SN54BC Search Results

Contextual Info: SN54BCT2828B, SN74BCT2828B 10-BIT BUS/MOS MEMORY DRIVERS WITH 3-STATE INVERTING OUTPUTS _ D3635, SEPTEMBER 1990 S N 54B C T282B B . . . J T P A C K A G E BiCMOS Design Substantially Reduces S N 7 4B C T 28 2 8B . . . D W O R N T P A C K A G E

T541A

Contextual Info: SN54BCT541, SN74BCT541A OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS SCBS011D - JULY 1988 - REVISED SEPTEMBER 1994 SN54BCT541 . . . J OR W PACKAGE SN74BCT541A . . . DW OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design Significantly Reduces Ic c z 3-State Outputs Drive Bus Lines or Buffer

BCT8373A

Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

Contextual Info: SN54BCT2240, SN74BCT2240 OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS SCBS030D – SEPTEMBER 1988 – REVISED APRIL 1994 • • • SN54BCT2240 . . . J OR W PACKAGE SN74BCT2240 . . . DB, DW, OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design

Contextual Info: SN54BCT620A, SN74BCT620A OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS SCBS001B – SEPTEMBER 1987 – REVISED NOVEMBER 1993 • • • SN54BCT620A . . . J OR W PACKAGE SN74BCT620A . . . DW OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design Significantly Reduces ICCZ

BCT543

Abstract: 106d1
Contextual Info: SN54BCT543, SN74BCT543 OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS SCBS026C – NOVEMBER 1988 – REVISED APRIL 1994 • • • • SN54BCT543 . . . JT OR W PACKAGE SN74BCT543 . . . DW OR NT PACKAGE TOP VIEW State-of-the-Art BiCMOS Design Significantly Reduces ICCZ

Contextual Info: SN54BCT640, SN74BCT640 OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS SCBS025C – SEPTEMBER 1988 – REVISED APRIL 1994 • • • • • SN54BCT640 . . . J OR W PACKAGE SN74BCT640 . . . DW OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design Substantially Reduces Standby Current

BCT245

Abstract: BCT8245A F245 SN54BCT8245A SN74BCT8245A
Contextual Info: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

V5050

Abstract: BCT244 F244 SN54BCT8244A SN74BCT8244A
Contextual Info: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This

Contextual Info: SN54BCT241, SN74BCT241 OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS SCBS005D – OCTOBER 1987 – REVISED APRIL 1994 • • • • SN54BCT241 . . . J OR W PACKAGE SN74BCT241 . . . DB, DW OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design Significantly Reduces ICCZ

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

Contextual Info: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

Contextual Info: SN54BCT574, SN74BCT574 OCTAL TRANSPARENT D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCBS074C – SEPTEMBER 1991 – REVISED MARCH 2003 D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading

Contextual Info: SN54BCT245, SN74BCT245 OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS SCBS013H – SEPTEMBER 1998 – REVISED MAY 2002 D D SN54BCT245 . . . J OR W PACKAGE SN74BCT245 . . . DB, DW, N, NS, OR PW PACKAGE TOP VIEW 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers

BCT244

Abstract: SN54BCT760 SN74BCT760
Contextual Info: SN54BCT760, SN74BCT760 OCTAL BUFFERS/DRIVERS WITH OPEN-COLLECTOR OUTPUTS SCBS034B – JULY 1989 – REVISED NOVEMBER 1993 • • Open-Collector Version of ′BCT244 Open-Collector Outputs Drive Bus Lines or Buffer Memory Address Registers ESD Protection Exceeds 2000 V Per

Contextual Info: SN54BCT240, SN74BCT240 OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS SCBS004E – OCTOBER 1987 – REVISED APRIL 1994 • • • • SN54BCT240 . . . J OR W PACKAGE SN74BCT240 . . . DB, DW OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design Significantly Reduces ICCZ

5962-9075201M2A

Abstract: 5962-9075201MRA 5962-9075201MSA SN54BCT640 SN74BCT640 SN74BCT640DW SN74BCT640DWE4
Contextual Info: SN54BCT640, SN74BCT640 OCTAL BUS TRANSCEIVERS WITH 3ĆSTATE OUTPUTS SCBS025C − SEPTEMBER 1988 − REVISED APRIL 1994 • • • • • SN54BCT640 . . . J OR W PACKAGE SN74BCT640 . . . DW OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design Substantially Reduces Standby Current

Contextual Info: SN54BCT2828A, SN74BCT2828B 10ĆBIT BUS/MOS MEMORY DRIVERS WITH 3ĆSTATE OUTPUTS SCBS058A − APRIL 1987 − REVISED NOVEMBER 1993 • • • • • SN54BCT2828A . . . JT OR W PACKAGE SN74BCT2828B . . . DW OR NT PACKAGE TOP VIEW State-of-the-Art BiCMOS Design

Contextual Info: SN54BCT620A, SN74BCT620A OCTAL BUS TRANSCEIVERS WITH 3ĆSTATE OUTPUTS SCBS001B − SEPTEMBER 1987 − REVISED NOVEMBER 1993 • • • SN54BCT620A . . . J OR W PACKAGE SN74BCT620A . . . DW OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design Significantly Reduces ICCZ

SN54BCT2828

Contextual Info: SN54BCT2828A, SN74BCT2828B 10ĆBIT BUS/MOS MEMORY DRIVERS WITH 3ĆSTATE OUTPUTS SCBS058A − APRIL 1987 − REVISED NOVEMBER 1993 • • • • • SN54BCT2828A . . . JT OR W PACKAGE SN74BCT2828B . . . DW OR NT PACKAGE TOP VIEW State-of-the-Art BiCMOS Design

Contextual Info: SN54BCT25244, SN74BCT25244 25-Ω OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS SCBS064A – JUNE 1990 – REVISED NOVEMBER 1993 • • • • • SN54BCT25244 . . . JT OR W PACKAGE SN74BCT25244 . . . DW OR NT PACKAGE TOP VIEW State-of-the-Art BiCMOS Design

Contextual Info: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

Contextual Info: SN54BCT623, SN74BCT623 OCTAL BUS TRANSCEIVERS WITH 3ĆSTATE OUTPUTS SCBS020A − SEPTEMBER 1988 − REVISED NOVEMBER 1993 • • SN54BCT623 . . . J OR W PACKAGE SN74BCT623 . . . DW OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design Significantly Reduces ICCZ

Contextual Info: SN54BCT2827C, SN74BCT2827C 10ĆBIT BUS/MOS MEMORY DRIVERS WITH 3ĆSTATE OUTPUTS SCBS007E − APRIL 1987 − REVISED NOVEMBER 1993 • • • • OE1 A1 A2 A3 A4 A5 A6 A7 A8 A9 A10 GND 1 24 2 23 3 22 4 21 5 20 6 19 7 18 8 17 9 16 10 15 11 14 12 13 VCC Y1 Y2