USE OF LIFE TESTED PARTS Search Results

Contextual Info: Use of Life Tested Parts Application Note May 1999 AN9654.1 Author: J. E. Vinson, Ph. D. History The use of life tested parts in flight hardware continually becomes an issue for customers. The life test referred to here is the standard life test called for during Quality

Use of Life Tested Parts

Abstract: AN9654
Contextual Info: Use of Life Tested Parts Application Note November 28, 2006 AN9654.2 Author: J. E. Vinson, Ph. D. History The use of life tested parts in flight hardware continually becomes an issue for customers. The life test referred to here is the standard life test called for during Quality

HARRIS

Abstract: la log failure rate TDDB Harris CMOS Integrated Circuits HARRIS SEMICONDUCTOR
Contextual Info: Harris Semiconductor No. AN9654 Harris Space Products October 1996 Use of Life Tested Parts Author: J. E. Vinson History than 10 years worth of powered on hours. Highly accelerated tests are needed to gather wearout data in a reasonable period of time. A functional circuit is limited in its

AN-7518

Contextual Info: Use of Life Tested Parts Application Note May 1999 AN-7518 Author: J. E. Vinson, Ph. D. History eyrds terrpoon, minctor mniions vin, e t, lility, reeni eful , ant rtalfails, arou Product Assumptions This report addresses high reliability product from an Intersil

311P827

Abstract: MIL-PRF-32192 S-311-P-827 GSFC 20771 E595 EEE-INST-002 S311-P827
Contextual Info: 1. SCOPE Purpose. This test specification covers the screening and qualification requirements for surface mounted, end-banded chip thermistors. Parts tested to this specification shall be considered acceptable for use in NASA space programs specifying quality level Grade 1 parts.

MIL-PRF-32192

Abstract: PTC thermistor 5k 311P827 E595 EEE-INST-002 r20.c GSFC S311-P827
Contextual Info: 03 19, 2008 Mar 17, 2008 Mar 18, 2008 1. SCOPE Purpose. This test specification covers the screening and qualification requirements for surface mounted, end-banded chip thermistors. Parts tested to this specification shall be considered acceptable for use in NASA space programs

JQ1P-24V-F

Abstract: JQ1-12V-F JQ1a-24V-F JQ1a-5V-F JQ1aP-12V-F JQ1P-6V-F JQ1aP-18V-F JQ1aP-24V JQ1-18V-F JQ1-24V-F
Contextual Info: VDE HIGH ELECTRICAL & MECHANICAL NOISE IMMUNITY RELAY 20 .787 JQ RELAYS FEATURES 10 .394 15.6 .614 mm inch JQ About Cd-free contacts We have introduced cadmium-free type products to reduce environmentally hazardous substances. Please replace parts that contain cadmium with Cd-free

JQ1-12V-F

Abstract: JQ1-18V-F JQ1-24V-F JQ1-48V-F JQ1P-12V-F JQ1P-18V-F JQ1P-24V-F JQ1P-48V-F JQ1a-5V-F
Contextual Info: VDE HIGH ELECTRICAL & MECHANICAL NOISE IMMUNITY RELAY 20 .787 JQ RELAYS FEATURES 10 .394 15.6 .614 mm inch JQ About Cd-free contacts We have introduced cadmium-free type products to reduce environmentally hazardous substances. Please replace parts that contain cadmium with Cd-free

BY106

Contextual Info: VISHAY _ Vishay Telefunken ▼ AOQ Program AO Q = Before leaving the factory all product after 100% testing, is sampled to make sure that it meets a minimum quality level. The results are accumulated and expressed in PPM parts per million . They are the

E1108ACBG-8E-E

Abstract: M393T6450FZ3-CCC E1104ACSE-6E-E SROMBSAS18E A222G HYB18T1G800C2F-3S E1108AB-6E-E HYB18T1G400C2F-3S M393T6553CZ3-CCC M393T2950CZ3-CCC
Contextual Info: Intel Server Boards SE8500HW4 and SE8501HW4 Memory List Test Report Summary Revision 32.0 August 2008 Intel® Server Board SE8500HW4 and SE8501HW4 Revision History Date Rev Modifications Apr/05 1.0 Initial Release. Jun/05 2.0 Added Samsung* parts. In shaded area

LM324N applications

Abstract: LM139AJ LM324N LM324n comparator ic LM324N schematic lm324N application lm324n equivalent LM324n power dissipation lm339n Linear Integrated Circuit 8 pin ic lm324n
Contextual Info: INFORMATION ONLY NOTIFICATION PCN # 20123503 Revision B Title Of Change: Part Number Change for 19 duplicate parts Publish Date: 05/07/12 Revision History of PCN: Rev - Action Date - User ID - Action Name -

