BCT244 Search Results

74BCT244

Contextual Info: 44E D bSG1122 00731b3 b August 1991 Semiconductor 54BCT/BCT244 Octal Buffer/Line Driver with TRI-STATE Outputs General Description Features The 'BCT244 Is an octal buffer and line driver with TRI­ STATE outputs designed to be employed as a memory and

V5050

Abstract: BCT244 F244 SN54BCT8244A SN74BCT8244A
Contextual Info: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This

Contextual Info: SN54BCT241, SN74BCT241 OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS SCBS005D – OCTOBER 1987 – REVISED APRIL 1994 • • • • SN54BCT241 . . . J OR W PACKAGE SN74BCT241 . . . DB, DW OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design Significantly Reduces ICCZ

BCT244

Abstract: SN54BCT760 SN74BCT760
Contextual Info: SN54BCT760, SN74BCT760 OCTAL BUFFERS/DRIVERS WITH OPEN-COLLECTOR OUTPUTS SCBS034B – JULY 1989 – REVISED NOVEMBER 1993 • • Open-Collector Version of ′BCT244 Open-Collector Outputs Drive Bus Lines or Buffer Memory Address Registers ESD Protection Exceeds 2000 V Per

Contextual Info: SN54BCT240, SN74BCT240 OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS SCBS004E – OCTOBER 1987 – REVISED APRIL 1994 • • • • SN54BCT240 . . . J OR W PACKAGE SN74BCT240 . . . DB, DW OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design Significantly Reduces ICCZ

ABT245

Abstract: F244 F245 SN74ABT8245 SN74ABT8952 SN74ABT8952DW SN74BCT8244A an7005 ti8245
Contextual Info: Using ispGDX to Replace Texas Instruments Boundary Scan Bus Devices TM sible, especially with 5.0 ns Tpd and Tco. After a brief overview of the ispGDX architecture, several examples illustrating the use of the ispGDX devices for boundary scan bus devices follow. For more detailed information

TMS44C256DJ

Abstract: TMS44C256 SN74ABT244DW TM512LBK36B transmission line theory ABT162601 f244 transistor bipolar driver schematic
Contextual Info: EB 205E Memory Driver Application Report Author: Rick Curtis & Peter Forstner Date: 22.12.92 Rev.: 1.0 This report takes a look at Memory Drivers from T EXAS INSTRUMENTS. At first there is a short introduction into Transmission Line Theory. The second part shows

Contextual Info: SN54BCT240, SN74BCT240 OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS SCBS004F – OCTOBER 1987 – REVISED MARCH 2003 D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ D 3-State Outputs Drive Bus Lines or Buffer

5962-9062501M2A

Abstract: 5962-9062501MRA 5962-9062501MSA BCT244 SN54BCT244 SN74BCT244 SN74BCT244DB
Contextual Info: BCT244, BCT244 OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS SCBS006E – OCTOBER 1987 – REVISED APRIL 1994 • • • • BCT244 . . . J OR W PACKAGE BCT244 . . . DB OR DW OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design Significantly Reduces ICCZ

Contextual Info: SN54BCT240, SN74BCT240 OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS SCBS004E - OCTOBER 1987 - REVISED APRIL 1994 I I I I | • State-of-the-Art BICMOS Design Significantly Reduces Iccz • ESD Protection Exceeds 2000 V Per Ml L-STD-883C, Method 3015 • 3-State Outputs Drive Bus Lines or Buffer

SN54LVT18502

Abstract: SN54ABT8245 SN54ABT8543 SN54ABTH18502A SN54BCT8240A SN54BCT8244A SN54BCT8245A SN54BCT8373A SN74ABT18245A SN74ABT18502
Contextual Info: Using ispGDX to Replace Boundary Scan Bus Devices the I/O cells make almost any TTL-bus application possible, especially with the 3.5ns Tpd and Tco of the 3.3V ispGDXV devices. After a brief overview of the ispGDX architecture, several examples illustrating the use of the

