UF3000 Search Results

Contextual Info: UF3000 thru UF3006 I nternational S em ico nducto r , I nc . FAST EFFICIENT GLASS PASSIVATED RECTIFIER FEATURES: Dual rectifier construction, positive centertap Plastic material used carries underwriters Laboratory recognition 94 V-0 Class passivated junctions

DIMM DDR4 connector

Abstract: pc97551 Uniwill 258KA0 and pin diagram of MMC 4017 257sa0 Socket 754 "Socket 754" 258SA0 Realtek RTL8201CL Uniwill 258SA0
Contextual Info: 5 4 3 2 258KA0 REV:B P/N: 37-UF3000-00B MADE IN TAIWAN 258KA0 D C B A 01 02 03 04 05 06 07 08 09 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 COVER PAGE GPIO DEFINITION & POWER CONSUMPTION BLOCK DIAGRAM POWER DIADRAM & SEQUENCE

accretech UF3000

Abstract: 81110A wafer prober P12xl UF3000 c3600 C3750 E4980A E4980 ic 4075 or gate
Contextual Info: Agilent 4075 Advanced DC/RF/Pulse Parametric Tester Data Sheet General Description Contents General Description 1 Switching Matrix Subsystem 3 Pulse Switch 4 DC Measurement Subsystem 5 Capacitance Measurement Options Agilent E4980A LCR Meter Built-In HSCMU

30 uf300

Abstract: UF300 22PF UF300-005 UF300-03 UF300-06
Contextual Info: UF300-005 THRU UF300-06 FRONTIER ELECTRONICS CO., LTD. 30A ULTRA FAST RECOVERY RECTIFIER FEATURES ! DUAL RECTIIER CONSTRUCTION, POSITIVE CENTERTAP ! PLASTIC PACKAGE HAS UNDERWRITERS LABORATORY FLAMMABILITY CLASSIFICATION 94V-0 ! GLASS PASSIVATED CHIP JUNCTIONS

FR10S

Abstract: SF30-02 Fast Recovery Rectifier FR107 PACKAG D041 FR2002 FR60-04 SF3002 SF60-01
Contextual Info: frontier 24E ELECTRONICS CO 0> 37417M3 B • *r-0 3 -o I FAST RECOVERY RECTIFIER <D041 PACKAGE 1A FAST RECOVERY RECTIFIER MAX. FWD SURGE CURRENT M AX FWO. VOLTAGE MAX. REVERSE CURRENT REVERSE RECOVERY TIME IF -0 .6 . IR 1A Irr 0.2SA INDUSTRY PEAK INVERSE

P12xl

Abstract: TSK UF300 Tel P8LC UF3000 S2-0200 tsk UF200 TSK UF3000 P12x TEL Prober UF200
Contextual Info: Agilent 4073A Ultra Advanced Parametric Tester Data Sheet General Description Contents General Description 1-2 Switching Matrix Subsystem 3 Pulse Switch 4 DC Measurement Subsystem: SMU Capacitance Measurement Subsystem: Agilent E4980A LCR Meter 4-6 8 Pulse Force Unit: PGU Option

UF3000EX

Abstract: accretech UF3000
Contextual Info: Agilent 4082F Flash Memory Cell Parametric Test System Data Sheet General Description Contents General Description Specification Switching matrix subsystem DC measurement subsystem Capacitance measurement subsystem Pulse force unit Software General Specifications

CASE-D0201AD

Abstract: UF30-005R
Contextual Info: UF30-005R THRU UF30-10R FRONTIER ELECTRONICS CO., LTD. 3A ULTRA FAST RECOVERY RECTIFIER FEATURES ! PLASTIC PACKAGE HAS UNDERWRITERS LABORATORY FLAMMABILITY CLASSIFICATION 94V-0 ! ULTRA FAST RECOVERY TIMES FOR HIGH EFFICIENCY ! LOW FORWARD VOLTAGE, HIGH CURRENT CAPABILITY

accretech UF3000

Abstract: UF3000
Contextual Info: Agilent E5240C I/CV 3.0 Automaton Software Agilent E5240C I/CV 3.0 Lite Automaton Software Technical Overview Overview Agilent I/CV 3.0 and I/CV 3.0 Lite automation software provide auto mated test solutions for semiconductor characterization. Both versions support semiconductor

accretech UF3000

Contextual Info: Agilent 4082A Parametric Test System Data Sheet General Description Contents General Description 1 Specification 3 DC Measurement Subsystem SMU 8 Capacitance Measurement Subsystem 14 Software 17 General Specifications 18 Recommended Conditions for Ultra-Low Current and Low Voltage

IN5342B

Abstract: diodes IN4001 IN4736A IN4448 IN4933-7 IN5921-58B IN914A-B GT60-005-10 UF160-005-06 RGP10A.M
Contextual Info: TABLE OF CONTENTS GENERAL PURPOSE RECTIFIERS . FAST RECOVERY RECTIFIERS . ULTRA FAST RECOVERY RECTIFIERS .

SF30-02

Abstract: FR1004 SF10-02 FR10 fr1002 SF2a fr1s FR10-06 Frontier Electronics FR10-005
Contextual Info: frontier 24E ELECTRONICS CO 0> 37417M3 B • *r-03-o I FAST RECOVERY RECTIFIER <D041 PACKAGE 1A FAST RECOVERY RECTIFIER MAX. FWD SURG E CURRENT M A X FWO. VOLTAGE MAX. R EV ER SE CURRENT R EV ER SE RECO VERY TIM E INDUSTRY PEAK IN VERSE MAX. AVO. FWO. PART NO

accretech UF3000

Abstract: UF3000 P12xl accretech P12x UF3000 accretech UG-1214/U Micronics N9201A
Contextual Info: Agilent N9201A Array Structure Parametric Test Option Technical Overview Introduction The decreasing size of features on integrated circuits 45 nm and smaller is driving the need for new parametric test capabilities. These capabilities must accommodate the advanced test

P8002

Abstract: 4006R P8000 B 503 f30 F80-015 IN4001S IN4001 a 4007 F60-015 F8004 F160-03
Contextual Info: GENERAL PURPOSE RECTIFIER IN D U S T R Y P AR T NO PEA K IN V E R S E V O LTA G E Piv M A X A V G RE C T CURRENT V IN 4001S IN 4002S RL101 R L 102 50 100 IN 4003S IN 4004S R L 103 RL104 400 IN 4 00 5S IN 4 00 6S RL105 RL106 600 800 IN4001 IN 4 00 2 IN4001