ACT11374
Contextual Info: 54ACT11374, 74ACT11374 OCTAL O-TYPE EDGE-TRIGGERED FLIP-FLOPS WITH 3-STATE OUTPUTS TI0081—02957, JULY 1907—REVISED MARCH 1W0 • Inputs are TTL-Voltage Compatible 54ACT11374 . . . JT PACKAGE 74ACT11374 . . . DW OR NT PACKAGE e 8 D-Type Flip-Flops in a Single Package
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ACT11374
Abstract: 74ACT11374
Contextual Info: 54ACT11374, 74ACT11374 OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS WITH 3-STATE OUTPUTS TI0081— D2957, JULY 1987— R EVISED M ARC H 1990 Inputs are TTL-Voltage Compatible 54ACT11374 . . . JT PACKAGE 74ACT11374 . . . DW OR NT PACKAGE 6 D-Type Flip-Flops in a Single Package
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ACT1020
Abstract: JH05 MARKING CODE N-CHANNEL MOS FIELD EFFECT TRANSISTOR 44 pin actel 1020b JEDEC-A113 ACTEL 1020B ACP55 smd U1p Jl03 JL-03
Contextual Info: Quality & Reliability Guide February 2001 2001 Actel Corporation All Rights Reserved. Actel and the Actel logo are trademarks of Actel Corporation. All other brand or product names are the property of their respective owners. Contents 1. Overview of Actel’s Quality and Reliability Guide . . . . . . . . . . . . . . . . . . . .1
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act1020jh05marking code n-channel mos field effect transistor44 pin actel 1020b+6jedec-a113actel 1020bacp55smd u1pjl03jl-03
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13001 s
Abstract: 13001 datasheet 13001 JL-01 ACTEL 1020B RTSX32 B 13001 RTSX16 42MX09 1280A
Contextual Info: Actel 4th Quarter 2000 Reliability Report 1 Table of Contents Page Reliability Test Matrix • Test Methods and Conditions Failure Rates • Failure Rates FITs Based For Current Process Data • Mean Time Between Failure (MTBF) For Current Process Data 2
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1225xl1240xl1280xla1415+14a142514100bp32140dx32200dx13001 s13001 datasheet13001jl-01actel 1020brtsx32b 13001rtsx1642mx091280a
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