AN9654 Search Results

Contextual Info: Use of Life Tested Parts Application Note May 1999 AN9654.1 Author: J. E. Vinson, Ph. D. History The use of life tested parts in flight hardware continually becomes an issue for customers. The life test referred to here is the standard life test called for during Quality

Use of Life Tested Parts

Abstract: AN9654
Contextual Info: Use of Life Tested Parts Application Note November 28, 2006 AN9654.2 Author: J. E. Vinson, Ph. D. History The use of life tested parts in flight hardware continually becomes an issue for customers. The life test referred to here is the standard life test called for during Quality

HARRIS

Abstract: la log failure rate TDDB Harris CMOS Integrated Circuits HARRIS SEMICONDUCTOR
Contextual Info: Harris Semiconductor No. AN9654 Harris Space Products October 1996 Use of Life Tested Parts Author: J. E. Vinson History than 10 years worth of powered on hours. Highly accelerated tests are needed to gather wearout data in a reasonable period of time. A functional circuit is limited in its

6 SIGMA

Contextual Info: End of Life Derating: A Necessity or Overkill Application Note November 1999 AN9867 Author: J. E. Vinson, Ph.D., Sr. Principal Engineer, Reliability, jvinson@intersil.com Abstract Customers have the practice of derating the performance specifications for integrated circuits. This may come from a