info: SN74LVC841A 10-BIT BUS-INTERFACE D-TYPE LATCH WITH 3-STATE OUTPUTS SC AS307E - M ARCH 1 993 - R EVISED JU N E 1997 • EPIC Enhanced-Performance Implanted CMOS Submicron Process • Typical V q l p (Output Ground Bounce) < 0.8 V at VCc = 3.3 V, TA = 25°C |
OCR Scan |
sn74lvc841a10-bitscas307emil-std-883+1 | |
10E1
Abstract: 10E2 20E2 SN74LVCH16541A 0FL4
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OCR Scan |
sn74lvch16541a16-bitscas567amil-std-883c+6 | |
LVTH16373
Abstract: SN54LVTH16373 SN74LVTH16373
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OCR Scan |
sn54lvth16373sn74lvth1637316-bitscbs144i+2 | |
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SN54LVT18502Contextual Info: SN54LVT18502 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS669-JULY 1996 M e m b e r of the Te x a s I n s t r u m e n t s S C O P E F a mi l y o f Testabil ity P r o du c t s C o m p a t i b l e With the I EEE S t a n d a r d 11 4 9 . 1 - 19 9 0 J T A G Test A c c e s s P o r t and |
OCR Scan |
sn54lvt1850218-bitscbs669-july | |
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Contextual Info: SN54LVTH541, SN74LVTH541 3.3-V ABT OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS SCBS682C-MARCH 1997-REVISED FEBRUARY 1998 State-of-the-Art Advanced BiCMOS Technology ABT Design for 3.3-V Operation and Low Static Power Dissipation SN54LVTH541 . . J OR W PACKAGE |
OCR Scan |
sn54lvth541sn74lvth541scbs682c-march1997-revised+1 | |
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Contextual Info: SN54LVT244B, SN74LVT244B 3.3-V ABT OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS SCAS354D - FEBRUARY 1994 - REVISED AUGUST 1997 State-of-the-Art Advanced BiCMOS Technology ABT Design for 3.3-V Operation and Low Static Power Dissipation High-lmpedance State During Power Up |
OCR Scan |
sn54lvt244bsn74lvt244bscas354dmil-std-883 | |
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Contextual Info: SN54LVTH573, SN74LVTH573 3.3-V ABT OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS S C B S 6 8 7 B -M A Y 1 9 9 7 -R E V IS E D FEBR U ARY 1998 • State-of-the-Art Advanced BiCMOS Technology ABT Design for 3.3-V Operation and Low Static Power Dissipation |
OCR Scan |
sn54lvth573sn74lvth573 | |
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Contextual Info: SN54ABT863, SN74ABT863 9-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS SCBS201C- FEBRUARY 1991 - REVISED MAY 1997 State-of-the-Art EPIC-UB BiCMOS Design Significantly Reduces Power Dissipation ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V |
OCR Scan |
sn54abt863sn74abt863scbs201c-mil-std-883+3 | |
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Contextual Info: SN54LVTH2245, SN74LVTH2245 3.3-V ABT OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS _ SCBS707B - SEPTEMBER 1997 - REVISED MARCH 1998 State-of-the-Art Advanced BiCMOS Technology ABT Design for 3.3-V Operation and Low Static Power Dissipation SN54LVTH2245 . . . J OR W PACKAGE |
OCR Scan |
sn54lvth2245sn74lvth2245scbs707b | |
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Contextual Info: SN74ALVC16334 16-BIT UNIVERSAL BUS DRIVER WITH 3-STATE OUTPUTS S C E S 128C - FEBR U A R Y 1998 - R EVISED FEB R U A R Y 1999 • Member of the Texas Instruments Widebus Family • EPIC™ Enhanced-Performance Implanted CMOS Submicron Process DGG, DGV, OR DL PACKAGE |
OCR Scan |
sn74alvc1633416-bitpc100168-pin+2 | |
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Contextual Info: SN54LVTH240, SN74LVTH240 3.3-V ABT OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS SCBS679B-D EC EM BER 1996-R E V IS E D FEBRUARY 1998 • State-of-the-Art Advanced BiCMOS Technology ABT Design for 3.3-V Operation and Low Static Power Dissipation SN54LVTH240 . . J PACKAGE |
OCR Scan |
sn54lvth240sn74lvth240scbs679b-d1996-r+1 | |
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Contextual Info: SN54LVTH18504A, SN54LVTH182504A, SN74LVTH18504A, SN74LVTH182504A 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS667B - JULY 1996 - REVISED JUNE 1997 Members of the Texas Instruments SCOPE Family of Testability Products Members of the Texas Instruments |
OCR Scan |
sn54lvth18504asn54lvth182504asn74lvth18504asn74lvth182504a+3 | |
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Contextual Info: SN74ALVCH245 OCTAL BUS TRANSCEIVER WITH 3-STATE OUTPUTS SCES119C - JULY 19 9 7- REVISED JANUARY 1999 DIR [ 1 A3 [ 4 ] V CC 19 ] 0E 18 ] B1 17 ] B2 A4 [ 5 16 ] B3 A5 [ 6 15 ] B4 A6 [ 7 14 ] B5 A1[ 2 A2 [ 3 Package Options Include Plastic Small-Outline DW , Thin Very |
OCR Scan |
sn74alvch245sces119c | |