DIODE T4

Abstract: DSBT2-S-DC24V DSBT2-S-DC5V 2X105
Contextual Info: DS-BT DS-BT RELAYS BABT APPROVED DS RELAYS • • • • mm inch Approved by BABT Certmcate of Recognition 4,000 V breakdown voltage Reinforced insulation between coil and contacts Surge voltage withstand: 1500 V FCC Parts 68 SPECIFICATIONS Characteristics

Diode T3

Abstract: DIODE T4 DSBT2-S-DC24V DSBT2-S-DC12V DSBT2-M-2D-DC12V DSBT2-M-2D-DC24V DSBT2-S-DC5V dc5v
Contextual Info: TESTING DS-BT RELAYS 4,000 V BREAKDOWN VOLTAGE DS RELAYS FEATURES 20.65 .813 10.65 .419 •4,000 V breakdown voltage •Reinforced insulation between coil and contacts •Surge voltage withstand: 1500 V FCC Parts 68 10.5 .413 mm inch SPECIFICATIONS Contact

DIODE T4

Abstract: DSBT2-S-DC12V DSBT2-M-2D-DC12V DSBT2-M-2D-DC24V DSBT2-S-DC24V
Contextual Info: TESTING DS-BT RELAYS 4,000 V BREAKDOWN VOLTAGE DS RELAYS FEATURES 20.65 .813 10.65 .419 •4,000 V breakdown voltage •Reinforced insulation between coil and contacts •Surge voltage withstand: 1500 V FCC Parts 68 10.5 .413 mm inch SPECIFICATIONS Characteristics

DSBT2-S-DC24V

Abstract: DSBT2-M-2D-DC12V DSBT2-M-2D-DC24V DSBT2-S-DC12V relay dc6v
Contextual Info: TESTING DS-BT RELAYS 4,000 V BREAKDOWN VOLTAGE DS RELAYS FEATURES 20.65 .813 10.65 .419 •4,000 V breakdown voltage •Reinforced insulation between coil and contacts •Surge voltage withstand: 1500 V FCC Parts 68 10.5 .413 mm inch SPECIFICATIONS Contact

efr 135

Abstract: 74C MTTF 22RPA
Contextual Info: Vishay Semiconductors Reliability The requirements concerning quality and reliability of products are always increasing. It is not sufficient to only deliver fault–free parts. In addition, it must be ensured that the delivered goods serve their purpose safely and failure free, i.e. reliably. From the delivery

TLWR7600

Contextual Info: Vishay Semiconductors Reliability The requirements concerning quality and reliability of products are always increasing. It is not sufficient to only deliver fault–free parts. In addition, it must be ensured that the delivered goods serve their purpose safely and failure free, i.e., reliably. From the delivery

80116

Contextual Info: Vishay Semiconductors Reliability The requirements concerning quality and reliability of products are always increasing. It is not sufficient to only deliver fault–free parts. In addition, it must be ensured that the delivered goods serve their purpose safely and failure free, i.e. reliably. From the delivery

Reliability

Abstract: reliabil efr 135 MAR 618 transistor TLWR7600
Contextual Info: Reliability Vishay Semiconductors Reliability The requirements concerning quality and reliability of products are always increasing. It is not sufficient to only deliver fault-free parts. In addition, it must be ensured that the delivered goods serve their purpose safely and failure

efr 135

Abstract: 80106 TLWR7600
Contextual Info: Vishay Semiconductors Reliability The requirements concerning quality and reliability of products are always increasing. It is not sufficient to only deliver fault–free parts. In addition, it must be ensured that the delivered goods serve their purpose safely and failure free, i.e., reliably. From the delivery

NS16450

Abstract: ns16c450 INS8250 Hardware and Software Interrupts of 8086 and 8088 8086 microcomputer NS16550AF INS8250-B INS82C50A NS16550 INS8250b
Contextual Info: National currently produces seven versions of the INS8250 UART Functionally these parts appear to be the same however there are differences that the designer and purchaser need to understand For each version this document provides a brief overview of their distinct characteristics a detailed function and timing section a discussion of

80088

Contextual Info: Vishay Semiconductors Reliability The requirements concerning quality and reliability of products are always increasing. It is not sufficient to only deliver fault–free parts. In addition, it must be ensured that the delivered goods serve their purpose safely and failure free, i.e., reliably. From the delivery

84055

Contextual Info: VISHAY Vishay Semiconductors Reliability The requirements concerning quality and reliability of products are always increasing. It is not sufficient to only deliver fault-free parts. In addition, it must be ensured that the delivered goods serve their purpose

hilton capacitors

Abstract: Mil std-202, method 107 conclusion
Contextual Info: TPC/Hilton Capacitor, 21421 N. 14th Avenue Phoenix, AZ 85027 623 582-5555 fax: (623) 582-2278 CORROSION RESISTANCE, MIL STD 202, Meth 204,B Twelve parts from each lot are placed in an environmental chamber. Chamber is set to 35°C and 95-98% RH using 5% NaCl solution. Test is