accretech UF3000
Abstract: 81110A wafer prober P12xl UF3000 c3600 C3750 E4980A E4980 ic 4075 or gate
Contextual Info: Agilent 4075 Advanced DC/RF/Pulse Parametric Tester Data Sheet General Description Contents General Description 1 Switching Matrix Subsystem 3 Pulse Switch 4 DC Measurement Subsystem 5 Capacitance Measurement Options Agilent E4980A LCR Meter Built-In HSCMU
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UF3000EX
Abstract: accretech UF3000
Contextual Info: Agilent 4082F Flash Memory Cell Parametric Test System Data Sheet General Description Contents General Description Specification Switching matrix subsystem DC measurement subsystem Capacitance measurement subsystem Pulse force unit Software General Specifications
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accretech UF3000
Abstract: UF3000
Contextual Info: Agilent E5240C I/CV 3.0 Automaton Software Agilent E5240C I/CV 3.0 Lite Automaton Software Technical Overview Overview Agilent I/CV 3.0 and I/CV 3.0 Lite automation software provide auto mated test solutions for semiconductor characterization. Both versions support semiconductor
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accretech UF3000
Contextual Info: Agilent 4082A Parametric Test System Data Sheet General Description Contents General Description 1 Specification 3 DC Measurement Subsystem SMU 8 Capacitance Measurement Subsystem 14 Software 17 General Specifications 18 Recommended Conditions for Ultra-Low Current and Low Voltage
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accretech UF3000
Abstract: UF3000 P12xl accretech P12x UF3000 accretech UG-1214/U Micronics N9201A
Contextual Info: Agilent N9201A Array Structure Parametric Test Option Technical Overview Introduction The decreasing size of features on integrated circuits 45 nm and smaller is driving the need for new parametric test capabilities. These capabilities must accommodate the advanced test
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n9201a5989-5747enaccretech uf3000uf3000+6p12xlaccretechp12xuf3000 accretechug-1214/umicronics
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