Contextual Info: SN54BCT241, SN74BCT241 OCTAL BUFFERS/DRIVERS WITH 3ĆSTATE OUTPUTS SCBS005D − OCTOBER 1987 − REVISED APRIL 1994 • • • • SN54BCT241 . . . J OR W PACKAGE SN74BCT241 . . . DB, DW OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design Significantly Reduces ICCZ

BCT240

Abstract: BCT244 SN54BCT240 SN74BCT240 SN74BCT240DW SN74BCT240DWR SN74BCT240N
Contextual Info: SN54BCT240, SN74BCT240 OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS SCBS004F – OCTOBER 1987 – REVISED MARCH 2003 D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ D 3-State Outputs Drive Bus Lines or Buffer

BCT244

Abstract: F244 SN54BCT8244A SN74BCT8244A
Contextual Info: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This

5962-9062501M2A

Abstract: 5962-9062501MRA 5962-9062501MSA BCT244 SN54BCT244 SN74BCT244
Contextual Info: BCT244, BCT244 OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS SCBS006E – OCTOBER 1987 – REVISED APRIL 1994 • • • • BCT244 . . . J OR W PACKAGE BCT244 . . . DB OR DW OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design Significantly Reduces ICCZ

Contextual Info: SN54BCT241, SN74BCT241 OCTAL BUFFERS/DRIVERS WITH 3ĆSTATE OUTPUTS SCBS005D − OCTOBER 1987 − REVISED APRIL 1994 • • • • SN54BCT241 . . . J OR W PACKAGE SN74BCT241 . . . DB, DW OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design Significantly Reduces ICCZ

Contextual Info: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E − FEBRUARY 1990 − REVISED JULY 1996 D Members of the Texas Instruments D D D D D SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and

BCT244

Abstract: SN64BCT241 SCBS046-TI0207-03428
Contextual Info: SN64BCT241 OCTAL BUFFERS AND LINE DRIVERS WITH 3-STATE OUTPUTS SC B S 0 4 6 — TI0207— 03428, F E B R U A R Y 1990 State-of-the-Art BiCMOS Design Substantially Reduces Standby Current DW O R N PAC KA G E TOP VIEW High-lmpedance State During Power Up and

5962-9093801M2A

Abstract: 5962-9093801MRA 5962-9093801MSA BCT244 SN54BCT760 SN54BCT760J SN74BCT760
Contextual Info: SN54BCT760, SN74BCT760 OCTAL BUFFERS/DRIVERS WITH OPEN-COLLECTOR OUTPUTS SCBS034B – JULY 1989 – REVISED NOVEMBER 1993 • • Open-Collector Version of ′BCT244 Open-Collector Outputs Drive Bus Lines or Buffer Memory Address Registers ESD Protection Exceeds 2000 V Per

Contextual Info: SN74BCT760-EP OCTAL BUFFER/DRIVER WITH OPEN-COLLECTOR OUTPUTS www.ti.com SCBS817B – JULY 2006 – REVISED SEPTEMBER 2006 FEATURES • • • • • • • • • 1 Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C

Contextual Info: SN54BCT241, SN74BCT241 OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS SCBS005D – OCTOBER 1987 – REVISED APRIL 1994 • • • • SN54BCT241 . . . J OR W PACKAGE SN74BCT241 . . . DB, DW OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design Significantly Reduces ICCZ

BCT8244A

Contextual Info: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This

Contextual Info: SN54BCT240, SN74BCT240 OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS SCBS004F – OCTOBER 1987 – REVISED MARCH 2003 D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ D 3-State Outputs Drive Bus Lines or Buffer

5962-9062501M2A

Abstract: 5962-9062501MRA 5962-9062501MSA BCT244 SN54BCT244 SN74BCT244
Contextual Info: BCT244, BCT244 OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS SCBS006E – OCTOBER 1987 – REVISED APRIL 1994 • • • • BCT244 . . . J OR W PACKAGE BCT244 . . . DB OR DW OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design Significantly Reduces ICCZ